A new software was developed for the X-ray stress analysis of textured materials, especially useful in the case of thin films and coating. Literature data for a sputtered Cu thin film were used as a test case. Good agreement with the published results was found considering a grain interaction mechanism based on the combination of four models (Ruess/Voigt/Vook-Witt/inverse Vook-Witt). A similar value for the in-plane residual stress was obtained by the Eshelby-Kröner model, by optimizing the grain aspect-ratio. Main features and numerical/graphic output are briefly discussed.

Analysis of Residual Stress-Texture Relationships in Thin Films / Ortolani, Matteo; Azanza Ricardo, Cristy Leonor; Scardi, Paolo. - STAMPA. - 89-91:(2010), pp. 425-430. ((Intervento presentato al convegno THERMEC 2009 tenutosi a Berlin nel August 25-29, 2009 [10.4028/www.scientific.net/AMR.89-91.425].

Analysis of Residual Stress-Texture Relationships in Thin Films

Ortolani, Matteo;Azanza Ricardo, Cristy Leonor;Scardi, Paolo
2010-01-01

Abstract

A new software was developed for the X-ray stress analysis of textured materials, especially useful in the case of thin films and coating. Literature data for a sputtered Cu thin film were used as a test case. Good agreement with the published results was found considering a grain interaction mechanism based on the combination of four models (Ruess/Voigt/Vook-Witt/inverse Vook-Witt). A similar value for the in-plane residual stress was obtained by the Eshelby-Kröner model, by optimizing the grain aspect-ratio. Main features and numerical/graphic output are briefly discussed.
THERMEC 2009 Supplement
[Stäfa]
Trans Tech Publications Ltd
9780878492947
Ortolani, Matteo; Azanza Ricardo, Cristy Leonor; Scardi, Paolo
Analysis of Residual Stress-Texture Relationships in Thin Films / Ortolani, Matteo; Azanza Ricardo, Cristy Leonor; Scardi, Paolo. - STAMPA. - 89-91:(2010), pp. 425-430. ((Intervento presentato al convegno THERMEC 2009 tenutosi a Berlin nel August 25-29, 2009 [10.4028/www.scientific.net/AMR.89-91.425].
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/92905
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