Demenev, Evgeny
 Distribuzione geografica
Continente #
NA - Nord America 505
AS - Asia 76
EU - Europa 63
SA - Sud America 2
Totale 646
Nazione #
US - Stati Uniti d'America 505
CN - Cina 30
SG - Singapore 29
IT - Italia 26
JO - Giordania 14
BG - Bulgaria 13
SE - Svezia 7
FI - Finlandia 6
DE - Germania 5
IN - India 3
RU - Federazione Russa 3
AR - Argentina 1
BR - Brasile 1
CZ - Repubblica Ceca 1
GB - Regno Unito 1
NL - Olanda 1
Totale 646
Città #
Chandler 100
Fairfield 45
Ashburn 43
Beijing 28
San Mateo 28
Houston 26
Princeton 26
Seattle 24
Wilmington 22
Woodbridge 22
Ann Arbor 21
Jacksonville 21
Singapore 20
Cambridge 18
Fremont 15
Sofia 12
New York 10
Helsinki 6
Milan 6
Trento 6
Cagliari 4
Los Angeles 2
Norwalk 2
Phoenix 2
San Diego 2
Shanghai 2
Washington 2
Auronzo Di Cadore 1
Boardman 1
Bonndorf 1
Brno 1
Chemnitz 1
Desenzano Del Garda 1
Falkenstein 1
Falls Church 1
Guaratingueta 1
Haskovo 1
Keltern 1
Kemerovo 1
Magnago 1
Palermo 1
Piubega 1
Prescot 1
San Miguel de Tucumán 1
Stockholm 1
Vallefoglia 1
Totale 534
Nome #
32-Channel Detection Unit for Combined XRF-XRD in Mining Transportable Applications 69
null 55
null 54
null 53
null 51
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 43
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 40
Development of nano-topography during SIMS characterization of Ge1-xSnx alloy 37
Columnar nano-void formation on Germanium under Sn+ ion implantation: Ge1-xSnx walls 36
Sky-boot stress map 36
null 33
GIXRF characterization of thin Ge1-xSnx films 27
null 25
Evolution of Arsenic nanometric distributions in Silicon under advanced ion implantation and annealing processes 17
null 17
Sn ion implantation in Ge: nanovoid formation kinetics 16
Nanofabrication of self-organized periodic ripples by ion beam sputtering 15
Sn ion implantation on Ge: nanovoid formation kinetics 14
Ge nanostructuring by Sn ion implantation 14
32-Channel silicon strip detection module for combined X-ray fluorescence spectroscopy and X-ray diffractometry analysis 14
Ge nanostructuring by Sn ion implantation 13
Development of nanotopography during SIMS characterization of thin films of Ge1-xSnxalloy 7
Totale 686
Categoria #
all - tutte 3.496
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 3.496


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2019/2020118 8 4 1 11 11 4 9 9 17 28 9 7
2020/202162 6 7 2 4 2 22 2 5 1 5 1 5
2021/2022100 2 8 0 2 2 4 0 45 5 5 10 17
2022/2023194 29 12 4 30 24 25 0 22 26 1 13 8
2023/2024116 5 6 5 4 19 24 4 17 0 4 3 25
2024/20255 5 0 0 0 0 0 0 0 0 0 0 0
Totale 686