Dapor, Maurizio
 Distribuzione geografica
Continente #
NA - Nord America 9.003
AS - Asia 2.967
EU - Europa 2.345
SA - Sud America 463
Continente sconosciuto - Info sul continente non disponibili 124
AF - Africa 59
OC - Oceania 6
Totale 14.967
Nazione #
US - Stati Uniti d'America 8.890
SG - Singapore 1.481
CN - Cina 523
VN - Vietnam 437
BR - Brasile 387
UA - Ucraina 387
RU - Federazione Russa 374
IT - Italia 330
SE - Svezia 297
FR - Francia 191
FI - Finlandia 187
KR - Corea 151
LV - Lettonia 141
GB - Regno Unito 121
DE - Germania 118
IN - India 79
BG - Bulgaria 76
BD - Bangladesh 68
CA - Canada 61
MX - Messico 30
JP - Giappone 29
HK - Hong Kong 28
TR - Turchia 28
AR - Argentina 26
ID - Indonesia 26
IQ - Iraq 25
NL - Olanda 22
ZA - Sudafrica 22
PK - Pakistan 17
PL - Polonia 16
ES - Italia 15
AT - Austria 12
VE - Venezuela 11
CO - Colombia 10
PH - Filippine 10
CZ - Repubblica Ceca 9
MA - Marocco 9
SK - Slovacchia (Repubblica Slovacca) 9
EG - Egitto 8
CL - Cile 7
RO - Romania 7
SA - Arabia Saudita 7
EC - Ecuador 6
JO - Giordania 6
NP - Nepal 6
AU - Australia 5
HN - Honduras 5
IE - Irlanda 5
IL - Israele 5
PS - Palestinian Territory 5
PY - Paraguay 5
TN - Tunisia 5
UZ - Uzbekistan 5
LT - Lituania 4
MY - Malesia 4
TH - Thailandia 4
TW - Taiwan 4
AE - Emirati Arabi Uniti 3
AZ - Azerbaigian 3
BO - Bolivia 3
GR - Grecia 3
JM - Giamaica 3
KE - Kenya 3
MD - Moldavia 3
OM - Oman 3
PA - Panama 3
PE - Perù 3
SN - Senegal 3
TT - Trinidad e Tobago 3
UY - Uruguay 3
AL - Albania 2
BE - Belgio 2
BY - Bielorussia 2
CH - Svizzera 2
CR - Costa Rica 2
DZ - Algeria 2
GA - Gabon 2
GT - Guatemala 2
GY - Guiana 2
IR - Iran 2
MM - Myanmar 2
PT - Portogallo 2
RS - Serbia 2
SY - Repubblica araba siriana 2
AD - Andorra 1
BF - Burkina Faso 1
BH - Bahrain 1
BQ - ???statistics.table.value.countryCode.BQ??? 1
BS - Bahamas 1
DK - Danimarca 1
DO - Repubblica Dominicana 1
EE - Estonia 1
ET - Etiopia 1
EU - Europa 1
HR - Croazia 1
HU - Ungheria 1
KZ - Kazakistan 1
LB - Libano 1
MN - Mongolia 1
MZ - Mozambico 1
Totale 14.839
Città #
Ashburn 906
Singapore 883
Fairfield 831
Jacksonville 760
Chandler 634
San Jose 486
Woodbridge 414
Seattle 401
Dallas 326
Wilmington 321
Santa Clara 316
Houston 288
Cambridge 268
Columbus 257
Ann Arbor 202
San Mateo 179
Moscow 176
Princeton 161
Riga 141
Los Angeles 133
The Dalles 133
Ho Chi Minh City 127
Lauterbourg 124
Lawrence 120
Seoul 111
Hanoi 102
Beijing 94
New York 94
Council Bluffs 78
Sofia 76
Dearborn 61
Boardman 58
San Diego 58
Milan 54
Orem 44
Lappeenranta 40
Buffalo 38
São Paulo 38
Düsseldorf 34
Washington 29
Helsinki 28
Norwalk 28
London 27
Trento 27
Da Nang 26
Redondo Beach 26
Hong Kong 22
Munich 22
Hefei 20
Chicago 19
Frankfurt am Main 19
Haiphong 19
Izmir 17
Jakarta 17
Toronto 17
Turku 17
Montreal 16
Phoenix 16
Tokyo 16
Chennai 15
Falls Church 15
San Francisco 15
Des Moines 14
Dhaka 13
Guangzhou 13
Rome 13
Shanghai 13
Warsaw 12
Mexico City 11
Nuremberg 11
Rio de Janeiro 11
Johannesburg 10
Manchester 10
Nanjing 10
Baghdad 9
Belo Horizonte 9
Bologna 9
Pune 9
Wuhan 9
Biên Hòa 8
Boston 8
Bratislava 8
Brooklyn 8
Denver 8
Dong Ket 8
Kunming 8
Poplar 8
Recife 8
Ribeirão Preto 8
Santo André 8
Stockholm 8
Thái Nguyên 8
Verona 8
Ageo 7
Atlanta 7
Brno 7
Can Tho 7
Changsha 7
Falkenstein 7
Nanchang 7
Totale 10.387
Nome #
Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite 207
Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy 192
A Comparison between Monte Carlo Method and the Numerical Solution of the Ambartsumian-Chandrasekhar Equations to Unravel the Dielectric Response of Metals 190
Auger quantitative analysis and preferential sputtering in brass alloys 184
Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging 183
Intelligenza artificiale: i primi 50 anni 176
A comparative study of electron and positron penetration in silicon dioxide 170
Canonical transformations for relativistic particles 164
Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments 162
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 160
Reti neurali artificiali 157
Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92) 149
Electron Irradiation of Dielectric Solids: Surface Electric Field Calculation 148
An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides 148
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 145
Formation of vanadium silicide by high dose ion implantation 145
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 144
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 142
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 141
A novel Monte Carlo simulation code for linewidth measurement incritical dimension scanning electron microscopy 140
Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets 139
Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation 137
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy 137
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 135
Joint experimental and computational study of silicon dioxide electron energy loss spectra 135
Preparation of metal glasses by ion implantation and/or sputtering 134
Structural investigation of Al2O3 formed by ion implantation at various doses 134
Momentum transfer dependence of reflection electron energy loss spectra: theory and experiment 132
The role of low-energy electrons in the charging process of LISA test masses 128
Caratterizzazione di laminati zincati di produzione industriale 128
SURPRISES: when ab initio meets statistics in extended systems 128
Non-adiabatic ab initio molecular dynamics of supersonic beam epitaxy of silicon carbide at room temperature 127
Editorial: New Frontiers in Multiscale Modelling of Advanced Materials 127
Comparison of the results of analytical and numerical model calculations of electron backscattering from supported films 126
Monte Carlo simulation of few-keV positrons penetrating in solids 125
Physical properties of TiN thin films 125
Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3 124
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 123
Elastic scattering calculations for electrons and positrons in solid targets 122
Superconductivity in crystalline and amorphous Nb-Zr thin films 121
Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy 121
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping 120
Backscattering of electrons from solid targets 119
ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING 119
Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy 118
Reducing Hydrogen Permeation through Metals 118
Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy 118
Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers 117
Numerical simulation of hydrogen desorption from thin metallic films 116
Backscattering of electrons from multilayers 116
Cenni di storia della meccanica quantistica 115
Role of core levels ionization in the electron induced dissociation of silicon dioxide 114
Theory of the interaction between an electron beam and a thin solid film 112
Joint experimental and computational study of aluminum 112
X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices 111
Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices 110
Penetration of an electron beam in a thin solid film: The influence of backscattering from the substrate 110
Monte Carlo simulation of the interaction of electrons with supported and unsupported thin films 109
Elaborazione dei dati sperimentali 109
Antimateria 109
Hydrogen permeation through a slab sample in the case of high hydrogen concentration 109
Relative Role of Physical Mechanisms on Complex Biodamage Induced by Carbon Irradiation 109
The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping 108
Monte Carlo simulation of low-medium energy electrons backscattered from C/Al double layer thin films 108
Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets 108
Non-alloyed Ti/Au and Ti/Pt/Au ohmic contacts to p-type InGaAsP 107
Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films 106
Secondary electron emission yield calculation performed using two different Monte Carlo strategies 106
Mean energy and depth of penetration of electrons backscattered by solid targets 105
Development of a numerical simulation of depth profiles of multilayers composed of very thin layers 105
REEL spectra from aluminium: experiment and Monte Carlo simulation using two different dielectric functions 104
Comparison between Energy Straggling Strategy andContinuous Slowing Down Approximation in Monte Carlo Simulationof Secondary Electron Emission of Insulating Materials 104
Energy loss spectra of low primary energy (E <= 1 keV) electrons backscattered by silicon dioxide 103
Electronic Excitation Spectra of Cerium Oxides: Fromab Initiodielectric Response Functions to Monte Carlo Electron Transport Simulations 103
Penetration of an electron beam in a solid material: a simple model and a numerical simulation 102
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 100
Energy loss of electrons backscattered fromsolids: measured and calculated spectra for Aland Si 100
Reflection Electron Energy Loss Spectra beyond the optical limit 100
Secondary Electron Emission and Yield Spectra of Metals from Monte Carlo Simulations and Experiments 100
Monte Carlo simulation of positron-stimulated secondary electron emission from solids 99
Energy loss of electrons impinging upon glassy carbon, amorphous carbon, and diamond: Comparison between two different dispersion laws 99
Energy Deposition around Swift Carbon-Ion Tracks in Liquid Water 98
Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films 97
Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films 96
Monte Carlo Simulations of Measured Electron Energy-loss Spectra of Diamond and Graphite: Role of Dielectric-response Models 96
A Quantum Chemical Interpretation of Two-Dimensional Electronic Spectroscopy of Light-Harvesting Complexes 94
Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum 93
Numerical simulation of hydrogen desorption from a membrane 93
Backscattering of Positrons from Solid Targets 92
Computer simulation of electron transport in solids with applications to materials analysis and characterization 91
K x-ray emission spectra from eta-Al2O3 91
Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG) 91
UV-Light-Induced Vibrational Coherences: The Key to Understand Kasha Rule Violation in trans -Azobenzene 91
Monte Carlo modeling in the low-energy domainof the secondary electron emission ofpolymethylmethacrylate for critical-dimensionscanning electron microscopy 90
Multiscale simulation of the focused electron beam induced deposition process 90
X-Ray multilayers for diffractometers, monochromators, and spectrometers 88
Monte Carlo Simulation of Electrons Backscattered from Surface Carbon Films 88
Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene 88
Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies 86
L`orologio di Albert 83
Totale 12.048
Categoria #
all - tutte 61.815
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 2.102
Totale 63.917


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/20221.059 0 82 8 76 30 98 24 288 47 106 42 258
2022/20231.324 229 104 8 168 190 214 0 88 183 6 105 29
2023/2024715 57 59 52 25 61 165 32 49 6 96 25 88
2024/20252.338 14 36 86 530 157 338 33 122 264 361 171 226
2025/20264.694 314 134 625 613 402 431 853 93 391 500 194 144
2026/2027125 120 5 0 0 0 0 0 0 0 0 0 0
Totale 14.967