Synchrotron X-ray diffraction images are increasingly used to characterize crystallographic preferred orientation distributions (texture) of fine-grained polyphase materials. Diffraction images can be analyzed quantitatively with the Rietveld method as implemented in the software package Materials Analysis Using Diffraction. Here we describe the analysis procedure for diffraction images collected with high energy X-rays for a complex, multiphase shale, and for those collected in situ in diamond anvil cells at high pressure and anisotropic stress.
Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments / H. R., Wenk; Lutterotti, Luca; P., Kaercher; W., Kanitpanyacharoen; L., Miyagi; R., Vasin. - In: POWDER DIFFRACTION. - ISSN 0885-7156. - STAMPA. - 29:3(2014), pp. 220-232.
Titolo: | Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments |
Autori: | H. R., Wenk; Lutterotti, Luca; P., Kaercher; W., Kanitpanyacharoen; L., Miyagi; R., Vasin |
Autori Unitn: | |
Titolo del periodico: | POWDER DIFFRACTION |
Anno di pubblicazione: | 2014 |
Numero e parte del fascicolo: | 3 |
Codice identificativo Scopus: | 2-s2.0-84911006871 |
Codice identificativo ISI: | WOS:000342330500002 |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1017/S0885715614000360 |
Handle: | http://hdl.handle.net/11572/100722 |
Citazione: | Rietveld texture analysis from synchrotron diffraction images. II. Complex multiphase materials and diamond anvil cell experiments / H. R., Wenk; Lutterotti, Luca; P., Kaercher; W., Kanitpanyacharoen; L., Miyagi; R., Vasin. - In: POWDER DIFFRACTION. - ISSN 0885-7156. - STAMPA. - 29:3(2014), pp. 220-232. |
Appare nelle tipologie: | 03.1 Articolo su rivista (Journal article) |
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