Demenev, Evgeny
 Distribuzione geografica
Continente #
NA - Nord America 504
EU - Europa 56
AS - Asia 51
SA - Sud America 2
Totale 613
Nazione #
US - Stati Uniti d'America 504
CN - Cina 30
IT - Italia 21
JO - Giordania 14
BG - Bulgaria 13
FI - Finlandia 6
SE - Svezia 6
DE - Germania 5
SG - Singapore 4
IN - India 3
RU - Federazione Russa 3
AR - Argentina 1
BR - Brasile 1
GB - Regno Unito 1
NL - Olanda 1
Totale 613
Città #
Chandler 100
Fairfield 45
Ashburn 43
Beijing 28
San Mateo 28
Houston 26
Princeton 26
Seattle 24
Wilmington 22
Woodbridge 22
Ann Arbor 21
Jacksonville 21
Cambridge 18
Fremont 15
Sofia 12
New York 10
Helsinki 6
Trento 6
Cagliari 4
Los Angeles 2
Milan 2
Norwalk 2
Phoenix 2
San Diego 2
Shanghai 2
Washington 2
Auronzo Di Cadore 1
Boardman 1
Bonndorf 1
Chemnitz 1
Desenzano Del Garda 1
Falkenstein 1
Falls Church 1
Guaratingueta 1
Haskovo 1
Keltern 1
Kemerovo 1
Magnago 1
Piubega 1
Prescot 1
San Miguel de Tucumán 1
Vallefoglia 1
Totale 507
Nome #
32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications 68
null 55
null 54
null 53
null 51
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 41
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 38
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 35
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 34
Sky-boot stress map 34
null 33
null 25
GIXRF characterization of thin Ge1-xSnx films 25
null 17
Evolution of Arsenic nanometric distributions in Silicon under advanced ion implantation and annealing processes 15
Sn ion implantation in Ge: nanovoid formation kinetics 14
Nanofabrication of self-organized periodic ripples by ion beam sputtering 13
32-Channel silicon strip detection module for combined X-ray fluorescence spectroscopy and X-ray diffractometry analysis 13
Ge nanostructuring by Sn ion implantation 12
Ge nanostructuring by Sn ion implantation 12
Sn ion implantation on Ge: nanovoid formation kinetics 6
Development of nanotopography during SIMS characterization of thin films of Ge1-xSnxalloy 5
Totale 653
Categoria #
all - tutte 3.101
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.101


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2018/201936 0 0 0 0 0 0 0 0 0 0 19 17
2019/2020118 8 4 1 11 11 4 9 9 17 28 9 7
2020/202162 6 7 2 4 2 22 2 5 1 5 1 5
2021/2022100 2 8 0 2 2 4 0 45 5 5 10 17
2022/2023194 29 12 4 30 24 25 0 22 26 1 13 8
2023/202488 5 6 5 4 19 24 4 17 0 4 0 0
Totale 653