IRIS
Dapor, Maurizio
 Distribuzione geografica
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Continente #
NA - Nord America 8.851
AS - Asia 2.927
EU - Europa 2.289
SA - Sud America 455
AF - Africa 59
OC - Oceania 6
Continente sconosciuto - Info sul continente non disponibili 2
Totale 14.589
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Nazione #
US - Stati Uniti d'America 8.750
SG - Singapore 1.474
CN - Cina 518
VN - Vietnam 436
UA - Ucraina 386
BR - Brasile 384
RU - Federazione Russa 374
SE - Svezia 297
IT - Italia 285
FR - Francia 188
FI - Finlandia 187
KR - Corea 151
LV - Lettonia 141
GB - Regno Unito 119
DE - Germania 118
IN - India 78
BG - Bulgaria 76
CA - Canada 58
BD - Bangladesh 42
JP - Giappone 29
HK - Hong Kong 28
TR - Turchia 28
MX - Messico 27
ID - Indonesia 26
IQ - Iraq 25
AR - Argentina 24
NL - Olanda 22
ZA - Sudafrica 22
PK - Pakistan 17
PL - Polonia 15
ES - Italia 14
AT - Austria 12
VE - Venezuela 11
PH - Filippine 10
CO - Colombia 9
CZ - Repubblica Ceca 9
MA - Marocco 9
EG - Egitto 8
SK - Slovacchia (Repubblica Slovacca) 8
CL - Cile 7
RO - Romania 7
SA - Arabia Saudita 7
JO - Giordania 6
NP - Nepal 6
AU - Australia 5
IL - Israele 5
PS - Palestinian Territory 5
PY - Paraguay 5
TN - Tunisia 5
UZ - Uzbekistan 5
EC - Ecuador 4
HN - Honduras 4
IE - Irlanda 4
LT - Lituania 4
MY - Malesia 4
TH - Thailandia 4
TW - Taiwan 4
AE - Emirati Arabi Uniti 3
AZ - Azerbaigian 3
BO - Bolivia 3
KE - Kenya 3
MD - Moldavia 3
OM - Oman 3
PA - Panama 3
PE - Perù 3
SN - Senegal 3
TT - Trinidad e Tobago 3
UY - Uruguay 3
AL - Albania 2
BE - Belgio 2
BY - Bielorussia 2
CH - Svizzera 2
DZ - Algeria 2
GA - Gabon 2
GR - Grecia 2
GY - Guiana 2
IR - Iran 2
JM - Giamaica 2
MM - Myanmar 2
PT - Portogallo 2
RS - Serbia 2
SY - Repubblica araba siriana 2
AD - Andorra 1
BF - Burkina Faso 1
BH - Bahrain 1
CR - Costa Rica 1
DK - Danimarca 1
DO - Repubblica Dominicana 1
EE - Estonia 1
ET - Etiopia 1
EU - Europa 1
GT - Guatemala 1
HR - Croazia 1
HU - Ungheria 1
KZ - Kazakistan 1
LB - Libano 1
MN - Mongolia 1
MZ - Mozambico 1
NG - Nigeria 1
NO - Norvegia 1
Totale 14.585
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Città #
Singapore 878
Ashburn 866
Fairfield 831
Jacksonville 760
Chandler 634
San Jose 471
Woodbridge 414
Seattle 401
Dallas 325
Wilmington 321
Santa Clara 301
Houston 287
Cambridge 268
Columbus 257
Ann Arbor 202
San Mateo 179
Moscow 176
Princeton 161
Riga 141
The Dalles 133
Los Angeles 130
Ho Chi Minh City 127
Lauterbourg 124
Lawrence 120
Seoul 111
Hanoi 102
Beijing 93
New York 91
Council Bluffs 78
Sofia 76
Dearborn 61
San Diego 56
Boardman 52
Orem 44
Lappeenranta 40
São Paulo 38
Buffalo 35
Düsseldorf 34
Milan 34
Washington 29
Helsinki 28
Norwalk 28
Da Nang 26
Redondo Beach 26
Trento 26
London 25
Hong Kong 22
Munich 22
Hefei 20
Frankfurt am Main 19
Haiphong 19
Chicago 18
Izmir 17
Jakarta 17
Toronto 17
Turku 17
Montreal 16
Tokyo 16
Chennai 15
Falls Church 15
Phoenix 15
San Francisco 15
Des Moines 14
Dhaka 13
Guangzhou 13
Rome 12
Warsaw 12
Nuremberg 11
Rio de Janeiro 11
Shanghai 11
Johannesburg 10
Manchester 10
Nanjing 10
Baghdad 9
Belo Horizonte 9
Mexico City 9
Pune 9
Wuhan 9
Biên Hòa 8
Boston 8
Bratislava 8
Brooklyn 8
Denver 8
Dong Ket 8
Kunming 8
Poplar 8
Recife 8
Santo André 8
Stockholm 8
Thái Nguyên 8
Verona 8
Ageo 7
Atlanta 7
Bologna 7
Brno 7
Can Tho 7
Changsha 7
Falkenstein 7
Nanchang 7
Ribeirão Preto 7
Totale 10.259
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Nome #
Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite 206
Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy 190
A Comparison between Monte Carlo Method and the Numerical Solution of the Ambartsumian-Chandrasekhar Equations to Unravel the Dielectric Response of Metals 187
Auger quantitative analysis and preferential sputtering in brass alloys 183
Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging 176
Intelligenza artificiale: i primi 50 anni 173
A comparative study of electron and positron penetration in silicon dioxide 169
Canonical transformations for relativistic particles 162
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 160
Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments 160
Reti neurali artificiali 155
Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92) 148
Electron Irradiation of Dielectric Solids: Surface Electric Field Calculation 148
An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides 147
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 145
Formation of vanadium silicide by high dose ion implantation 144
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 143
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 142
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 140
A novel Monte Carlo simulation code for linewidth measurement incritical dimension scanning electron microscopy 140
Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation 137
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy 136
Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets 136
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 134
Joint experimental and computational study of silicon dioxide electron energy loss spectra 134
Structural investigation of Al2O3 formed by ion implantation at various doses 134
Preparation of metal glasses by ion implantation and/or sputtering 133
Momentum transfer dependence of reflection electron energy loss spectra: theory and experiment 132
Caratterizzazione di laminati zincati di produzione industriale 128
SURPRISES: when ab initio meets statistics in extended systems 127
Editorial: New Frontiers in Multiscale Modelling of Advanced Materials 127
Physical properties of TiN thin films 125
Comparison of the results of analytical and numerical model calculations of electron backscattering from supported films 125
Non-adiabatic ab initio molecular dynamics of supersonic beam epitaxy of silicon carbide at room temperature 125
Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3 124
Monte Carlo simulation of few-keV positrons penetrating in solids 123
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 123
Elastic scattering calculations for electrons and positrons in solid targets 121
Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy 121
Superconductivity in crystalline and amorphous Nb-Zr thin films 120
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping 119
Backscattering of electrons from solid targets 119
ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING 119
Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy 118
Reducing Hydrogen Permeation through Metals 118
Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy 117
Backscattering of electrons from multilayers 116
Numerical simulation of hydrogen desorption from thin metallic films 115
Role of core levels ionization in the electron induced dissociation of silicon dioxide 114
Cenni di storia della meccanica quantistica 114
Theory of the interaction between an electron beam and a thin solid film 111
Joint experimental and computational study of aluminum 111
X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices 110
Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices 109
Penetration of an electron beam in a thin solid film: The influence of backscattering from the substrate 109
Monte Carlo simulation of the interaction of electrons with supported and unsupported thin films 108
Antimateria 108
Hydrogen permeation through a slab sample in the case of high hydrogen concentration 108
Monte Carlo simulation of low-medium energy electrons backscattered from C/Al double layer thin films 108
The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping 107
Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets 107
Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers 107
Elaborazione dei dati sperimentali 106
Non-alloyed Ti/Au and Ti/Pt/Au ohmic contacts to p-type InGaAsP 106
Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films 105
Mean energy and depth of penetration of electrons backscattered by solid targets 105
Relative Role of Physical Mechanisms on Complex Biodamage Induced by Carbon Irradiation 105
Development of a numerical simulation of depth profiles of multilayers composed of very thin layers 104
Secondary electron emission yield calculation performed using two different Monte Carlo strategies 104
REEL spectra from aluminium: experiment and Monte Carlo simulation using two different dielectric functions 103
Energy loss spectra of low primary energy (E <= 1 keV) electrons backscattered by silicon dioxide 102
Comparison between Energy Straggling Strategy andContinuous Slowing Down Approximation in Monte Carlo Simulationof Secondary Electron Emission of Insulating Materials 101
Penetration of an electron beam in a solid material: a simple model and a numerical simulation 100
Electronic Excitation Spectra of Cerium Oxides: Fromab Initiodielectric Response Functions to Monte Carlo Electron Transport Simulations 100
Monte Carlo simulation of positron-stimulated secondary electron emission from solids 99
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 99
Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films 97
Energy loss of electrons backscattered fromsolids: measured and calculated spectra for Aland Si 97
Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films 96
Secondary Electron Emission and Yield Spectra of Metals from Monte Carlo Simulations and Experiments 96
Energy Deposition around Swift Carbon-Ion Tracks in Liquid Water 95
The role of low-energy electrons in the charging process of LISA test masses 94
Monte Carlo Simulations of Measured Electron Energy-loss Spectra of Diamond and Graphite: Role of Dielectric-response Models 94
Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum 93
Numerical simulation of hydrogen desorption from a membrane 93
Backscattering of Positrons from Solid Targets 91
Energy loss of electrons impinging upon glassy carbon, amorphous carbon, and diamond: Comparison between two different dispersion laws 91
A Quantum Chemical Interpretation of Two-Dimensional Electronic Spectroscopy of Light-Harvesting Complexes 91
Monte Carlo modeling in the low-energy domainof the secondary electron emission ofpolymethylmethacrylate for critical-dimensionscanning electron microscopy 90
Monte Carlo Simulation of Electrons Backscattered from Surface Carbon Films 88
K x-ray emission spectra from eta-Al2O3 88
Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG) 88
Reflection Electron Energy Loss Spectra beyond the optical limit 88
UV-Light-Induced Vibrational Coherences: The Key to Understand Kasha Rule Violation in trans -Azobenzene 88
Multiscale simulation of the focused electron beam induced deposition process 87
X-Ray multilayers for diffractometers, monochromators, and spectrometers 86
Computer simulation of electron transport in solids with applications to materials analysis and characterization 85
Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies 84
L`orologio di Albert 83
Diffrazione dei raggi X 83
Totale 11.860
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Categoria #
all - tutte 59.075
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 2.006
Totale 61.081
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021119 0 0 0 0 0 0 0 0 0 0 0 119
2021/20221.084 25 82 8 76 30 98 24 288 47 106 42 258
2022/20231.324 229 104 8 168 190 214 0 88 183 6 105 29
2023/2024715 57 59 52 25 61 165 32 49 6 96 25 88
2024/20252.338 14 36 86 530 157 338 33 122 264 361 171 226
2025/20264.562 314 134 625 613 402 431 853 93 391 500 194 12
Totale 14.710