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NOTA: è possibile cercare una corrispondenza esatta usando i doppi apici, ad es: "evoluzione della specie". Qualora si cerchi un identificativo, è consigliabile cercarlo in due modi differenti: tra apici con caratteri speciali es: "978-94-6366-274" oppure senza caratteri speciali solo come sequenza numerica: es 978946366274.
Thermoelectric Properties and Thermal Transport in Two-Dimensional GaInSe3 and GaInTe3 Monolayers: A First-Principles Study
2024-01-01 Nautiyal, Himanshu; Scardi, Paolo
Thermoelectric Properties of CZTS Thin Films: Effect of Cu-Zn Disorder
2021-01-01 Isotta, E; Syafiq, U; Ataollahi, N; Chiappini, A; Malerba, C; Luong, S; Trifiletti, V; Fenwick, O; Pugno, N M; Scardi, P
Thermogravimetric analysis of superalloys used for blade and vane applications in industrial gas turbine. Kinetics and mechanism of thermal degradation
1994-01-01 Scardi, Paolo; A., Tomasi; P., Orsini; F., Bregani
Thermophysical, mechanical and microstructural characterisation of aged free standing plasma sprayed zirconia coatings
2008-01-01 F., Cernuschi; P. G., Bison; S., Marinetti; Scardi, Paolo
Tin oxide thin-film sensors for aromatic hydrocarbons detection: effect of aging time on film microstructure
1999-01-01 S., Nicoletti; L., Dori; F., Corticelli; Leoni, Matteo; Scardi, Paolo
Topological Anderson Insulator in Cation-Disordered Cu2ZnSnS4
2021-01-01 Mukherjee, Binayak; Isotta, Eleonora; Fanciulli, Carlo; Ataollahi, Narges; Scardi, Paolo
Toward a reference material for line profile analysis
2015-01-01 Troian, Andrea; Rebuffi, Luca; Leoni, Matteo; Scardi, Paolo
Towards Low Cost and Sustainable Thin Film Thermoelectric Devices Based on Quaternary Chalcogenides
2022-01-01 Isotta, Eleonora; Andrade‐arvizu, Jacob; Syafiq, Ubaidah; Jiménez‐arguijo, Alex; Navarro‐güell, Alejandro; Guc, Maxim; Saucedo, Edgardo; Scardi, Paolo
Ultra-Low Thermal Conductivity and Improved Thermoelectric Performance in Disordered Nanostructured Copper Tin Sulphide (Cu2SnS3, CTS)
2020-01-01 Lohani, K.; Isotta, E.; Ataollahi, N.; Fanciulli, C.; Chiappini, A.; Scardi, P.
Understanding the instrumental profile of synchrotron radiation X-ray powder diffraction beamlines
2017-01-01 Rebuffi, Luca; Del RÃo, Manuel Sánchez; Busetto, Edoardo; Scardi, Paolo
Legenda icone
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Opzioni
Scopri
Tipologia
- 03 Contributo in periodico (Part ... 347
- 03 Contributo in periodico (Part ... 347
Data di pubblicazione
- 2020 - 2026 72
- 2010 - 2019 111
- 2000 - 2009 75
- 1990 - 1999 83
- 1985 - 1989 6
Rivista
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 22
- POWDER DIFFRACTION 16
- THIN SOLID FILMS 16
- ZEITSCHRIFT FUR KRISTALLOGRAPHIE 15
- SURFACE & COATINGS TECHNOLOGY 12
- METALLURGICAL AND MATERIALS TRANS... 7
- NANOMATERIALS 7
- ACTA CRYSTALLOGRAPHICA. SECTION A... 6
- JOURNAL OF APPLIED CRYSTALLOGRAPHY 6
- JOURNAL OF MATERIALS RESEARCH 6
Settore disciplinare
- Settore ING-IND/22 - Scienza e Te... 3
Keyword
- X-ray diffraction 37
- Condensed Matter Physics 15
- Materials Science (all) 13
- line profile analysis 11
- Whole Powder Pattern Modelling 10
- powder diffraction 9
- Cuprite 7
- High Energy Ball Milling 7
- thin films 7
- Biochemistry 6
Lingua
- eng 331
- ita 7
- spa 1
Accesso al fulltext
- no fulltext 206
- reserved 68
- open 65
- partially open 8