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EnglishA method is proposed for the simultaneous measurement of the stress factors and residual stress state of a film by in-situ X-ray diffraction during four-point bending. The externally applied load acts as an additional degree of freedom in the stress-strain relation, which allows the problem to be solved for both residual stress and elastic moduli without assuming any grain interaction model. The procedure was tested on a galvanic nickel deposit and the predictions of existing grain interaction models were compared with the experimental results.
| Titolo: | Measurement of stress factors and residual stress of a film by in situ X-ray diffraction during four-point bending |
| Autori Unitn: | |
| Anno di pubblicazione: | 2009 |
| Titolo del periodico: | |
| Citazione: | Measurement of stress factors and residual stress of a film by in situ X-ray diffraction during four-point bending / M. Ortolani; C. L. Azanza-Ricardo; P. Scardi. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - STAMPA. - 42(2009), pp. 1102-1109. |
| Abstract: | A method is proposed for the simultaneous measurement of the stress factors and residual stress state of a film by in-situ X-ray diffraction during four-point bending. The externally applied load acts as an additional degree of freedom in the stress-strain relation, which allows the problem to be solved for both residual stress and elastic moduli without assuming any grain interaction model. The procedure was tested on a galvanic nickel deposit and the predictions of existing grain interaction models were compared with the experimental results. |
| Handle: | http://hdl.handle.net/11572/6631 |
| Appare nelle tipologie: | 03.1 Articolo su rivista (Journal article) |
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