Karwasz, Grzegorz

Karwasz, Grzegorz  

Fisica (cess.4/11/12)  

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Risultati 1 - 20 di 61 (tempo di esecuzione: 0.032 secondi).
Titolo Anno di pubblicazione Autori Unitn File
Absence of positronium formation in clean buried nanocavities in p-type silicon 1-gen-2005 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, Grzegorz +
Absolute total cross section measurements for electron scattering from silicon tetrachloride, SiCl4 , molecules 1-gen-1999 Zecca, AntonioKarwasz, GrzegorzBrusa, Roberto Sennen +
Absolute Total Cross Section Measurements for Intermediate Energy Electron Scattering: IV Kr and Xe 1-gen-1991 Zecca, AntonioKarwasz, GrzegorzBrusa, Roberto SennenGrisenti, Rolly
Absolute total cross section measurements for intermediate energy electron scattering: III. Ne and Ar 1-gen-1987 Zecca, AntonioOss, StefanoKarwasz, GrzegorzGrisenti, RollyBrusa, Roberto Sennen
Absolute Total Cross Sections for e-CH4, NH3, SiH4, H2S Scattering at Intermediate Energy 1-gen-1991 Zecca, AntonioKarwasz, GrzegorzBrusa, Roberto Sennen
Absolute Total Cross Sections for Electron Scattering on Hydride Molecules and Chlorofluorocarbons 1-gen-1992 Zecca, AntonioBrusa, Roberto SennenKarwasz, Grzegorz
Absolute Total Cross sections for electron scattering on NO2, SO2, OCS in the intermediate energy range 1-gen-1993 Zecca, AntonioKarwasz, GrzegorzBrusa, Roberto SennenGrisenti, Rolly +
Absolute total cross sections for electron-CO2 scattering at energies from 0.5 to 3000 eV 1-gen-1987 Zecca, AntonioKarwasz, GrzegorzOss, StefanoBrusa, Roberto SennenGrisenti, Rolly +
Absolute Total Cross Sections for Intermediate Energy Electron-Hydrides and Freons Scattering 1-gen-1991 Zecca, AntonioKarwasz, GrzegorzBrusa, Roberto Sennen
Additivity rule for electron-molecule cross section calculation: a geometrical approach 1-gen-1999 Zecca, AntonioBrusa, Roberto SennenKarwasz, Grzegorz +
Amorphous carbon film growth on Si: correlation between stress and generation of defects into the substrate 1-gen-2005 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, GrzegorzAnderle, Mariano +
Amorphous Carbon Thin Films Deposited on Si and PET: Study of Interface States 1-gen-2005 Mariazzi, SebastianoKarwasz, GrzegorzBrusa, Roberto SennenAnderle, Mariano +
Application of positron annihilation techniques for semiconductor studies 1-gen-2004 Karwasz, GrzegorzZecca, AntonioBrusa, Roberto Sennen +
Comment on: 'Electron scattering by Ne, Ar and Kr at intermediate and high energies , 0.5-10 keV' 1-gen-2000 Zecca, AntonioKarwasz, GrzegorzBrusa, Roberto Sennen
Comparative study of porosity in low-k SiOCH thin films obtained at different deposition conditions 1-gen-2004 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, GrzegorzZecca, Antonio +
A concept of a Scanning Positron Microscope 1-gen-1995 Zecca, AntonioBrusa, Roberto SennenKarwasz, Grzegorz +
A concept of a Scanning Positron Microscope 1-gen-1995 Zecca, AntonioBrusa, Roberto SennenKarwasz, Grzegorz +
Cross Section Measurements for e- CO scattering: 80 eV - 4000 eV 1-gen-1993 Karwasz, GrzegorzBrusa, Roberto SennenZecca, Antonio +
Decoration of buried surfaces in Si detected by positron annihilation spectroscopy 1-gen-2006 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, Grzegorz +
Defects studies in Fe3Al Alloys Doped with Cr, Mo and Si 1-gen-2001 Brusa, Roberto SennenKarwasz, GrzegorzZecca, Antonio +