IRIS
Karwasz, Grzegorz
 Distribuzione geografica
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Continente #
NA - Nord America 4.655
AS - Asia 1.352
EU - Europa 1.174
SA - Sud America 194
Continente sconosciuto - Info sul continente non disponibili 37
AF - Africa 30
OC - Oceania 2
Totale 7.444
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Nazione #
US - Stati Uniti d'America 4.606
SG - Singapore 636
CN - Cina 266
UA - Ucraina 236
VN - Vietnam 214
SE - Svezia 205
RU - Federazione Russa 197
BR - Brasile 158
FI - Finlandia 109
DE - Germania 81
GB - Regno Unito 80
BG - Bulgaria 69
FR - Francia 63
HK - Hong Kong 63
LV - Lettonia 62
IN - India 46
KR - Corea 43
IT - Italia 31
CA - Canada 23
BD - Bangladesh 12
AR - Argentina 11
IQ - Iraq 11
NL - Olanda 10
PL - Polonia 10
ES - Italia 9
MX - Messico 9
EU - Europa 8
JP - Giappone 8
ZA - Sudafrica 8
AE - Emirati Arabi Uniti 7
CO - Colombia 7
EC - Ecuador 7
PK - Pakistan 7
MA - Marocco 6
TR - Turchia 6
CR - Costa Rica 5
KE - Kenya 5
IL - Israele 4
JO - Giordania 4
PH - Filippine 4
VE - Venezuela 4
BE - Belgio 3
CZ - Repubblica Ceca 3
JM - Giamaica 3
PE - Perù 3
SA - Arabia Saudita 3
UZ - Uzbekistan 3
CL - Cile 2
DO - Repubblica Dominicana 2
HN - Honduras 2
KG - Kirghizistan 2
MY - Malesia 2
NG - Nigeria 2
NP - Nepal 2
PA - Panama 2
SN - Senegal 2
TN - Tunisia 2
TW - Taiwan 2
AL - Albania 1
AO - Angola 1
AT - Austria 1
AU - Australia 1
AZ - Azerbaigian 1
BB - Barbados 1
BO - Bolivia 1
BS - Bahamas 1
CI - Costa d'Avorio 1
DZ - Algeria 1
ET - Etiopia 1
GE - Georgia 1
GT - Guatemala 1
ID - Indonesia 1
IE - Irlanda 1
LT - Lituania 1
LY - Libia 1
MN - Mongolia 1
NZ - Nuova Zelanda 1
OM - Oman 1
PT - Portogallo 1
PY - Paraguay 1
QA - Qatar 1
SK - Slovacchia (Repubblica Slovacca) 1
TH - Thailandia 1
Totale 7.415
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Città #
Jacksonville 459
Ashburn 423
Singapore 417
Chandler 401
Fairfield 366
San Jose 197
Woodbridge 195
Seattle 179
Ann Arbor 167
Wilmington 165
Houston 164
Cambridge 162
Columbus 162
Dallas 157
San Mateo 114
Santa Clara 107
Princeton 106
Moscow 82
New York 78
Sofia 66
Council Bluffs 65
The Dalles 65
Beijing 64
Hanoi 64
Los Angeles 62
Riga 61
Ho Chi Minh City 57
Boardman 55
Hong Kong 51
Lauterbourg 51
Dearborn 49
Helsinki 42
Seoul 39
Buffalo 35
San Diego 28
Hefei 23
Munich 19
Lawrence 17
Düsseldorf 16
London 16
Orem 14
São Paulo 14
Frankfurt am Main 11
Denver 10
Toronto 10
Pune 9
Redondo Beach 9
Chicago 8
Kunming 8
Phoenix 8
Andover 7
Boston 7
Falls Church 7
Haiphong 7
Johannesburg 7
Warsaw 7
Brooklyn 6
Costa Mesa 6
Da Nang 6
Rio de Janeiro 6
Turku 6
Amsterdam 5
Brasília 5
Curitiba 5
Des Moines 5
Dhaka 5
Dubai 5
Falkenstein 5
Fortaleza 5
Guayaquil 5
Manchester 5
Nairobi 5
Atlanta 4
Belo Horizonte 4
Biên Hòa 4
Erbil 4
Guangzhou 4
Hải Dương 4
Lahore 4
Miami 4
Milan 4
Mumbai 4
Nanjing 4
Norwalk 4
Ottawa 4
San José 4
Shanghai 4
Shenyang 4
Stockholm 4
Tokyo 4
Amman 3
Brno 3
Brussels 3
Caxias do Sul 3
Changsha 3
Chennai 3
Goiânia 3
Montreal 3
Nuremberg 3
Piscataway 3
Totale 5.376
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Nome #
Absolute total cross section measurements for intermediate energy electron scattering: III. Ne and Ar 231
Absolute Total Cross Section Measurements for Intermediate Energy Electron Scattering: IV Kr and Xe 188
A concept of a Scanning Positron Microscope 185
A novel set-up for positron scattering in gases 183
A concept of a Scanning Positron Microscope 181
Amorphous carbon film growth on Si: correlation between stress and generation of defects into the substrate 174
Amorphous Carbon Thin Films Deposited on Si and PET: Study of Interface States 173
Single-crystal silicon coimplanted by helium and hydrogen: evolution of decorated vacancylike defects with thermal treatments 170
Absolute total cross sections for electron-CO2 scattering at energies from 0.5 to 3000 eV 162
Additivity rule for electron-molecule cross section calculation: a geometrical approach 159
Formation of vacancy clusters and cavities in He-implanted silicon studied by slow-positron annihilation spectroscopy, 158
Comparative study of porosity in low-k SiOCH thin films obtained at different deposition conditions 152
Stress and interfacial defects induced by amorphous carbon film growth on silicon 150
Absence of positronium formation in clean buried nanocavities in p-type silicon 150
A pulsed positron microbeam 150
Application of positron annihilation techniques for semiconductor studies 149
Absolute Total Cross sections for electron scattering on NO2, SO2, OCS in the intermediate energy range 144
Absolute Total Cross Sections for e-CH4, NH3, SiH4, H2S Scattering at Intermediate Energy 141
High performance electrostatic positron beam 141
Low-energy electron collisions in nitrogen oxides: a comparative study 135
Total absolute cross sections for electron scattering on H2O at intermediate energies 134
Absolute total cross section measurements for electron scattering from silicon tetrachloride, SiCl4 , molecules 133
Low Energy Cross-Sections for Positron Interactions with Cyclic Hydrocarbons 127
Positron annihilation in B-doped and undoped single and polycrystalline Ni3Al alloys 125
The Munchen scanning positron microscope 122
Influence of Mn and Fe on Defects in NiAl Alloy investigated by Positron Annihilation Techniques 122
The 3d-shell electrons in NiAl-based alloys containing Cr and Co studied by positron annihilation 118
SF6 Absolute Total Electron scattering Cross Section in the 75-4000 eV Energy Range 117
Porosity of low-k materials studied by slow positron beam 116
Depth profile porosity and microstructure evolution studied by positron annihilation and Raman spectroscopy in SiOCH low-kappa films 115
Decoration of buried surfaces in Si detected by positron annihilation spectroscopy 115
Positron scattering in helium: Virtual-positronium resonances 111
Surfaces of electron- emitting glasses studied by a slow positron beam 110
Comment on: 'Electron scattering by Ne, Ar and Kr at intermediate and high energies , 0.5-10 keV' 109
Structural evolution of nanocrystalline Pd-Mg bilayers under deuterium absorption and desorption cycles 108
Positron Scattering in gases - First Results from Low-Energy Spectrometer in Trento 106
Energy scale determination and energy resolution in positron total cross section measurements 106
Total cross sections for positron scattering in argon, nitrogen and hydrogen below 20 eV 105
Absolute Total Cross Sections for Electron Scattering on Hydride Molecules and Chlorofluorocarbons 103
Absolute Total Cross Sections for Intermediate Energy Electron-Hydrides and Freons Scattering 101
Total Absolute Cross Sections Measurements for Electron Scattering on CO2 and H2O molecules 100
Positron-annihilation monitoring of reduction processes in conducting glasses 100
Electron scattering on triatomic molecules: the need for data 100
Intermediate energy total cross sections for electron scattering on WF6 99
Total cross sections for Electron scattering on WF6- study of Thomas - Fermi relation 94
Total Cross section measurements for electron scattering by NH3, SiH4, and H2S in the intermediate energy range 94
Cross Section Measurements for e- CO scattering: 80 eV - 4000 eV 93
Positron annihilation studies for Czochralski-grown silicon, annealed under pressure 91
Positron annihilation and photoluminescence studies of nanostructured ZrO2 90
Positron Scattering on atoms at Intermediate Energies 88
Total cross sections for electron scattering on NO2, OCS, SO2 at intermediate energies 84
Defects studies in Fe3Al Alloys Doped with Cr, Mo and Si 84
One century of experiments on electron - atom and moleule scattering. A critical review of integral cross sections. Part I Atoms and diatomic molecules 82
Doppler- broadening studies of surface-modified conducting polyethylene 79
One century of experiments on electron-atom and molecule scattering. 78
Reemitted Positron Spectroscopy of Metal Surfaces 78
One century of experiments on electron-atom and molecule scattering: A critical review of integral cross-sections. III- Hydrocarbons and halides 76
Effects of Zr and Nb on d electrons in NiAl studied by coincidence positron annihilation spectroscopy 74
Surface of SiO2-Bi2O3 Glasses Studied by a Slow Positron Beam 74
Replay to A. Zecca's comment on 'Positron scattering in helium: virtual-positronium resonances' by G.P. Karwasz, D. Pliszka, A. Zecca, R.S. Brusa [Nucl. Instr. and Meth. B 240 (2005) 666] 71
Porosity in low dielectric constant SiOCH films depth profiled by positron annihilation spectroscopy 69
null 67
Totale 7.444
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Categoria #
all - tutte 29.143
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 29.143
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2021/2022651 0 79 2 55 40 21 24 195 21 49 69 96
2022/2023805 133 66 4 115 134 120 1 54 113 13 32 20
2023/2024301 23 24 11 12 28 93 4 50 0 5 10 41
2024/2025987 2 4 61 199 73 124 0 66 60 189 84 125
2025/20262.086 146 33 280 316 207 163 466 27 154 201 52 41
2026/2027163 29 134 0 0 0 0 0 0 0 0 0 0
Totale 7.444