In this work, a finite energy-based formulation of the J-integral is proposed and applied to atomic-scale defects to investigate the breakdown of continuum fracture mechanics. The J-integral is evaluated through molecular statistics simulations as the potential energy difference between two identically deformed configurations with neighbouring crack lengths, where the finite crack advance corresponds to a single atomic bond break. Singleedge cracked single-crystal silicon specimens are analyzed by progressively reducing the specimen width from the macroscale to approximately 10 nm. The results show that the critical atomistic J-integral remains essentially constant (2.5 J/m2 ) across all considered sizes, demonstrating scale independence and confirming that localized bond-breaking events govern brittle fracture. The spatial extent of the fracture process zone is quantified through atomic displacement fields and is found to be approximately constant (≈0.5 nm), independent of specimen size. In contrast, the conventional continuum J-integral progressively deviates from the atomistic value when the specimen width approaches the characteristic size of the fracture process zone, indicating the breakdown of the infinitesimal crack-extension assumption. The proposed formulation provides a simple and computationally efficient framework for extending fracture mechanics concepts to the atomic scale and clarifies the physical origin of the breakdown of continuum-based fracture mechanics.

Finite J-Integral Formulation at the Atomic Scale and Breakdown of Continuum Fracture Mechanics / Gallo, Pasquale; Kitamura, Takayuki. - In: THEORETICAL AND APPLIED FRACTURE MECHANICS. - ISSN 0167-8442. - ELETTRONICO. - 2026, 145:(2026), pp. 1-7. [10.1016/j.tafmec.2026.105627]

Finite J-Integral Formulation at the Atomic Scale and Breakdown of Continuum Fracture Mechanics

Gallo, Pasquale
Primo
;
2026-01-01

Abstract

In this work, a finite energy-based formulation of the J-integral is proposed and applied to atomic-scale defects to investigate the breakdown of continuum fracture mechanics. The J-integral is evaluated through molecular statistics simulations as the potential energy difference between two identically deformed configurations with neighbouring crack lengths, where the finite crack advance corresponds to a single atomic bond break. Singleedge cracked single-crystal silicon specimens are analyzed by progressively reducing the specimen width from the macroscale to approximately 10 nm. The results show that the critical atomistic J-integral remains essentially constant (2.5 J/m2 ) across all considered sizes, demonstrating scale independence and confirming that localized bond-breaking events govern brittle fracture. The spatial extent of the fracture process zone is quantified through atomic displacement fields and is found to be approximately constant (≈0.5 nm), independent of specimen size. In contrast, the conventional continuum J-integral progressively deviates from the atomistic value when the specimen width approaches the characteristic size of the fracture process zone, indicating the breakdown of the infinitesimal crack-extension assumption. The proposed formulation provides a simple and computationally efficient framework for extending fracture mechanics concepts to the atomic scale and clarifies the physical origin of the breakdown of continuum-based fracture mechanics.
2026
Settore ING-IND/14 - Progettazione Meccanica e Costruzione di Macchine
Settore ING-IND/22 - Scienza e Tecnologia dei Materiali
Settore IIND-03/A - Progettazione meccanica e costruzione di macchine
Settore IMAT-01/A - Scienza e tecnologia dei materiali
Gallo, Pasquale; Kitamura, Takayuki
Finite J-Integral Formulation at the Atomic Scale and Breakdown of Continuum Fracture Mechanics / Gallo, Pasquale; Kitamura, Takayuki. - In: THEORETICAL AND APPLIED FRACTURE MECHANICS. - ISSN 0167-8442. - ELETTRONICO. - 2026, 145:(2026), pp. 1-7. [10.1016/j.tafmec.2026.105627]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/483830
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