LISA Pathfinder is a technology demonstration mission for the space-based gravitational wave observatory, LISA. It demonstrated that the performance requirements for the interferometric measurement of two test masses in free fall can be met. An important part of the data analysis is to identify the limiting noise sources. [1] This measurement is performed with heterodyne interferometry. The performance of this optical metrology system (OMS) at high frequencies is limited by sensing noise. One such noise source is Relative Intensity Noise (RIN). RIN is a property of the laser, and the photodiode current generated by the interferometer signal contains frequency dependant RIN. From this electric signal the phasemeter calculates the phase change and laser power, and the coupling of RIN into the measurement signal depends on the noise frequency. RIN at DC, at the heterodyne frequency and at two times the heterodyne frequency couples into the phase. Another important noise at high frequencies is path length noise. To reduce the impact this noise is suppressed with a control loop. Path length noise not suppressed will couple directly into the length measurement. The subtraction techniques of both noise sources depend on the phase difference between the reference signal and the measurement signal, and thus on the test mass position. During normal operations we position the test mass at the interferometric zero, which is optimal for noise subtraction purposes. This paper will show results from an in-flight experiment where the test mass position was changed to make the position dependant noise visible.

Coupling of relative intensity noise and pathlength noise to the length measurement in the optical metrology system of LISA Pathfinder / Wittchen, A.; Armano, M.; Audley, H.; Auger, G.; Baird, J.; Bassan, M.; Binetruy, P.; Born, M.; Bortoluzzi, D.; Brandt, N.; Caleno, M.; Cavalleri, A.; Cesarini, A.; Cruise, M.; Danzmann, K.; de Deus Silva, M.; De Rosa, R.; Di Fiore, L.; Diepholz, I.; Dolesi, R.; Dunbar, N.; Ferraioli, L.; Ferroni, V.; Fitzsimons, E.; Flatscher, R.; Freschi, M.; Marrirodriga, C. Garcia; Gerndt, R.; Gesa, L.; Gibert, F.; Giardini, D.; Giusteri, R.; Grado, A.; Grimani, C.; Grzymisch, J.; Harrison, I.; Heinzel, G.; Hewitson, M.; Hollington, D.; Hoyland, D.; Hueller, M.; Inchauspe, H.; Jennrich, O.; Jetzer, P.; Johlander, B.; Karnesis, N.; Kaune, B.; Korsakova, N.; Killow, C.; Lobo, A.; Lloro, I.; Liu, L.; Lopez-Zaragoza, J. P.; Maarschalkerweerd, R.; Mance, D.; Martin, V.; Martin-Polo, L.; Martino, J.; Martin-Porqueras, F.; Madden, S.; Mateos, I.; Mcnamara, P. W.; Mendes, J.; Mendel, L.; Nofrarias, M.; Paczkowski, S.; Perreur-Lloyd, M.; Petiteau, A.; Pivato, P.; Plagnol, E.; Prat, P.; Ragnit, U.; Ramos-Castro, J.; Reiche, J.; Robertson, D. I.; Rozemeijer, H.; Rivas, F.; Russano, G.; Sarra, P.; Schleicher, A.; Shaul, D.; Slutsky, J.; Sopuerta, C. F.; Stanga, R.; Sumner, T.; Texier, D.; Thorpe, J. I.; Trenke, C.; Troebs, M.; Vetrugno, D.; Vitale, S.; Wanner, G.; Ward, H.; Wass, P.; Wealthy, D.; Weber, W. J.; Wissel, L.; Wittchen, A.; Zambotti, A.; Zanoni, C.; Ziegler, T.; Zweifel, P.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 840:1(2017), p. 012003. [10.1088/1742-6596/840/1/012003]

Coupling of relative intensity noise and pathlength noise to the length measurement in the optical metrology system of LISA Pathfinder

Born, M.;Bortoluzzi, D.;Cesarini, A.;Dolesi, R.;Ferraioli, L.;Ferroni, V.;Gibert, F.;Giusteri, R.;Hueller, M.;Martin, V.;Pivato, P.;Reiche, J.;Rivas, F.;Russano, G.;Vetrugno, D.;Vitale, S.;Wass, P.;Weber, W. J.;
2017

Abstract

LISA Pathfinder is a technology demonstration mission for the space-based gravitational wave observatory, LISA. It demonstrated that the performance requirements for the interferometric measurement of two test masses in free fall can be met. An important part of the data analysis is to identify the limiting noise sources. [1] This measurement is performed with heterodyne interferometry. The performance of this optical metrology system (OMS) at high frequencies is limited by sensing noise. One such noise source is Relative Intensity Noise (RIN). RIN is a property of the laser, and the photodiode current generated by the interferometer signal contains frequency dependant RIN. From this electric signal the phasemeter calculates the phase change and laser power, and the coupling of RIN into the measurement signal depends on the noise frequency. RIN at DC, at the heterodyne frequency and at two times the heterodyne frequency couples into the phase. Another important noise at high frequencies is path length noise. To reduce the impact this noise is suppressed with a control loop. Path length noise not suppressed will couple directly into the length measurement. The subtraction techniques of both noise sources depend on the phase difference between the reference signal and the measurement signal, and thus on the test mass position. During normal operations we position the test mass at the interferometric zero, which is optimal for noise subtraction purposes. This paper will show results from an in-flight experiment where the test mass position was changed to make the position dependant noise visible.
1
Wittchen, A.; Armano, M.; Audley, H.; Auger, G.; Baird, J.; Bassan, M.; Binetruy, P.; Born, M.; Bortoluzzi, D.; Brandt, N.; Caleno, M.; Cavalleri, A.; Cesarini, A.; Cruise, M.; Danzmann, K.; de Deus Silva, M.; De Rosa, R.; Di Fiore, L.; Diepholz, I.; Dolesi, R.; Dunbar, N.; Ferraioli, L.; Ferroni, V.; Fitzsimons, E.; Flatscher, R.; Freschi, M.; Marrirodriga, C. Garcia; Gerndt, R.; Gesa, L.; Gibert, F.; Giardini, D.; Giusteri, R.; Grado, A.; Grimani, C.; Grzymisch, J.; Harrison, I.; Heinzel, G.; Hewitson, M.; Hollington, D.; Hoyland, D.; Hueller, M.; Inchauspe, H.; Jennrich, O.; Jetzer, P.; Johlander, B.; Karnesis, N.; Kaune, B.; Korsakova, N.; Killow, C.; Lobo, A.; Lloro, I.; Liu, L.; Lopez-Zaragoza, J. P.; Maarschalkerweerd, R.; Mance, D.; Martin, V.; Martin-Polo, L.; Martino, J.; Martin-Porqueras, F.; Madden, S.; Mateos, I.; Mcnamara, P. W.; Mendes, J.; Mendel, L.; Nofrarias, M.; Paczkowski, S.; Perreur-Lloyd, M.; Petiteau, A.; Pivato, P.; Plagnol, E.; Prat, P.; Ragnit, U.; Ramos-Castro, J.; Reiche, J.; Robertson, D. I.; Rozemeijer, H.; Rivas, F.; Russano, G.; Sarra, P.; Schleicher, A.; Shaul, D.; Slutsky, J.; Sopuerta, C. F.; Stanga, R.; Sumner, T.; Texier, D.; Thorpe, J. I.; Trenke, C.; Troebs, M.; Vetrugno, D.; Vitale, S.; Wanner, G.; Ward, H.; Wass, P.; Wealthy, D.; Weber, W. J.; Wissel, L.; Wittchen, A.; Zambotti, A.; Zanoni, C.; Ziegler, T.; Zweifel, P.
Coupling of relative intensity noise and pathlength noise to the length measurement in the optical metrology system of LISA Pathfinder / Wittchen, A.; Armano, M.; Audley, H.; Auger, G.; Baird, J.; Bassan, M.; Binetruy, P.; Born, M.; Bortoluzzi, D.; Brandt, N.; Caleno, M.; Cavalleri, A.; Cesarini, A.; Cruise, M.; Danzmann, K.; de Deus Silva, M.; De Rosa, R.; Di Fiore, L.; Diepholz, I.; Dolesi, R.; Dunbar, N.; Ferraioli, L.; Ferroni, V.; Fitzsimons, E.; Flatscher, R.; Freschi, M.; Marrirodriga, C. Garcia; Gerndt, R.; Gesa, L.; Gibert, F.; Giardini, D.; Giusteri, R.; Grado, A.; Grimani, C.; Grzymisch, J.; Harrison, I.; Heinzel, G.; Hewitson, M.; Hollington, D.; Hoyland, D.; Hueller, M.; Inchauspe, H.; Jennrich, O.; Jetzer, P.; Johlander, B.; Karnesis, N.; Kaune, B.; Korsakova, N.; Killow, C.; Lobo, A.; Lloro, I.; Liu, L.; Lopez-Zaragoza, J. P.; Maarschalkerweerd, R.; Mance, D.; Martin, V.; Martin-Polo, L.; Martino, J.; Martin-Porqueras, F.; Madden, S.; Mateos, I.; Mcnamara, P. W.; Mendes, J.; Mendel, L.; Nofrarias, M.; Paczkowski, S.; Perreur-Lloyd, M.; Petiteau, A.; Pivato, P.; Plagnol, E.; Prat, P.; Ragnit, U.; Ramos-Castro, J.; Reiche, J.; Robertson, D. I.; Rozemeijer, H.; Rivas, F.; Russano, G.; Sarra, P.; Schleicher, A.; Shaul, D.; Slutsky, J.; Sopuerta, C. F.; Stanga, R.; Sumner, T.; Texier, D.; Thorpe, J. I.; Trenke, C.; Troebs, M.; Vetrugno, D.; Vitale, S.; Wanner, G.; Ward, H.; Wass, P.; Wealthy, D.; Weber, W. J.; Wissel, L.; Wittchen, A.; Zambotti, A.; Zanoni, C.; Ziegler, T.; Zweifel, P.. - In: JOURNAL OF PHYSICS. CONFERENCE SERIES. - ISSN 1742-6588. - 840:1(2017), p. 012003. [10.1088/1742-6596/840/1/012003]
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