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Mostrati risultati da 41 a 60 di 61
Titolo Anno di pubblicazione Autori Unitn File
Porosity in low dielectric constant SiOCH films depth profiled by positron annihilation spectroscopy 1-gen-2004 Brusa, Roberto SennenKarwasz, GrzegorzZecca, Antonio +
Positron Scattering in gases - First Results from Low-Energy Spectrometer in Trento 1-gen-2004 Zecca, AntonioPerazzolli, ChiaraKarwasz, GrzegorzBrusa, Roberto SennenBassi, Davide +
Application of positron annihilation techniques for semiconductor studies 1-gen-2004 Karwasz, GrzegorzZecca, AntonioBrusa, Roberto Sennen +
Structural evolution of nanocrystalline Pd-Mg bilayers under deuterium absorption and desorption cycles 1-gen-2004 Checchetto, RiccardoBrusa, Roberto SennenBazzanella, NicolaKarwasz, GrzegorzMiotello, Antonio +
Stress and interfacial defects induced by amorphous carbon film growth on silicon 1-gen-2005 Mariazzi, SebastianoZecca, AntonioKarwasz, GrzegorzBrusa, Roberto SennenBartali, RubenAnderle, Mariano +
Positron scattering in helium: Virtual-positronium resonances 1-gen-2005 Karwasz, GrzegorzZecca, AntonioBrusa, Roberto Sennen +
The 3d-shell electrons in NiAl-based alloys containing Cr and Co studied by positron annihilation 1-gen-2005 Brusa, Roberto SennenKarwasz, GrzegorzZecca, Antonio +
Low Energy Cross-Sections for Positron Interactions with Cyclic Hydrocarbons 1-gen-2005 Karwasz, GrzegorzBrusa, Roberto SennenPerazzolli, Chiara +
Effects of Zr and Nb on d electrons in NiAl studied by coincidence positron annihilation spectroscopy 1-gen-2005 Brusa, Roberto SennenKarwasz, GrzegorzZecca, Antonio +
Amorphous Carbon Thin Films Deposited on Si and PET: Study of Interface States 1-gen-2005 Mariazzi, SebastianoKarwasz, GrzegorzBrusa, Roberto SennenAnderle, Mariano +
Porosity of low-k materials studied by slow positron beam 1-gen-2005 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, Grzegorz +
Absence of positronium formation in clean buried nanocavities in p-type silicon 1-gen-2005 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, Grzegorz +
Amorphous carbon film growth on Si: correlation between stress and generation of defects into the substrate 1-gen-2005 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, GrzegorzAnderle, Mariano +
Total cross sections for positron scattering in argon, nitrogen and hydrogen below 20 eV 1-gen-2006 Karwasz, GrzegorzBrusa, Roberto Sennen +
Decoration of buried surfaces in Si detected by positron annihilation spectroscopy 1-gen-2006 Brusa, Roberto SennenMariazzi, SebastianoKarwasz, Grzegorz +
Electron scattering on triatomic molecules: the need for data 1-gen-2006 Karwasz, GrzegorzBrusa, Roberto Sennen +
Single-crystal silicon coimplanted by helium and hydrogen: evolution of decorated vacancylike defects with thermal treatments 1-gen-2006 Mariazzi, SebastianoKarwasz, GrzegorzBrusa, Roberto SennenFrabboni, Stefano +
Positron annihilation in B-doped and undoped single and polycrystalline Ni3Al alloys 1-gen-2006 Brusa, Roberto SennenKarwasz, GrzegorzZecca, Antonio +
Replay to A. Zecca's comment on 'Positron scattering in helium: virtual-positronium resonances' by G.P. Karwasz, D. Pliszka, A. Zecca, R.S. Brusa [Nucl. Instr. and Meth. B 240 (2005) 666] 1-gen-2006 Karwasz, GrzegorzBrusa, Roberto Sennen +
Positron annihilation and photoluminescence studies of nanostructured ZrO2 1-gen-2010 Mariazzi, SebastianoBrusa, Roberto SennenKarwasz, Grzegorz +
Mostrati risultati da 41 a 60 di 61
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