Recent advances in Line Profile Analysis of powder diffraction patterns must be paralleled by increasing attention to the quality and quantity of experimental data. The analysis of simulated data with different noise levels demonstrates the importance of statistical quality to reveal fine details of interest in the analysis of nanocrystalline materials, like the crystallite shape. It is also shown how synchrotron radiation diffraction can improve data quality with respect to laboratory measurements, both in terms of statistical quality and in terms of accessible information.
On the Modelling of Diffraction Line Profiles from Nanocrystalline Materials
Scardi, Paolo;Leoni, Matteo;Dodoo-arhin, David
2010-01-01
Abstract
Recent advances in Line Profile Analysis of powder diffraction patterns must be paralleled by increasing attention to the quality and quantity of experimental data. The analysis of simulated data with different noise levels demonstrates the importance of statistical quality to reveal fine details of interest in the analysis of nanocrystalline materials, like the crystallite shape. It is also shown how synchrotron radiation diffraction can improve data quality with respect to laboratory measurements, both in terms of statistical quality and in terms of accessible information.File in questo prodotto:
Non ci sono file associati a questo prodotto.
I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
