Lutterotti, Luca

Lutterotti, Luca  

Ingegneria industriale (29/10/12-)  

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Risultati 1 - 20 di 183 (tempo di esecuzione: 0.039 secondi).
Titolo Anno di pubblicazione Autori Unitn File
20 Years of Maud and the Rietveld Texture Analysis 1-gen-2017 Luca LutterottiWenk, Hans - Rudolf +
32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications 1-gen-2019 Demenev E.Ronchin S.Ficorella F.Borovin E.Lutterotti L. +
3D Imaging on heterogeneous surfaces on laterite drill core materials 1-gen-2017 Lutterotti L.Borovin E.Bortolotti M.Secchi M.Montagna M. +
Advances in exploiting preferred orientation in the structure analysis of polycrystalline materials 1-gen-2013 Lutterotti, Luca +
Advances in Texture Analysis from Diffraction Spectra 1-gen-1997 Lutterotti, Luca +
Advances in Texture Analysis from Diffraction Spectra 1-gen-1997 Lutterotti, Luca +
Algorithms for solving crystal structure using texture 1-gen-2005 Lutterotti, LucaBortolotti, Mauro
Ambipolar organic thin film transistors based on a soluble pentacene derivative 1-gen-2011 Lutterotti, Luca +
An integrated approach for material characterization by diffraction 1-gen-1998 Lutterotti, Luca
Analyse des textures cristallographiques et des microstructures 1-gen-2015 Lutterotti, Luca +
Application of the rietveld method to phase analysis of multilayered systems 1-gen-1993 Lutterotti, LucaScardi, Paolo +
Applicazioni del Metodo dellaMedia Geometrica al Calcolo dei Moduli Elastici di Materiali Compositi 1-gen-1996 Lutterotti, LucaGialanella, Stefano +
Avoiding surface and absorption effects in XRD quantitative phase analysis 1-gen-1998 Lutterotti, Luca +
Brittle plus plastic deformation of gypsum aggregates experimentally deformed in torsion to high strains: quantitative microstructural and texture analysis from optical and diffraction data 1-gen-2010 Lutterotti, Luca +
Characterization of epitaxial SrTiO3/Yba2Cu3O7 layers deposited on (001) MgO by laser ablation 1-gen-1993 Scardi, PaoloLutterotti, Luca +
Characterization of microstructure and crystallographic texture of silicate and phyllosilicate ceramics 1-gen-2010 Lutterotti, Luca +
Characterization of nanograined powder samples using the Rietveld method applied to electron diffraction ring patterns 1-gen-2017 Serafini, AndreaLutterotti, LucaGialanella, Stefano +
Characterization of the mistura alloy used for Venetian sesino coins: 16th century 1-gen-2019 Martorelli, D.Bortolotti, M.Lutterotti, L.Gialanella, S. +
COD (Crystallography Open Database) and PCOD (Predicted) 1-gen-2005 Lutterotti, Luca +
Combined Analysis extended to Raman and IR spectroscopies: SOLSA EU Project 1-gen-2017 Luca LutterottiEvgeny BorovinMauro BortolottiMaria SecchiMaurizio Montagna +