Texture analysis from diffraction spectra

The orientation distribution of a textured polycrystal is generally determined from a few individual pole figures, measured by x-ray or neutron diffraction. A method is proposed to use the whole diffraction spectrum, rather than extracted peak intensities, by combining ODF calculation with the crystallographic Rietveld method. This approach promises to be advantageous for low symmetry compounds with complicated diffraction spectra and composites. The method is particularly elegant for TOF neutron diffraction, saving beam time by using small pole figure regions and many diffractions.