NDT/NDE by Means of a Probabilistic Differential Compressive Sensing Method

A novel microwave imaging (MI) method is proposed to deal with the nondestructive testing and evaluation (NDT/NDE) of dielectric structures. The proposed technique exploits a probabilistic differential contrast source inversion (D-CSI) formulation of the inverse scattering (IS) problem, which is then effectively solved by means of a customized multi-Task Bayesian compressive sensing (MT-BCS) solver. Numerical results are shown to assess the effectiveness and robustness of the proposed NDT/NDE method, as well as to compare it. with a single-Task (ST-BCS) implementation within the same framework.