The evaluation of uncertainty in temperature-dependent EXAFS measurements is discussed, considering the specific case of a recent experiment performed on CdTe. EXAFS at both Cd and Te K-edges was measured at different times and at different beamlines in a temperature range from 5 to 300 K. Attention is focused on the nearest-neighbours parameters: bond thermal expansion, parallel and perpendicular mean-square relative displacements and the third cumulant. Different causes of uncertainty, a comparison of experimental results with theoretical models, the difference between EXAFS and crystallographic thermal expansions and the meaning of the third cumulant are discussed.
Titolo: | Accuracy evaluation in temperature-dependent EXAFS measurements of CdTe |
Autori: | Abd El All, Naglaa Fathy Mohamed; B., Thiodjio Sendja; Grisenti, Rolly; Rocca, Francesco; D., Diop; O., Mathon; S., Pascarelli; Fornasini, Paolo |
Autori Unitn: | |
Titolo del periodico: | JOURNAL OF SYNCHROTRON RADIATION |
Anno di pubblicazione: | 2013 |
Codice identificativo Scopus: | 2-s2.0-84879158471 |
Codice identificativo ISI: | WOS:000320363700012 |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1107/S0909049513012053 |
Handle: | http://hdl.handle.net/11572/97191 |
Appare nelle tipologie: | 03.1 Articolo su rivista (Journal article) |