The procedure to perform Rietveld texture analysis from diffraction images collected with CCDs or image plates is shown. In some cases only one transmission image may be sufficient to obtain an Orientation Distribution Function (ODF) if a sufficient number of' peaks are included. The irnages are transformed in spectra and analyzed using the Maud Rietveld prograrn containing some recently developed texture model well suited for this kind of analysis. In this work we will present the results obtained using a custom laboratory image plate camera developed for texture analysis. The instrument may work with a curve image plate detector in reflection condition or with a flat detector in transmission. The reflection condition is used mainly for cerainics and metal-alloys and the transmission mode for polymers and fibres. We will show how with the combination Of Such camera and the Rietveld Texture Analysis method we were able to analyze the ODF ofthe niartensitic phase of Shape Memory Alloy (rnonoclinic NiTi SMA) as well as to obtain the quantitative texture of low symmetry polymers in fibre form.

Rietveld texture analysis from diffraction images / Lutterotti, Luca; Bortolotti, Mauro; Ischia, Gloria; Lonardelli, Ivan; H., Wenk. - In: ZEITSCHRIFT FUR KRISTALLOGRAPHIE. - ISSN 0044-2968. - STAMPA. - 26:(2007), pp. 125-130. [10.1524/9783486992540-020]

Rietveld texture analysis from diffraction images

Lutterotti, Luca;Bortolotti, Mauro;Ischia, Gloria;Lonardelli, Ivan;
2007-01-01

Abstract

The procedure to perform Rietveld texture analysis from diffraction images collected with CCDs or image plates is shown. In some cases only one transmission image may be sufficient to obtain an Orientation Distribution Function (ODF) if a sufficient number of' peaks are included. The irnages are transformed in spectra and analyzed using the Maud Rietveld prograrn containing some recently developed texture model well suited for this kind of analysis. In this work we will present the results obtained using a custom laboratory image plate camera developed for texture analysis. The instrument may work with a curve image plate detector in reflection condition or with a flat detector in transmission. The reflection condition is used mainly for cerainics and metal-alloys and the transmission mode for polymers and fibres. We will show how with the combination Of Such camera and the Rietveld Texture Analysis method we were able to analyze the ODF ofthe niartensitic phase of Shape Memory Alloy (rnonoclinic NiTi SMA) as well as to obtain the quantitative texture of low symmetry polymers in fibre form.
2007
Lutterotti, Luca; Bortolotti, Mauro; Ischia, Gloria; Lonardelli, Ivan; H., Wenk
Rietveld texture analysis from diffraction images / Lutterotti, Luca; Bortolotti, Mauro; Ischia, Gloria; Lonardelli, Ivan; H., Wenk. - In: ZEITSCHRIFT FUR KRISTALLOGRAPHIE. - ISSN 0044-2968. - STAMPA. - 26:(2007), pp. 125-130. [10.1524/9783486992540-020]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/62952
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