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EnglishA method is proposed for the simultaneous measurement of the stress factors and residual stress state of a film by in-situ X-ray diffraction during four-point bending. The externally applied load acts as an additional degree of freedom in the stress-strain relation, which allows the problem to be solved for both residual stress and elastic moduli without assuming any grain interaction model. The procedure was tested on a galvanic nickel deposit and the predictions of existing grain interaction models were compared with the experimental results.
| Titolo: | Measurement of stress factors and residual stress of a film by in situ X-ray diffraction during four-point bending | |
| Autori: | Ortolani, Matteo; Azanza Ricardo, Cristy Leonor; Scardi, Paolo | |
| Autori Unitn: | ||
| Titolo del periodico: | JOURNAL OF APPLIED CRYSTALLOGRAPHY | |
| Anno di pubblicazione: | 2009 | |
| Codice identificativo Scopus: | 2-s2.0-70449786624 | |
| Codice identificativo ISI: | WOS:000271895700017 | |
| Digital Object Identifier (DOI): | http://dx.doi.org/10.1107/S0021889809035857 | |
| Handle: | http://hdl.handle.net/11572/6631 | |
| Appare nelle tipologie: | 03.1 Articolo su rivista (Journal article) |
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