IRIS
Karwasz, Grzegorz
 Distribuzione geografica
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Continente #
NA - Nord America 4.506
AS - Asia 1.344
EU - Europa 1.164
SA - Sud America 191
AF - Africa 30
Continente sconosciuto - Info sul continente non disponibili 8
OC - Oceania 2
Totale 7.245
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Nazione #
US - Stati Uniti d'America 4.460
SG - Singapore 632
CN - Cina 263
UA - Ucraina 235
VN - Vietnam 214
SE - Svezia 205
RU - Federazione Russa 197
BR - Brasile 156
FI - Finlandia 109
DE - Germania 81
GB - Regno Unito 80
BG - Bulgaria 69
FR - Francia 62
HK - Hong Kong 62
LV - Lettonia 61
IN - India 46
KR - Corea 43
IT - Italia 26
CA - Canada 22
BD - Bangladesh 12
IQ - Iraq 11
AR - Argentina 10
NL - Olanda 10
PL - Polonia 10
MX - Messico 9
EU - Europa 8
JP - Giappone 8
ZA - Sudafrica 8
AE - Emirati Arabi Uniti 7
CO - Colombia 7
EC - Ecuador 7
ES - Italia 7
PK - Pakistan 7
MA - Marocco 6
TR - Turchia 6
KE - Kenya 5
CR - Costa Rica 4
IL - Israele 4
JO - Giordania 4
PH - Filippine 4
VE - Venezuela 4
BE - Belgio 3
CZ - Repubblica Ceca 3
PE - Perù 3
SA - Arabia Saudita 3
UZ - Uzbekistan 3
CL - Cile 2
DO - Repubblica Dominicana 2
HN - Honduras 2
JM - Giamaica 2
KG - Kirghizistan 2
MY - Malesia 2
NG - Nigeria 2
NP - Nepal 2
PA - Panama 2
SN - Senegal 2
TN - Tunisia 2
TW - Taiwan 2
AL - Albania 1
AO - Angola 1
AT - Austria 1
AU - Australia 1
AZ - Azerbaigian 1
BB - Barbados 1
BO - Bolivia 1
BS - Bahamas 1
CI - Costa d'Avorio 1
DZ - Algeria 1
ET - Etiopia 1
GE - Georgia 1
GT - Guatemala 1
ID - Indonesia 1
IE - Irlanda 1
LT - Lituania 1
LY - Libia 1
MN - Mongolia 1
NZ - Nuova Zelanda 1
OM - Oman 1
PT - Portogallo 1
PY - Paraguay 1
QA - Qatar 1
SK - Slovacchia (Repubblica Slovacca) 1
TH - Thailandia 1
Totale 7.245
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Città #
Jacksonville 459
Ashburn 420
Singapore 416
Chandler 401
Fairfield 366
San Jose 197
Woodbridge 195
Seattle 179
Ann Arbor 167
Wilmington 165
Cambridge 162
Houston 161
Dallas 157
Columbus 117
San Mateo 114
Princeton 106
Santa Clara 104
Moscow 82
New York 78
Sofia 66
The Dalles 65
Hanoi 64
Beijing 63
Los Angeles 62
Riga 61
Ho Chi Minh City 57
Boardman 55
Lauterbourg 51
Hong Kong 50
Dearborn 48
Helsinki 42
Seoul 39
Buffalo 35
San Diego 28
Hefei 23
Munich 19
Lawrence 17
Düsseldorf 16
London 16
Orem 14
São Paulo 14
Frankfurt am Main 11
Denver 10
Toronto 10
Pune 9
Redondo Beach 9
Chicago 8
Kunming 8
Andover 7
Falls Church 7
Haiphong 7
Johannesburg 7
Warsaw 7
Brooklyn 6
Costa Mesa 6
Da Nang 6
Rio de Janeiro 6
Turku 6
Amsterdam 5
Boston 5
Brasília 5
Curitiba 5
Des Moines 5
Dhaka 5
Dubai 5
Falkenstein 5
Fortaleza 5
Guayaquil 5
Manchester 5
Nairobi 5
Atlanta 4
Belo Horizonte 4
Biên Hòa 4
Erbil 4
Guangzhou 4
Hải Dương 4
Lahore 4
Milan 4
Mumbai 4
Nanjing 4
Norwalk 4
Ottawa 4
Phoenix 4
Shanghai 4
Shenyang 4
Stockholm 4
Tokyo 4
Amman 3
Brno 3
Brussels 3
Caxias do Sul 3
Changsha 3
Chennai 3
Council Bluffs 3
Goiânia 3
Miami 3
Montreal 3
Nuremberg 3
Piscataway 3
Poplar 3
Totale 5.248
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Nome #
Absolute total cross section measurements for intermediate energy electron scattering: III. Ne and Ar 227
Absolute Total Cross Section Measurements for Intermediate Energy Electron Scattering: IV Kr and Xe 185
A concept of a Scanning Positron Microscope 182
A novel set-up for positron scattering in gases 179
A concept of a Scanning Positron Microscope 178
Amorphous Carbon Thin Films Deposited on Si and PET: Study of Interface States 170
Amorphous carbon film growth on Si: correlation between stress and generation of defects into the substrate 170
Single-crystal silicon coimplanted by helium and hydrogen: evolution of decorated vacancylike defects with thermal treatments 168
Absolute total cross sections for electron-CO2 scattering at energies from 0.5 to 3000 eV 159
Additivity rule for electron-molecule cross section calculation: a geometrical approach 155
Formation of vacancy clusters and cavities in He-implanted silicon studied by slow-positron annihilation spectroscopy, 152
Comparative study of porosity in low-k SiOCH thin films obtained at different deposition conditions 149
A pulsed positron microbeam 148
Stress and interfacial defects induced by amorphous carbon film growth on silicon 147
Absence of positronium formation in clean buried nanocavities in p-type silicon 147
Application of positron annihilation techniques for semiconductor studies 144
Absolute Total Cross Sections for e-CH4, NH3, SiH4, H2S Scattering at Intermediate Energy 138
Absolute Total Cross sections for electron scattering on NO2, SO2, OCS in the intermediate energy range 138
High performance electrostatic positron beam 137
Total absolute cross sections for electron scattering on H2O at intermediate energies 132
Low-energy electron collisions in nitrogen oxides: a comparative study 132
Absolute total cross section measurements for electron scattering from silicon tetrachloride, SiCl4 , molecules 131
Low Energy Cross-Sections for Positron Interactions with Cyclic Hydrocarbons 126
Positron annihilation in B-doped and undoped single and polycrystalline Ni3Al alloys 123
The Munchen scanning positron microscope 120
Influence of Mn and Fe on Defects in NiAl Alloy investigated by Positron Annihilation Techniques 120
The 3d-shell electrons in NiAl-based alloys containing Cr and Co studied by positron annihilation 114
SF6 Absolute Total Electron scattering Cross Section in the 75-4000 eV Energy Range 114
Porosity of low-k materials studied by slow positron beam 114
Depth profile porosity and microstructure evolution studied by positron annihilation and Raman spectroscopy in SiOCH low-kappa films 113
Decoration of buried surfaces in Si detected by positron annihilation spectroscopy 113
Comment on: 'Electron scattering by Ne, Ar and Kr at intermediate and high energies , 0.5-10 keV' 108
Surfaces of electron- emitting glasses studied by a slow positron beam 108
Positron scattering in helium: Virtual-positronium resonances 108
Structural evolution of nanocrystalline Pd-Mg bilayers under deuterium absorption and desorption cycles 106
Energy scale determination and energy resolution in positron total cross section measurements 104
Positron Scattering in gases - First Results from Low-Energy Spectrometer in Trento 103
Total cross sections for positron scattering in argon, nitrogen and hydrogen below 20 eV 102
Absolute Total Cross Sections for Electron Scattering on Hydride Molecules and Chlorofluorocarbons 100
Total Absolute Cross Sections Measurements for Electron Scattering on CO2 and H2O molecules 98
Positron-annihilation monitoring of reduction processes in conducting glasses 98
Absolute Total Cross Sections for Intermediate Energy Electron-Hydrides and Freons Scattering 98
Electron scattering on triatomic molecules: the need for data 98
Intermediate energy total cross sections for electron scattering on WF6 97
Total Cross section measurements for electron scattering by NH3, SiH4, and H2S in the intermediate energy range 91
Total cross sections for Electron scattering on WF6- study of Thomas - Fermi relation 90
Positron annihilation studies for Czochralski-grown silicon, annealed under pressure 90
Cross Section Measurements for e- CO scattering: 80 eV - 4000 eV 90
Positron annihilation and photoluminescence studies of nanostructured ZrO2 88
Positron Scattering on atoms at Intermediate Energies 84
Total cross sections for electron scattering on NO2, OCS, SO2 at intermediate energies 80
One century of experiments on electron - atom and moleule scattering. A critical review of integral cross sections. Part I Atoms and diatomic molecules 80
Defects studies in Fe3Al Alloys Doped with Cr, Mo and Si 80
Doppler- broadening studies of surface-modified conducting polyethylene 77
One century of experiments on electron-atom and molecule scattering. 76
Reemitted Positron Spectroscopy of Metal Surfaces 75
One century of experiments on electron-atom and molecule scattering: A critical review of integral cross-sections. III- Hydrocarbons and halides 74
Effects of Zr and Nb on d electrons in NiAl studied by coincidence positron annihilation spectroscopy 72
Surface of SiO2-Bi2O3 Glasses Studied by a Slow Positron Beam 72
Replay to A. Zecca's comment on 'Positron scattering in helium: virtual-positronium resonances' by G.P. Karwasz, D. Pliszka, A. Zecca, R.S. Brusa [Nucl. Instr. and Meth. B 240 (2005) 666] 69
null 67
Porosity in low dielectric constant SiOCH films depth profiled by positron annihilation spectroscopy 66
Totale 7.274
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Categoria #
all - tutte 28.159
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 28.159
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Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202135 0 0 0 0 0 0 0 0 0 0 0 35
2021/2022670 19 79 2 55 40 21 24 195 21 49 69 96
2022/2023805 133 66 4 115 134 120 1 54 113 13 32 20
2023/2024301 23 24 11 12 28 93 4 50 0 5 10 41
2024/2025987 2 4 61 199 73 124 0 66 60 189 84 125
2025/20262.079 146 33 280 316 207 163 466 27 154 201 52 34
Totale 7.274