Ion implantation in glasses produces structure modifications at depths greater than those of the implanted ion range. Such a result is evidenced by means of leaching experiments, alkali element depletion, distribution of gaseous implanted species, etching rate as function of depth. A systematic study with the aim to evidence a threshold in the nuclear deposited energy for defect diffusion is presented. Fourier transform infrared spectroscopy measurements confirm the glass modifications at extended depths.