Ortolani, Matteo
 Distribuzione geografica
Continente #
NA - Nord America 692
AS - Asia 144
EU - Europa 140
SA - Sud America 22
AF - Africa 3
Totale 1.001
Nazione #
US - Stati Uniti d'America 687
SG - Singapore 76
CN - Cina 43
RU - Federazione Russa 36
SE - Svezia 24
UA - Ucraina 19
BR - Brasile 16
FI - Finlandia 16
IT - Italia 13
GB - Regno Unito 9
LV - Lettonia 9
DE - Germania 8
TR - Turchia 6
VN - Vietnam 6
BG - Bulgaria 5
CA - Canada 4
HK - Hong Kong 4
IN - India 3
AR - Argentina 2
EC - Ecuador 2
ID - Indonesia 2
ZA - Sudafrica 2
BD - Bangladesh 1
CO - Colombia 1
EG - Egitto 1
ES - Italia 1
JO - Giordania 1
MX - Messico 1
PK - Pakistan 1
SA - Arabia Saudita 1
VE - Venezuela 1
Totale 1.001
Città #
Fairfield 89
Chandler 59
Singapore 54
Ashburn 47
Seattle 43
Jacksonville 42
Wilmington 42
Woodbridge 38
San Mateo 31
Houston 29
Cambridge 27
Ann Arbor 23
Santa Clara 22
Dallas 18
Columbus 17
Beijing 15
Moscow 15
Dearborn 11
Princeton 11
Helsinki 9
Riga 9
Chicago 6
Izmir 6
Los Angeles 6
Buffalo 5
Council Bluffs 5
Lawrence 5
Sofia 5
Cagliari 4
Hong Kong 4
New York 4
Salt Lake City 4
San Diego 4
Falkenstein 3
Ho Chi Minh City 3
Stockholm 3
Boardman 2
Costa Mesa 2
Guangzhou 2
Hanoi 2
Johannesburg 2
Manchester 2
Phoenix 2
Rosario 2
San Paolo di Civitate 2
São Paulo 2
Toronto 2
Trento 2
Amman 1
Andover 1
Antioch 1
Anápolis 1
Atlanta 1
Biên Hòa 1
Bologna 1
Cavalcante 1
Changsha 1
Chiswick 1
Ciudad Juárez 1
Clearwater 1
Clifton 1
Clinton 1
Coro 1
Criciúma 1
Cuenca 1
Curitiba 1
Dammam 1
Des Moines 1
Faisalabad 1
Falls Church 1
Frankfurt am Main 1
Fuzhou 1
Goianinha 1
Gonzales 1
Guayaquil 1
Helena 1
Huzhou 1
Indianapolis 1
Ipatinga 1
Jacareí 1
Jakarta 1
Kansas City 1
Lençóis Paulista 1
Linfen 1
London 1
Manado 1
Medellín 1
Miami Beach 1
Newark 1
North Bergen 1
Orlando 1
Osasco 1
Ottawa 1
Philadelphia 1
Poplar 1
Putian 1
Raleigh 1
Redmond 1
Ribeirão Claro 1
Rio Branco 1
Totale 794
Nome #
Analysis of Residual Stress-Texture Relationships in Thin Films 174
Thin Film Stress and Texture Analysis at the MCX Synchrotron Radiation Beamline at ELETTRA 142
Nondestructive measurement of the residual stress profile in ceramic laminates 122
Residual stress profile in ceramic laminates 119
Stress gradients and grain interaction determination in electrodeposited coatings by synchrotron radiation 119
Elastic grain interaction in electrodeposited nanocomposite Nickel matrix coatings 111
Microstructural Evolution of Thor(TM) 115 Creep-Strength Enhanced Ferritic Steel 96
Measurement of stress factors and residual stress of a film by in situ X-ray diffraction during four-point bending 94
Elastic Properties of Textured Nanocrystalline Thin Films 44
Totale 1.021
Categoria #
all - tutte 4.725
article - articoli 0
book - libri 0
conference - conferenze 0
curatela - curatele 0
other - altro 0
patent - brevetti 0
selected - selezionate 0
volume - volumi 0
Totale 4.725


Totale Lug Ago Sett Ott Nov Dic Gen Feb Mar Apr Mag Giu
2020/202149 0 0 0 0 0 7 2 8 9 11 6 6
2021/2022118 2 29 0 5 6 0 7 30 4 11 8 16
2022/2023119 20 19 0 16 6 21 0 5 20 4 8 0
2023/202434 6 0 4 2 0 5 1 7 0 0 3 6
2024/2025157 3 1 7 30 14 25 0 14 10 33 8 12
2025/2026176 18 9 54 55 33 7 0 0 0 0 0 0
Totale 1.021