Advantages of Whole Powder Pattern Modelling against conventional Line Profile Analysis methods are briefly reviewed, and a specific example is discussed on the possible ambiguity in the interpretation of the Williamson-Hall plot for polydisperse systems. Advancements in WPPM concerning dislocation line broadening are illustrated with examples taken from the recent literature. Reliability and limits in the application of WPPM to nanocrystalline systems are also discussed. Read More: http://www.oldenbourg-link.com/doi/abs/10.1524/zksu.2008.0014
Recent advancements in Whole Powder Pattern Modelling
Scardi, Paolo
2008-01-01
Abstract
Advantages of Whole Powder Pattern Modelling against conventional Line Profile Analysis methods are briefly reviewed, and a specific example is discussed on the possible ambiguity in the interpretation of the Williamson-Hall plot for polydisperse systems. Advancements in WPPM concerning dislocation line broadening are illustrated with examples taken from the recent literature. Reliability and limits in the application of WPPM to nanocrystalline systems are also discussed. Read More: http://www.oldenbourg-link.com/doi/abs/10.1524/zksu.2008.0014File in questo prodotto:
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