Dapor, Maurizio
 Distribuzione geografica
Continente #
NA - Nord America 6.321
EU - Europa 1.222
AS - Asia 226
AF - Africa 1
Continente sconosciuto - Info sul continente non disponibili 1
OC - Oceania 1
SA - Sud America 1
Totale 7.773
Nazione #
US - Stati Uniti d'America 6.302
UA - Ucraina 382
SE - Svezia 288
IT - Italia 161
FI - Finlandia 149
CN - Cina 116
BG - Bulgaria 76
GB - Regno Unito 59
DE - Germania 58
KR - Corea 37
CA - Canada 19
TR - Turchia 16
IN - India 15
SG - Singapore 15
FR - Francia 11
JP - Giappone 9
SK - Slovacchia (Repubblica Slovacca) 8
VN - Vietnam 8
NL - Olanda 5
CH - Svizzera 3
CZ - Repubblica Ceca 3
IE - Irlanda 3
PL - Polonia 3
RO - Romania 3
IL - Israele 2
JO - Giordania 2
PT - Portogallo 2
RU - Federazione Russa 2
AT - Austria 1
AU - Australia 1
EU - Europa 1
GR - Grecia 1
HK - Hong Kong 1
HR - Croazia 1
KG - Kirghizistan 1
MA - Marocco 1
MD - Moldavia 1
MY - Malesia 1
NO - Norvegia 1
PE - Perù 1
PK - Pakistan 1
RS - Serbia 1
SA - Arabia Saudita 1
TW - Taiwan 1
Totale 7.773
Città #
Fairfield 863
Jacksonville 762
Chandler 643
Ashburn 573
Woodbridge 427
Seattle 412
Wilmington 331
Houston 294
Cambridge 276
Ann Arbor 210
San Mateo 181
Princeton 163
Lawrence 120
Sofia 76
Dearborn 62
Los Angeles 58
San Diego 55
Boardman 51
Lappeenranta 40
Beijing 39
New York 39
Düsseldorf 33
Norwalk 29
Washington 23
Trento 21
Izmir 16
London 16
Falls Church 15
Des Moines 14
Milan 10
Hefei 9
Kunming 9
Nanjing 9
Bratislava 8
Dong Ket 8
Munich 8
Toronto 8
Ageo 7
Andover 7
Pune 7
Helsinki 6
Nanchang 6
San Jose 6
Shanghai 6
Fremont 5
Kilburn 5
Phoenix 5
Trieste 5
Bologna 4
Cagliari 4
Chiswick 4
Costa Mesa 4
Enfield 4
Guangzhou 4
Rome 4
San Paolo di Civitate 4
Altamura 3
Frankfurt am Main 3
Grevenbroich 3
Jinan 3
Laurel 3
Mareno di Piave 3
Montréal 3
Ningbo 3
Ottawa 3
Palermo 3
Prescot 3
San Michele All'adige 3
Trinitapoli 3
Trumbull 3
Verona 3
Zhengzhou 3
Avellino 2
Baie-D'Urfe 2
Baotou 2
Bergamo 2
Bremen 2
Brescia 2
Carrara 2
Dublin 2
Foggia 2
Fuzhou 2
Krakow 2
Leawood 2
Montreal 2
Muzzana del Turgnano 2
Old Bridge 2
Padova 2
Paris 2
Serra 2
Shaoxing 2
Simi Valley 2
Strelice 2
Tappahannock 2
Tel Aviv 2
Torino 2
Wenzhou 2
Albino 1
Alexandria 1
Aprica 1
Totale 6.109
Nome #
Monte Carlo simulations of measured electron energy-loss spectra of diamond and graphite: Role of dielectric-response models 176
Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite 128
Reti neurali artificiali 120
Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy 118
Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging 118
Formation of vanadium silicide by high dose ion implantation 104
A comparison between Monte Carlo method and the numerical solution of the Ambartsumian-Chandrasekhar equations to unravel the dielectric response of metals 104
Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments 104
Joint experimental and computational study of silicon dioxide electron energy loss spectra 98
Preparation of metal glasses by ion implantation and/or sputtering 97
Auger quantitative analysis and preferential sputtering in brass alloys 97
Canonical transformations for relativistic particles 97
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 96
Editorial: New Frontiers in Multiscale Modelling of Advanced Materials 96
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 93
Backscattering of electrons from solid targets 91
Electron Irradiation of Dielectric Solids: Surface Electric Field Calculation 91
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 89
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 88
SURPRISES: when ab initio meets statistics in extended systems 88
A comparative study of electron and positron penetration in silicon dioxide 87
Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92) 85
Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3 85
Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets 85
An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides 85
Physical properties of TiN thin films 84
Structural investigation of Al2O3 formed by ion implantation at various doses 84
Momentum transfer dependence of reflection electron energy loss spectra: theory and experiment 84
Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy 83
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 82
Elastic scattering calculations for electrons and positrons in solid targets 81
Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy 81
Non-adiabatic ab initio molecular dynamics of supersonic beam epitaxy of silicon carbide at room temperature 81
Numerical simulation of hydrogen desorption from thin metallic films 80
A novel Monte Carlo simulation code for linewidth measurement incritical dimension scanning electron microscopy 80
Comparison of the results of analytical and numerical model calculations of electron backscattering from supported films 78
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy 77
Non-alloyed Ti/Au and Ti/Pt/Au ohmic contacts to p-type InGaAsP 77
Monte Carlo simulation of the interaction of electrons with supported and unsupported thin films 76
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 76
Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets 76
Backscattering of electrons from multilayers 76
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping 75
Superconductivity in crystalline and amorphous Nb-Zr thin films 75
Reducing Hydrogen Permeation through Metals 75
Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy 74
Theory of the interaction between an electron beam and a thin solid film 73
Role of core levels ionization in the electron induced dissociation of silicon dioxide 73
Monte Carlo simulation of few-keV positrons penetrating in solids 72
X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices 71
Development of a numerical simulation of depth profiles of multilayers composed of very thin layers 71
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 70
Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices 70
Monte Carlo simulation of low-medium energy electrons backscattered from C/Al double layer thin films 70
Penetration of an electron beam in a solid material: a simple model and a numerical simulation 70
Mean energy and depth of penetration of electrons backscattered by solid targets 69
Elaborazione dei dati sperimentali 69
Energy loss spectra of low primary energy (E <= 1 keV) electrons backscattered by silicon dioxide 69
REEL spectra from aluminium: experiment and Monte Carlo simulation using two different dielectric functions 69
Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation 69
Hydrogen permeation through a slab sample in the case of high hydrogen concentration 68
Monte Carlo simulation of positron-stimulated secondary electron emission from solids 67
The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping 67
Penetration of an electron beam in a thin solid film: The influence of backscattering from the substrate 66
Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films 65
Caratterizzazione di laminati zincati di produzione industriale 64
Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films 63
Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films 63
Secondary electron emission yield calculation performed using two different Monte Carlo strategies 63
Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum 58
Intelligenza artificiale: i primi 50 anni 54
Antimateria 53
Energy loss of electrons backscattered fromsolids: measured and calculated spectra for Aland Si 52
Monte Carlo modeling in the low-energy domainof the secondary electron emission ofpolymethylmethacrylate for critical-dimensionscanning electron microscopy 49
Backscattering of Positrons from Solid Targets 46
The Monte Carlo method with applications to electron transport in solids 46
ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING 46
Joint experimental and computational study of aluminum 45
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 44
Numerical simulation of hydrogen desorption from a membrane 43
L`intelligenza della vita: dal caos all`uomo 43
L`orologio di Albert 43
Cenni di storia della meccanica quantistica 43
Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG) 43
Diffrazione dei raggi X 42
Comparison between Energy Straggling Strategy andContinuous Slowing Down Approximation in Monte Carlo Simulationof Secondary Electron Emission of Insulating Materials 42
X-Ray multilayers for diffractometers, monochromators, and spectrometers 41
Reflection Electron Energy Loss Spectra beyond the optical limit 41
Monte Carlo Simulation of Electrons Backscattered from Surface Carbon Films 40
Fast Charged-Particle Irradiation of Solids: Excitation of Secondary Electrons and Related Energy Deposition Function in SiO2 40
Elastic Scattering of Electrons by Atoms: Differential and Transport Cross Section Calculations 40
Electron-beam penetration in surface films 40
Elogio del caso 39
K x-ray emission spectra from eta-Al2O3 38
Relative Role of Physical Mechanisms on Complex Biodamage Induced by Carbon Irradiation 38
Electrochemical and corrosion behaviour of BN-coated aluminium alloy surfaces 36
Slow Electrons Impinging on Dielectric Systems: I. Basic Aspects 36
IN PRAISE OF CHANCE 35
Secondary Electron Emission and Yield Spectra of Metals from Monte Carlo Simulations and Experiments 35
Slow Electrons Impinging on Dielectric Systems: II. Implantation Profiles, Mobility and Recombination Processes 33
Totale 7.070
Categoria #
all - tutte 32.508
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 1.022
Totale 33.530


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/2019610 0 0 0 0 0 0 0 0 0 0 357 253
2019/20201.904 125 67 149 181 232 144 289 160 270 92 65 130
2020/20211.453 70 162 115 172 140 124 122 76 124 77 151 120
2021/20221.101 26 84 9 77 30 98 25 293 47 108 44 260
2022/20231.342 231 107 8 171 191 219 0 88 185 6 106 30
2023/2024624 57 61 54 25 62 170 35 50 7 101 2 0
Totale 7.886