IRIS
Dapor, Maurizio
 Distribuzione geografica
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Continente #
NA - Nord America 6.945
EU - Europa 1.331
AS - Asia 751
AF - Africa 4
Continente sconosciuto - Info sul continente non disponibili 1
OC - Oceania 1
SA - Sud America 1
Totale 9.034
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Nazione #
US - Stati Uniti d'America 6.924
SG - Singapore 472
UA - Ucraina 382
SE - Svezia 290
IT - Italia 194
CN - Cina 164
FI - Finlandia 150
BG - Bulgaria 76
DE - Germania 65
GB - Regno Unito 65
RU - Federazione Russa 50
KR - Corea 37
CA - Canada 21
FR - Francia 16
ID - Indonesia 16
TR - Turchia 16
IN - India 15
JP - Giappone 9
SK - Slovacchia (Repubblica Slovacca) 8
VN - Vietnam 8
NL - Olanda 7
CZ - Repubblica Ceca 6
HK - Hong Kong 4
CH - Svizzera 3
IE - Irlanda 3
MA - Marocco 3
PL - Polonia 3
RO - Romania 3
IL - Israele 2
JO - Giordania 2
MM - Myanmar 2
PT - Portogallo 2
AT - Austria 1
AU - Australia 1
EE - Estonia 1
EU - Europa 1
GR - Grecia 1
HR - Croazia 1
LT - Lituania 1
MD - Moldavia 1
MY - Malesia 1
NO - Norvegia 1
PE - Perù 1
PK - Pakistan 1
RS - Serbia 1
SA - Arabia Saudita 1
TN - Tunisia 1
TW - Taiwan 1
Totale 9.034
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Città #
Fairfield 863
Jacksonville 762
Chandler 643
Ashburn 572
Woodbridge 427
Seattle 412
Singapore 376
Wilmington 331
Houston 294
Santa Clara 283
Cambridge 276
Columbus 257
Ann Arbor 210
San Mateo 181
Princeton 163
Lawrence 120
Sofia 76
Dearborn 62
Los Angeles 59
San Diego 55
Boardman 52
Moscow 44
Beijing 42
Lappeenranta 41
New York 37
Düsseldorf 33
Norwalk 29
Washington 24
Trento 21
London 19
Milan 17
Izmir 16
Jakarta 16
Dallas 15
Falls Church 15
Des Moines 14
Hefei 11
Kunming 9
Nanjing 9
Bratislava 8
Dong Ket 8
Frankfurt am Main 8
Munich 8
Toronto 8
Ageo 7
Andover 7
Pune 7
Shanghai 7
Helsinki 6
Nanchang 6
Rome 6
San Jose 6
Fremont 5
Guangzhou 5
Kilburn 5
Phoenix 5
Trieste 5
Verona 5
Zhengzhou 5
Bologna 4
Brno 4
Cagliari 4
Chiswick 4
Costa Mesa 4
Enfield 4
Ottawa 4
San Paolo di Civitate 4
Altamura 3
Bari 3
Genoa 3
Grevenbroich 3
Jinan 3
Laurel 3
Mareno di Piave 3
Montréal 3
Ningbo 3
Palermo 3
Paris 3
Prescot 3
San Michele All'adige 3
Trinitapoli 3
Trumbull 3
Wenzhou 3
Avellino 2
Baie-D'Urfe 2
Baotou 2
Bergamo 2
Bremen 2
Brescia 2
Carrara 2
Catania 2
Dublin 2
Eindhoven 2
Foggia 2
Fuzhou 2
Hong Kong 2
Krakow 2
Leawood 2
Montreal 2
Muzzana del Turgnano 2
Totale 7.127
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Nome #
Monte Carlo simulations of measured electron energy-loss spectra of diamond and graphite: Role of dielectric-response models 189
Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite 139
Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging 134
Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy 131
Reti neurali artificiali 129
A Comparison between Monte Carlo Method and the Numerical Solution of the Ambartsumian-Chandrasekhar Equations to Unravel the Dielectric Response of Metals 124
Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments 115
Formation of vanadium silicide by high dose ion implantation 113
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 108
Auger quantitative analysis and preferential sputtering in brass alloys 108
Canonical transformations for relativistic particles 108
Preparation of metal glasses by ion implantation and/or sputtering 106
Joint experimental and computational study of silicon dioxide electron energy loss spectra 105
Editorial: New Frontiers in Multiscale Modelling of Advanced Materials 104
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 103
Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets 100
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 99
Backscattering of electrons from solid targets 98
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 98
A comparative study of electron and positron penetration in silicon dioxide 97
Electron Irradiation of Dielectric Solids: Surface Electric Field Calculation 96
Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92) 94
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 94
Momentum transfer dependence of reflection electron energy loss spectra: theory and experiment 94
Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3 93
SURPRISES: when ab initio meets statistics in extended systems 93
An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides 93
Physical properties of TiN thin films 91
Comparison of the results of analytical and numerical model calculations of electron backscattering from supported films 91
Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy 91
A novel Monte Carlo simulation code for linewidth measurement incritical dimension scanning electron microscopy 90
Non-adiabatic ab initio molecular dynamics of supersonic beam epitaxy of silicon carbide at room temperature 90
Elastic scattering calculations for electrons and positrons in solid targets 89
Structural investigation of Al2O3 formed by ion implantation at various doses 89
Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy 88
Numerical simulation of hydrogen desorption from thin metallic films 87
Intelligenza artificiale: i primi 50 anni 86
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 85
Superconductivity in crystalline and amorphous Nb-Zr thin films 85
Reducing Hydrogen Permeation through Metals 85
Backscattering of electrons from multilayers 84
Monte Carlo simulation of the interaction of electrons with supported and unsupported thin films 83
Theory of the interaction between an electron beam and a thin solid film 83
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy 83
Non-alloyed Ti/Au and Ti/Pt/Au ohmic contacts to p-type InGaAsP 83
Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets 83
Monte Carlo simulation of few-keV positrons penetrating in solids 82
Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices 82
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping 82
Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy 82
Role of core levels ionization in the electron induced dissociation of silicon dioxide 82
Monte Carlo simulation of low-medium energy electrons backscattered from C/Al double layer thin films 81
Elaborazione dei dati sperimentali 79
X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices 79
Development of a numerical simulation of depth profiles of multilayers composed of very thin layers 79
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 78
Mean energy and depth of penetration of electrons backscattered by solid targets 78
REEL spectra from aluminium: experiment and Monte Carlo simulation using two different dielectric functions 77
Penetration of an electron beam in a solid material: a simple model and a numerical simulation 77
Hydrogen permeation through a slab sample in the case of high hydrogen concentration 76
Energy loss spectra of low primary energy (E <= 1 keV) electrons backscattered by silicon dioxide 76
Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation 76
Monte Carlo simulation of positron-stimulated secondary electron emission from solids 75
Penetration of an electron beam in a thin solid film: The influence of backscattering from the substrate 75
The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping 75
Caratterizzazione di laminati zincati di produzione industriale 74
Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films 72
Secondary electron emission yield calculation performed using two different Monte Carlo strategies 72
Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films 71
Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films 70
Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum 66
Antimateria 63
Energy loss of electrons backscattered fromsolids: measured and calculated spectra for Aland Si 62
Comparison between Energy Straggling Strategy andContinuous Slowing Down Approximation in Monte Carlo Simulationof Secondary Electron Emission of Insulating Materials 60
Monte Carlo modeling in the low-energy domainof the secondary electron emission ofpolymethylmethacrylate for critical-dimensionscanning electron microscopy 57
ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING 56
Backscattering of Positrons from Solid Targets 55
The Monte Carlo method with applications to electron transport in solids 54
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 53
Joint experimental and computational study of aluminum 53
L`intelligenza della vita: dal caos all`uomo 51
Diffrazione dei raggi X 51
Cenni di storia della meccanica quantistica 51
Numerical simulation of hydrogen desorption from a membrane 50
L`orologio di Albert 50
Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG) 50
Reflection Electron Energy Loss Spectra beyond the optical limit 50
X-Ray multilayers for diffractometers, monochromators, and spectrometers 49
Monte Carlo Simulation of Electrons Backscattered from Surface Carbon Films 49
Elastic Scattering of Electrons by Atoms: Differential and Transport Cross Section Calculations 48
Electron-beam penetration in surface films 48
Fast Charged-Particle Irradiation of Solids: Excitation of Secondary Electrons and Related Energy Deposition Function in SiO2 47
Relative Role of Physical Mechanisms on Complex Biodamage Induced by Carbon Irradiation 47
Elogio del caso 46
K x-ray emission spectra from eta-Al2O3 46
Secondary Electron Emission and Yield Spectra of Metals from Monte Carlo Simulations and Experiments 46
Slow Electrons Impinging on Dielectric Systems: I. Basic Aspects 43
IN PRAISE OF CHANCE 43
Angle selective backscattered electron contrast in the low-voltage scanning electron microscope: Simulation and experiment for polymers 43
Electrochemical and corrosion behaviour of BN-coated aluminium alloy surfaces 42
Totale 7.990
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Categoria #
all - tutte 40.684
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 1.321
Totale 42.005
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/20201.150 0 0 0 0 0 144 289 160 270 92 65 130
2020/20211.453 70 162 115 172 140 124 122 76 124 77 151 120
2021/20221.101 26 84 9 77 30 98 25 293 47 108 44 260
2022/20231.340 231 107 8 171 191 219 0 88 185 6 105 29
2023/2024726 57 60 53 25 62 166 33 50 6 100 26 88
2024/20251.167 14 36 88 537 158 334 0 0 0 0 0 0
Totale 9.153