IRIS
Dapor, Maurizio
 Distribuzione geografica
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Continente #
NA - Nord America 5.942
EU - Europa 1.131
AS - Asia 184
AF - Africa 1
Continente sconosciuto - Info sul continente non disponibili 1
SA - Sud America 1
Totale 7.260
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Nazione #
US - Stati Uniti d'America 5.923
UA - Ucraina 377
SE - Svezia 282
IT - Italia 143
CN - Cina 108
FI - Finlandia 108
BG - Bulgaria 73
GB - Regno Unito 54
DE - Germania 51
KR - Corea 37
CA - Canada 19
TR - Turchia 13
FR - Francia 9
IN - India 8
SK - Slovacchia (Repubblica Slovacca) 8
VN - Vietnam 8
NL - Olanda 5
CH - Svizzera 3
PL - Polonia 3
RO - Romania 3
CZ - Repubblica Ceca 2
IL - Israele 2
JO - Giordania 2
PT - Portogallo 2
RU - Federazione Russa 2
SG - Singapore 2
AT - Austria 1
EU - Europa 1
GR - Grecia 1
HK - Hong Kong 1
HR - Croazia 1
IE - Irlanda 1
JP - Giappone 1
MA - Marocco 1
MY - Malesia 1
NO - Norvegia 1
PE - Perù 1
RS - Serbia 1
SA - Arabia Saudita 1
Totale 7.260
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Città #
Fairfield 859
Jacksonville 754
Chandler 636
Woodbridge 422
Seattle 407
Ashburn 377
Wilmington 326
Houston 292
Cambridge 274
Ann Arbor 208
San Mateo 178
Princeton 160
Lawrence 118
Sofia 73
Dearborn 62
San Diego 55
Boardman 51
Beijing 39
Düsseldorf 32
Norwalk 29
Washington 23
Trento 21
London 18
Falls Church 15
Des Moines 14
Izmir 13
Milan 10
Hefei 9
Bratislava 8
Dong Ket 8
Kunming 8
Nanjing 8
Toronto 8
Andover 7
Chiswick 7
Helsinki 6
Nanchang 6
San Jose 6
Fremont 5
Phoenix 5
Trieste 5
Bologna 4
Costa Mesa 4
Enfield 4
Guangzhou 4
Rome 4
San Paolo di Civitate 4
Altamura 3
Grevenbroich 3
Jinan 3
Laurel 3
Montréal 3
Ningbo 3
Ottawa 3
Palermo 3
San Michele All'adige 3
Trinitapoli 3
Trumbull 3
Zhengzhou 3
Avellino 2
Baie-D'Urfe 2
Baotou 2
Bremen 2
Brescia 2
Carrara 2
Foggia 2
Frankfurt am Main 2
Fuzhou 2
Hanover 2
Krakow 2
Leawood 2
Montreal 2
Muzzana del Turgnano 2
Old Bridge 2
Padova 2
Paris 2
Serra 2
Shanghai 2
Shaoxing 2
Simi Valley 2
Strelice 2
Tappahannock 2
Tel Aviv 2
Torino 2
Wenzhou 2
Albino 1
Alexandria 1
Aprica 1
Ardea 1
Bassano Del Grappa 1
Belgrade 1
Boscoreale 1
Braunschweig 1
Bristol 1
Brooklyn 1
Buffalo 1
Caronia 1
Catania 1
Cernusco Sul Naviglio 1
Changsha 1
Totale 5.689
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Nome #
Monte Carlo simulations of measured electron energy-loss spectra of diamond and graphite: Role of dielectric-response models 167
Anisotropic Approach for Simulating Electron Transport in Layered Materials: Computational and Experimental Study of Highly Oriented Pyrolitic Graphite 119
Reti neurali artificiali 118
Backscattered electrons from gold surface films deposited on silicon substrates: a joint experimental and computational investigation to add new potentiality to electron microscopy 113
Mapping Polymer Molecular Order in the SEM with Secondary Electron Hyperspectral Imaging 106
Formation of vanadium silicide by high dose ion implantation 102
Preparation of metal glasses by ion implantation and/or sputtering 96
Auger quantitative analysis and preferential sputtering in brass alloys 95
Canonical transformations for relativistic particles 95
Joint experimental and computational study of silicon dioxide electron energy loss spectra 94
Comparison between Monte Carlo and experimental aluminum and silicon electron energy loss spectra 93
Editorial: New Frontiers in Multiscale Modelling of Advanced Materials 93
Secondary electron emission and yield spectra of metals from Monte Carlo simulations and experiments 91
A comprehensive Monte Carlo calculation of dopant contrast in secondary electron imaging 90
Backscattering of electrons from solid targets 90
Electron Irradiation of Dielectric Solids: Surface Electric Field Calculation 90
A comparison between Monte Carlo method and the numerical solution of the Ambartsumian-Chandrasekhar equations to unravel the dielectric response of metals 88
SURPRISES: when ab initio meets statistics in extended systems 87
A Monte Carlo investigation of secondary electron emission from solid targets: Spherical symmetry versus momentum conservation within the classical binary collision model 86
Backscattering of electrons from selected oxides: MgO, SiO2, and Al2O3 84
Monte Carlo Simulation of Secondary Electron Emission from Dielectric Targets 84
Structural investigation of Al2O3 formed by ion implantation at various doses 83
Pd/Ge ohmic contacts for GaAs metal-semiconductor field effect transistors: technology and performance 82
A comparative study of electron and positron penetration in silicon dioxide 82
Analytical transport cross section of medium energy positrons elastically scattered by complex atoms (Z=1-92) 81
Physical properties of TiN thin films 81
Elastic scattering calculations for electrons and positrons in solid targets 80
Momentum transfer dependence of reflection electron energy loss spectra: theory and experiment 80
An analytical approximation of the differential elastic scattering cross-section for electrons in selected oxides 80
Laser-driven acceleration of protons from hydrogenated annealed silicon targets 79
Numerical simulation of hydrogen desorption from thin metallic films 79
Effects of ion beam implantation on the corrosion behaviour of TiN-coated Ti-6Al-4V alloy 77
Comparison of the results of analytical and numerical model calculations of electron backscattering from supported films 77
Non-alloyed Ti/Au and Ti/Pt/Au ohmic contacts to p-type InGaAsP 77
Modeling secondary electron images for linewidth measurement by critical dimension scanning electron microscopy 76
Monte Carlo simulation of the energy deposited by few keV electrons penetrating in thick targets 76
Monte Carlo simulation of the interaction of electrons with supported and unsupported thin films 75
Superconductivity in crystalline and amorphous Nb-Zr thin films 75
Non-adiabatic ab initio molecular dynamics of supersonic beam epitaxy of silicon carbide at room temperature 75
Backscattering of electrons from multilayers 75
Energy selective scanning electron microscopy to reduce the effect of contamination layers on scanning electron microscope dopant mapping 74
Auger electron spectroscopy and x-ray diffraction studies of Ti-Si layers synthesised by ion implantation 73
Stoichiometry in Ti-N barrier layers studied by x-ray emission spectroscopy 73
Monte Carlo simulation of electron depth distribution and backscattering for carbon films deposited on aluminium as a function of incidence angle and primary energy 72
Role of core levels ionization in the electron induced dissociation of silicon dioxide 72
Theory of the interaction between an electron beam and a thin solid film 71
Development of a numerical simulation of depth profiles of multilayers composed of very thin layers 71
Mean energy and depth of penetration of electrons backscattered by solid targets 69
Backscattering of Low Energy Electrons from Carbon Films Deposited on Aluminum: a Monte Carlo Simulation 69
Monte Carlo simulation of low-medium energy electrons backscattered from C/Al double layer thin films 69
Penetration of an electron beam in a solid material: a simple model and a numerical simulation 69
Monte Carlo simulation of few-keV positrons penetrating in solids 68
Electron spectroscopies and inelastic processes in nanoclusters and solids: Theory and experiment 68
Energy loss spectra of low primary energy (E <= 1 keV) electrons backscattered by silicon dioxide 68
REEL spectra from aluminium: experiment and Monte Carlo simulation using two different dielectric functions 68
Elaborazione dei dati sperimentali 67
Hydrogen permeation through a slab sample in the case of high hydrogen concentration 67
Monte Carlo simulation of positron-stimulated secondary electron emission from solids 66
X-ray diffraction study of P-doped polycrystalline Si thin films used in ULSI devices 66
The Effect of Oxide Overlayers on Secondary Electron Dopant Mapping 66
Reducing Hydrogen Permeation through Metals 65
Penetration of an electron beam in a thin solid film: The influence of backscattering from the substrate 64
Seeman-Bohlin x-ray diffraction study of Al-1%Si thin films used in ULSI devices 63
Monte Carlo computations of the electron backscattering coefficient for bulk targets and surface thin films 63
Electrochemical characterization of magnetron sputter-deposited Nb-Zr thin metal films 62
Monte Carlo simulation of backscattered electrons and energy from thick targets and surface films 62
Secondary electron emission yield calculation performed using two different Monte Carlo strategies 62
Caratterizzazione di laminati zincati di produzione industriale 60
Glancing angle x-ray diffraction and x-ray photoelectron spectroscopy studies of nitrogen-implanted tantalum 58
Intelligenza artificiale: i primi 50 anni 52
Antimateria 51
Backscattering of Positrons from Solid Targets 46
Mixed ab initio quantum mechanical and Monte Carlo calculations of secondary emission from SiO2 nanoclusters 44
Joint experimental and computational study of aluminum 44
Energy loss of electrons backscattered fromsolids: measured and calculated spectra for Aland Si 44
Numerical simulation of hydrogen desorption from a membrane 43
L`intelligenza della vita: dal caos all`uomo 42
Diffrazione dei raggi X 42
Monte Carlo modeling in the low-energy domainof the secondary electron emission ofpolymethylmethacrylate for critical-dimensionscanning electron microscopy 42
ENERGY SELECTIVE SECONDARY ELECTRON DETECTION A SOLUTION TO SITE SPECIFIC SEM DOPANT MAPPING 42
The Monte Carlo method with applications to electron transport in solids 41
L`orologio di Albert 41
Cenni di storia della meccanica quantistica 41
Comparison between Energy Straggling Strategy andContinuous Slowing Down Approximation in Monte Carlo Simulationof Secondary Electron Emission of Insulating Materials 41
Computational and experimental study of pi and pi + sigma plasmon loss spectra for low energy (<1000 eV) electrons impinging on highly oriented pyrolitic graphite (HOPG) 41
Electron-beam penetration in surface films 40
X-Ray multilayers for diffractometers, monochromators, and spectrometers 39
Monte Carlo Simulation of Electrons Backscattered from Surface Carbon Films 39
Fast Charged-Particle Irradiation of Solids: Excitation of Secondary Electrons and Related Energy Deposition Function in SiO2 39
Elastic Scattering of Electrons by Atoms: Differential and Transport Cross Section Calculations 39
Elogio del caso 38
Electrochemical and corrosion behaviour of BN-coated aluminium alloy surfaces 36
Slow Electrons Impinging on Dielectric Systems: I. Basic Aspects 36
K x-ray emission spectra from eta-Al2O3 36
Reflection Electron Energy Loss Spectra beyond the optical limit 36
Relative Role of Physical Mechanisms on Complex Biodamage Induced by Carbon Irradiation 35
IN PRAISE OF CHANCE 34
Transport of Energetic Electrons in Solids. Computer Simulation with Applications to Materials Analysis and Characterization 31
Slow Electrons Impinging on Dielectric Systems: II. Implantation Profiles, Mobility and Recombination Processes 31
Experimental and computational study of the mean energy of electrons 31
Totale 6.753
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Categoria #
all - tutte 22.008
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 734
Totale 22.742
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/2019860 0 0 0 1 1 104 0 7 0 141 353 253
2019/20201.893 125 67 148 181 231 144 286 160 267 91 64 129
2020/20211.435 68 161 113 171 137 123 121 75 123 76 149 118
2021/20221.081 25 82 9 75 30 96 24 287 46 107 43 257
2022/20231.329 228 105 8 169 191 216 0 87 181 6 107 31
2023/2024184 57 66 58 3 0 0 0 0 0 0 0 0
Totale 7.369