Lutterotti, Luca
 Distribuzione geografica
Continente #
NA - Nord America 11.247
EU - Europa 2.652
AS - Asia 980
SA - Sud America 169
AF - Africa 79
OC - Oceania 16
Continente sconosciuto - Info sul continente non disponibili 3
Totale 15.146
Nazione #
US - Stati Uniti d'America 11.156
IT - Italia 534
CN - Cina 489
UA - Ucraina 479
SE - Svezia 285
GB - Regno Unito 254
FI - Finlandia 242
DE - Germania 208
FR - Francia 147
BG - Bulgaria 146
IN - India 132
BR - Brasile 131
RU - Federazione Russa 74
TR - Turchia 63
VN - Vietnam 54
MX - Messico 52
ES - Italia 50
DZ - Algeria 43
KR - Corea 39
CA - Canada 36
SG - Singapore 35
JP - Giappone 33
HK - Hong Kong 30
PL - Polonia 28
ID - Indonesia 26
IE - Irlanda 25
RO - Romania 23
IR - Iran 22
SK - Slovacchia (Repubblica Slovacca) 22
NL - Olanda 19
BE - Belgio 18
CH - Svizzera 17
DK - Danimarca 17
AR - Argentina 15
AT - Austria 15
CL - Cile 14
GR - Grecia 13
AU - Australia 12
TN - Tunisia 11
EG - Egitto 10
PT - Portogallo 10
IQ - Iraq 8
OM - Oman 8
ZA - Sudafrica 8
CO - Colombia 7
CZ - Repubblica Ceca 7
PK - Pakistan 7
TH - Thailandia 7
TW - Taiwan 6
BY - Bielorussia 5
HR - Croazia 5
IL - Israele 5
NZ - Nuova Zelanda 4
SA - Arabia Saudita 4
EU - Europa 3
JO - Giordania 3
MA - Marocco 3
AE - Emirati Arabi Uniti 2
AL - Albania 2
CR - Costa Rica 2
KZ - Kazakistan 2
MY - Malesia 2
PE - Perù 2
RS - Serbia 2
AZ - Azerbaigian 1
BW - Botswana 1
HU - Ungheria 1
LR - Liberia 1
LV - Lettonia 1
MD - Moldavia 1
MO - Macao, regione amministrativa speciale della Cina 1
NO - Norvegia 1
PA - Panama 1
PH - Filippine 1
RE - Reunion 1
SC - Seychelles 1
VA - Santa Sede (Città del Vaticano) 1
Totale 15.146
Città #
Fairfield 1.652
Chandler 1.211
Jacksonville 1.031
Ashburn 796
Woodbridge 783
Wilmington 748
Seattle 700
Houston 626
Cambridge 565
Ann Arbor 385
San Mateo 300
Princeton 284
Trento 160
Beijing 152
Dearborn 132
Sofia 121
Helsinki 87
Lawrence 78
San Diego 76
New York 75
Falls Church 63
Boardman 57
Hangzhou 56
Redwood City 47
London 45
Shanghai 34
Des Moines 33
Dong Ket 31
Norwalk 31
Nanjing 30
Izmir 29
Fremont 27
Milan 24
Dublin 22
Nadezhda 22
San Paolo di Civitate 21
Jakarta 20
Paris 19
Guangzhou 18
Hefei 18
Toronto 18
Los Angeles 17
Padova 17
Zhengzhou 17
Düsseldorf 16
João Pessoa 16
Torino 16
Andover 15
Cagliari 15
Kolkata 15
Central 14
Freiberg 14
New Delhi 14
Turin 14
Verona 14
Costa Mesa 13
Kunming 13
Bengaluru 12
Chennai 12
Corvallis 12
Gwanak-gu 12
Phoenix 12
Singapore 12
Aachen 11
Rome 11
West Lafayette 11
Altamura 10
Belo Horizonte 10
Birmingham 10
Bratislava 10
Bremen 10
Chicago 10
Florianópolis 10
Hamburg 10
Ottawa 10
Vienna 10
Barcelona 9
Berlin 9
Bucharest 9
Chengdu 9
Geesthacht 9
Mumbai 9
Sétif 9
Washington 9
Ankara 8
Augusta 8
Changsha 8
Delhi 8
Florence 8
Kilburn 8
La Rochelle 8
Madrid 8
Nanchang 8
Tokyo 8
Baghdad 7
Bedford 7
Chiswick 7
Curitiba 7
Fuzhou 7
Gaithersburg 7
Totale 11.266
Nome #
MAUD (Material Analysis Using Diffraction): a user friendly Java program for Rietveld Texture Analysis and more 1.219
MAUD: a friendly Java program for material analysis using diffraction 1.073
Full-Profile Search-Match (FPSM) by the Rietveld method 291
Analyse des textures cristallographiques et des microstructures 168
Crystallography Open Database (COD): an open-access collection of crystal structures and platform for world-wide collaboration 133
Growth and texture of spark plasma sintered Al2O3 ceramics: A combined analysis of X-rays and electron back scatter diffraction 125
Combined XRD-XRF cluster analysis for automatic chemical and crystallographic surface mappings 123
Wear debris from brake system materials: A multi-analytical characterization approach 118
Crystallography Open Database -- an open-access collection of crystal structures 118
Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments 117
Instrumental Broadening Determination for XRD Profile Analysis 117
Quantitative Texture Analysis of Spark Plasma Textured n-Bi2Te3 116
Fast microstructure and phase analyses of nanopowders using combined analysis of transmission electron microscopy scattering patterns 114
Modeling Solidification Microstructures of Steel Round Billets Obtained by Continuous Casting 114
X-Ray Combined QTA Using a CPS Applied to a Ferroelectric Ultrastructure 114
Highly crystalline strontium ferrites SrFeO3−δ: an easy and effective wet-chemistry synthesis 112
Texture, residual stress and structural analysis of thin films using a combined X-ray analysis 112
Characterization of nanograined powder samples using the Rietveld method applied to electron diffraction ring patterns 110
Algorithms for solving crystal structure using texture 110
Advances in exploiting preferred orientation in the structure analysis of polycrystalline materials 109
Avoiding surface and absorption effects in XRD quantitative phase analysis 108
Characterization of microstructure and crystallographic texture of silicate and phyllosilicate ceramics 108
Rietveld texture analysis from diffraction images 107
Mineralogical investigations using XRD, XRF, and Raman spectroscopy in a combined approach 107
Quantitative Texture Analysis with the HIPPO TOF Diffractometer 106
Texture analysis from diffraction spectra 106
Ambipolar organic thin film transistors based on a soluble pentacene derivative 106
Rietveld texture and stress analysis of thin films by x-ray diffraction 106
Metastable Structures in a-b' Brass 105
Combined X-ray diffraction and fluorescence analysis in the cultural heritage field 105
Characterization of the mistura alloy used for Venetian sesino coins: 16th century 105
Particle anisotropy and crystalline phase transition in one-pot synthesis of nano-zirconia: A causal relationship 105
COD (Crystallography Open Database) and PCOD (Predicted) 103
Combining XRD and XRF analysis in one Rietveld-like fitting 103
Diffraction methods for the characterisation of defects in intermetallic compounds 102
Rietveld texture analysis from synchrotron diffraction images. I. Calibration and basic analysis 102
Voyaging around nacre with the X-ray shuttle: From bio-mineralisation to prosthetics via mollusc phylogeny 102
Total pattern fitting for the combined size-strain-stress-texture determination in thin film diffraction 101
ReX: a computer program for structural analysis using powder diffraction data 99
Texture measurements using the new neutron diffractometer HIPPO and their analysis using the Rietveld method 98
Quantitative 3D microstructural analysis of naturally deformed amphibolite from the Southern Alps (Italy): Microstructures, CPO and seismic anisotropy from a fossil extensional margin 98
Quantitative Analysis of Silicate Glass in Ceramic Materials by the Rietveld Method 97
Raman Open Database: first interconnected Raman–X-ray diffraction open-access resource for material identification 97
The correlation between gate dielectric, film growth, and charge transport in organic thin film transistors: the case of vacuum-sublimed tetracene thin films 96
Quantitative Phase Analysis: Method Developments 95
Progress in Bulk Texture Measurement Using Neutron Diffraction 95
Effect of Processing and Orientation on Structural and Mechanical Properties of Polypropylene Products 95
XRD Characterization of Multilayered Systems 94
Application of the rietveld method to phase analysis of multilayered systems 94
Advances in Texture Analysis from Diffraction Spectra 92
Thermal behaviour of monoclinic zirconia at low temperature by XRPD Full Pattern Analysis 92
Quantitative Fiber Diffraction: from polymers to composites 92
Thermal expansion anisotropy of ceria-stabilized tetragonal zirconia 91
Quantitative texture analysis of glaucophanite deformed under eclogite facies conditions (Sesia-Lanzo zone, Western Alps): Comparison between x-ray and neutron diffraction analysis. 91
Low temperature X-ray powder diffraction of ceria-stabilized Zirconia 91
A combined experimental approach to the study of ancient coins and its application the Venetian "sesino" 91
Profile fitting by the interference function 90
Combining grazing incidence X-ray diffraction and X-ray reflectivity for the evaluation of the structural evolution of HfO2 thin films with annealing 90
Rietveld refinement using Debye-Scherrer film techniques 90
Brittle plus plastic deformation of gypsum aggregates experimentally deformed in torsion to high strains: quantitative microstructural and texture analysis from optical and diffraction data 89
Combining Rietveld and reflectivity for thin film analysis 89
Quantitative texture analysis and combined analysis 89
Pyrolysis pathway of sol-gel derived organic/inorganic hybrid nanocomposites 88
Magnetic and X-Ray DiffractionInvestigations of the Reordering of a Ball Milled Fe-40Al at%Alloy 88
Kinetics of reordering in a nanograined feal alloy 88
Microstructural and KineticAspects of the Transformations Induced in a FeAl Alloy by BallMillingand Thermal Treatments. 86
Textured Al-doped ZnO ceramics with isotropic grains 86
Crystal structure and texture refinement of polymers from diffraction images 86
Experimental Determination of the Instrumental Broadening in the Bragg-Brentano Geometry 85
Structural analysis of strained LaVO3 thin films 85
Practical application of the Rietveld texture analysis in material science: problems and solutions 84
Thermal analysis of plasma-sprayed thermal barrier coatings 83
Modified thick thermal barrier coatings: microstructural characterization 83
Preferred orientation of ettringite in concrete fractures 83
Texture analysis with the new hippo tof diffractometer. 82
Texture analysis of quartzite by whole pattern deconvolution 82
Microstructure of Zr-25at% Al Melt Spun Ribbons 82
Synthesis, Characterization and Photocatalytic Activity of TiO2 Powders Prepared Under Different Gelling and Pressure Conditions 82
Characterization of epitaxial SrTiO3/Yba2Cu3O7 layers deposited on (001) MgO by laser ablation 81
Reaction Sintering of Fe-Al-Si Alloys 81
Corrigendum to: "wear debris from brake system materials: A multi-analytical characterization approach" (Tribol Int (2016) 97 (249-59) DOI: 10.1016/j.triboint.2015.08.011) 81
Rietveld Texture Analysis from TOF neutron diffraction data 80
Texture Analysis of Quartzite by Whole Pattern Deconvolution 79
Microstructure of Zr-25at% Al Melt Spun Ribbons 79
X-Ray Diffraction Characterization of Heavily DeformedMetallic Specimens 79
Combined X-ray Texture - Structure - Microstructure Analysis Applied to Ferroelectric Ultrastructures: A Case Study on Pb0.76Ca0.24TiO3 79
Advances in Texture Analysis from Diffraction Spectra 79
Texture analysis of ancient coins with TOF neutron diffraction 78
Influence of Ce3+/Ce4+ ratio on phase stability and residual stress field in ceria-yttria stabilized zirconia plasma-sprayed coatings 77
Quantitative Analysis of Silicate Glass in Ceramic Materials by the Rietveld Method 76
X-ray textural and microstructural characterisations by using the Combined Analysis Approach for the optical optimisation of micro- and nano-structured thin films 76
Rietveld Texture Analysis of Dabie Shan Eclogite from TOF Neutron Diffraction Spectra 75
Texture analysis from synchrotron images with the Rietveld method: dinosaur tendon and salmon scale 75
Simultaneous structure and size-strain refinement by the Rietveld method 73
Maud: a Rietveld analysis program designed for the internet and experiment integration 72
Size-Strain and quantitative phase analysis by the Rietveld method 72
Skillful copper forging at the time of the iceman 71
Quantitative Texture Analysis with the Hippo TOF Diffractometer 71
Method for the simultaneous determination of anisotropic residual stresses and texture by x-ray diffraction 70
Microstructural Characterization of Plasma- Sprayed Zirconia Thermal Barrier Coatings by X-ray Diffraction Full Pattern Analysis 69
Totale 11.761
Categoria #
all - tutte 56.967
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 4.676
Totale 61.643


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/20191.299 0 0 0 0 0 0 0 0 0 273 588 438
2019/20203.705 253 157 224 345 465 290 526 353 524 219 118 231
2020/20213.050 157 336 170 373 310 378 224 175 218 197 247 265
2021/20222.081 134 327 19 111 76 98 125 427 85 147 152 380
2022/20232.469 386 223 33 320 294 396 19 214 286 49 166 83
2023/20241.208 120 155 87 105 159 197 133 133 24 95 0 0
Totale 15.681