IRIS
Dapor, Maurizio
 Distribuzione geografica
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Continente #
NA - Nord America 7.956
AS - Asia 2.044
EU - Europa 2.028
SA - Sud America 403
AF - Africa 34
OC - Oceania 3
Continente sconosciuto - Info sul continente non disponibili 2
Totale 12.470
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Nazione #
US - Stati Uniti d'America 7.877
SG - Singapore 1.252
CN - Cina 472
UA - Ucraina 387
RU - Federazione Russa 377
BR - Brasile 354
SE - Svezia 295
IT - Italia 240
FI - Finlandia 175
LV - Lettonia 141
DE - Germania 101
GB - Regno Unito 98
VN - Vietnam 77
BG - Bulgaria 76
CA - Canada 46
FR - Francia 46
IN - India 38
KR - Corea 37
TR - Turchia 26
BD - Bangladesh 25
ID - Indonesia 23
NL - Olanda 23
MX - Messico 20
AR - Argentina 19
JP - Giappone 18
HK - Hong Kong 15
ZA - Sudafrica 13
AT - Austria 12
IQ - Iraq 11
PL - Polonia 9
MA - Marocco 8
SK - Slovacchia (Repubblica Slovacca) 8
VE - Venezuela 8
CL - Cile 6
CZ - Repubblica Ceca 6
ES - Italia 6
PK - Pakistan 6
SA - Arabia Saudita 6
RO - Romania 5
UZ - Uzbekistan 5
CO - Colombia 4
HN - Honduras 4
IE - Irlanda 4
IL - Israele 4
JO - Giordania 4
LT - Lituania 4
PY - Paraguay 4
AZ - Azerbaigian 3
CH - Svizzera 3
EG - Egitto 3
MY - Malesia 3
OM - Oman 3
PS - Palestinian Territory 3
TT - Trinidad e Tobago 3
UY - Uruguay 3
AU - Australia 2
BE - Belgio 2
DZ - Algeria 2
EC - Ecuador 2
GA - Gabon 2
MM - Myanmar 2
NP - Nepal 2
PA - Panama 2
PE - Perù 2
PH - Filippine 2
PT - Portogallo 2
TN - Tunisia 2
AD - Andorra 1
AE - Emirati Arabi Uniti 1
BH - Bahrain 1
BY - Bielorussia 1
DO - Repubblica Dominicana 1
EE - Estonia 1
EU - Europa 1
GR - Grecia 1
GT - Guatemala 1
GY - Guiana 1
HR - Croazia 1
IR - Iran 1
JM - Giamaica 1
KE - Kenya 1
LB - Libano 1
MD - Moldavia 1
MZ - Mozambico 1
NO - Norvegia 1
NZ - Nuova Zelanda 1
RS - Serbia 1
SN - Senegal 1
SV - El Salvador 1
SY - Repubblica araba siriana 1
TH - Thailandia 1
TW - Taiwan 1
XK - ???statistics.table.value.countryCode.XK??? 1
ZW - Zimbabwe 1
Totale 12.470
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Città #
Fairfield 863
Ashburn 780
Jacksonville 762
Singapore 747
Chandler 643
Woodbridge 427
Seattle 416
Wilmington 332
Dallas 321
Houston 296
Santa Clara 288
Cambridge 276
Columbus 259
Ann Arbor 210
San Mateo 181
Moscow 177
Princeton 163
Riga 141
Lawrence 120
Los Angeles 105
Beijing 88
Sofia 76
Dearborn 62
New York 61
San Diego 55
Boardman 52
Council Bluffs 47
Lappeenranta 43
Düsseldorf 33
Buffalo 32
São Paulo 32
Norwalk 29
Trento 29
Ho Chi Minh City 26
Redondo Beach 26
Milan 25
Washington 25
The Dalles 23
London 22
Munich 22
Hefei 20
Hanoi 19
Jakarta 18
Izmir 17
Turku 17
Falls Church 15
Toronto 15
Des Moines 14
Guangzhou 14
San Jose 14
Chicago 13
Helsinki 12
Hong Kong 12
Orem 12
San Francisco 12
Shanghai 11
Frankfurt am Main 10
Montreal 10
Nanjing 10
Rio de Janeiro 10
Belo Horizonte 9
Dhaka 9
Kunming 9
Phoenix 9
Rome 9
Wuhan 9
Bratislava 8
Chennai 8
Dong Ket 8
Falkenstein 8
Nuremberg 8
Poplar 8
Pune 8
Recife 8
Santo André 8
Schiedam 8
Tokyo 8
Ageo 7
Andover 7
Brooklyn 7
Changsha 7
Mexico City 7
Nanchang 7
Porto Alegre 7
Verona 7
Zhengzhou 7
Bologna 6
Boston 6
Johannesburg 6
Stockholm 6
Warsaw 6
Baghdad 5
Buenos Aires 5
Florence 5
Fremont 5
Kilburn 5
Manchester 5
Ottawa 5
Ribeirão Preto 5
Shenzhen 5
Totale 8.870
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Nome #
Monte Carlo simulations of measured electron energy-loss spectra of diamond and graphite: Role of dielectric-response models 235
Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite 182
Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy 172
A Comparison between Monte Carlo Method and the Numerical Solution of the Ambartsumian-Chandrasekhar Equations to Unravel the Dielectric Response of Metals 165
Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging 165
Intelligenza artificiale: i primi 50 anni 148
Reti neurali artificiali 148
Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments 148
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 147
Canonical transformations for relativistic particles 143
Auger quantitative analysis and preferential sputtering in brass alloys 139
An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides 134
Formation of vanadium silicide by high dose ion implantation 133
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 131
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 130
A comparative study of electron and positron penetration in silicon dioxide 129
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 127
Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92) 126
Preparation of metal glasses by ion implantation and/or sputtering 122
Joint experimental and computational study of silicon dioxide electron energy loss spectra 122
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 121
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 119
A novel Monte Carlo simulation code for linewidth measurement incritical dimension scanning electron microscopy 119
Momentum transfer dependence of reflection electron energy loss spectra: theory and experiment 119
Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets 119
Editorial: New Frontiers in Multiscale Modelling of Advanced Materials 119
Physical properties of TiN thin films 115
Structural investigation of Al2O3 formed by ion implantation at various doses 115
Electron Irradiation of Dielectric Solids: Surface Electric Field Calculation 113
Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3 112
SURPRISES: when ab initio meets statistics in extended systems 112
Comparison of the results of analytical and numerical model calculations of electron backscattering from supported films 112
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 111
Backscattering of electrons from solid targets 110
Caratterizzazione di laminati zincati di produzione industriale 110
Non-adiabatic ab initio molecular dynamics of supersonic beam epitaxy of silicon carbide at room temperature 109
Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy 109
Reducing Hydrogen Permeation through Metals 106
Backscattering of electrons from multilayers 106
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping 105
Numerical simulation of hydrogen desorption from thin metallic films 104
Superconductivity in crystalline and amorphous Nb-Zr thin films 103
Elastic scattering calculations for electrons and positrons in solid targets 103
Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy 103
Monte Carlo simulation of few-keV positrons penetrating in solids 102
Theory of the interaction between an electron beam and a thin solid film 102
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy 102
Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets 101
Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy 100
Monte Carlo simulation of the interaction of electrons with supported and unsupported thin films 99
Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices 98
Role of core levels ionization in the electron induced dissociation of silicon dioxide 98
Monte Carlo simulation of low-medium energy electrons backscattered from C/Al double layer thin films 98
Non-alloyed Ti/Au and Ti/Pt/Au ohmic contacts to p-type InGaAsP 97
Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation 96
Elaborazione dei dati sperimentali 95
Hydrogen permeation through a slab sample in the case of high hydrogen concentration 95
X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices 94
Mean energy and depth of penetration of electrons backscattered by solid targets 92
The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping 92
REEL spectra from aluminium: experiment and Monte Carlo simulation using two different dielectric functions 92
Antimateria 91
Development of a numerical simulation of depth profiles of multilayers composed of very thin layers 91
Penetration of an electron beam in a solid material: a simple model and a numerical simulation 91
Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films 90
Penetration of an electron beam in a thin solid film: The influence of backscattering from the substrate 90
Energy loss spectra of low primary energy (E <= 1 keV) electrons backscattered by silicon dioxide 90
Secondary electron emission yield calculation performed using two different Monte Carlo strategies 89
Monte Carlo simulation of positron-stimulated secondary electron emission from solids 88
Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films 87
Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films 85
Relative Role of Physical Mechanisms on Complex Biodamage Induced by Carbon Irradiation 82
Energy loss of electrons backscattered fromsolids: measured and calculated spectra for Aland Si 81
Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers 81
Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum 80
Cenni di storia della meccanica quantistica 80
Secondary Electron Emission and Yield Spectra of Metals from Monte Carlo Simulations and Experiments 80
Electronic Excitation Spectra of Cerium Oxides: Fromab Initiodielectric Response Functions to Monte Carlo Electron Transport Simulations 79
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 78
ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING 78
Joint experimental and computational study of aluminum 77
Comparison between Energy Straggling Strategy andContinuous Slowing Down Approximation in Monte Carlo Simulationof Secondary Electron Emission of Insulating Materials 77
Monte Carlo modeling in the low-energy domainof the secondary electron emission ofpolymethylmethacrylate for critical-dimensionscanning electron microscopy 76
Reflection Electron Energy Loss Spectra beyond the optical limit 75
Energy Deposition around Swift Carbon-Ion Tracks in Liquid Water 75
Energy loss of electrons impinging upon glassy carbon, amorphous carbon, and diamond: Comparison between two different dispersion laws 74
X-Ray multilayers for diffractometers, monochromators, and spectrometers 73
Monte Carlo Simulation of Electrons Backscattered from Surface Carbon Films 73
A Quantum Chemical Interpretation of Two-Dimensional Electronic Spectroscopy of Light-Harvesting Complexes 73
Backscattering of Positrons from Solid Targets 72
Numerical simulation of hydrogen desorption from a membrane 72
K x-ray emission spectra from eta-Al2O3 72
Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG) 72
The Monte Carlo method with applications to electron transport in solids 71
Multiscale simulation of the focused electron beam induced deposition process 70
Diffrazione dei raggi X 69
IN PRAISE OF CHANCE 69
Application of low-voltage backscattered electron imaging to the mapping of organic photovoltaic blend morphologies 69
The role of low-energy electrons in the charging process of LISA test masses 67
Fast Charged-Particle Irradiation of Solids: Excitation of Secondary Electrons and Related Energy Deposition Function in SiO2 67
Totale 10.327
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Categoria #
all - tutte 53.896
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 1.800
Totale 55.696
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/2021794 0 0 0 0 0 124 122 76 124 77 151 120
2021/20221.101 26 84 9 77 30 98 25 293 47 108 44 260
2022/20231.340 231 107 8 171 191 219 0 88 185 6 105 29
2023/2024726 57 60 53 25 62 166 33 50 6 100 26 88
2024/20252.359 14 36 88 537 158 341 33 123 264 365 172 228
2025/20262.249 319 135 633 622 416 124 0 0 0 0 0 0
Totale 12.594