Various studies on ion-beam mixing suggest that the extent of mixing is sensitive to the sign and magnitude of the heat of mixing, DELTAH(m). This implies a role, not only for random motion, but also for chemical driving forces of the type where the total diffusion flux is modified by the factor [1 - alpha(i)(1 - alpha(i)) 2h(m)p/RT(1 + p)]. Here alpha1 is the atomic fraction of component i, alpha(i)(1 - alpha(i))h(m) is the heat of mixing of a regular solution, and p is the ratio of the diffusivities for chemically guided defect motion to those for random motion of all types. The parameter p has never been evaluated for any system and we wish to evaluate it first by analyzing the profiling experiments of Marton, Fine, and Chambers on multilayers of Ni-Ag. We then obtain further values of p from ion-beam mixing experiments on bilayers and multilayers. It is shown that it is possible to understand a variety of experimental results relating to profiling and to ion-beam mixing in terms of chemical driving forces and, moreover, to do so without invoking thermal spikes.
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Titolo: | Thermodynamic effects in-depth profiling and ion-beam mixing without invoking thermal spikes | |
Autori: | R., Kelly; Miotello, Antonio | |
Autori Unitn: | ||
Titolo del periodico: | APPLIED PHYSICS LETTERS | |
Anno di pubblicazione: | 1994 | |
Numero e parte del fascicolo: | n. 20 | |
Codice identificativo Scopus: | 2-s2.0-0010778504 | |
Codice identificativo WOS: | WOS:A1994NL61800011 | |
Digital Object Identifier (DOI): | http://dx.doi.org/10.1063/1.111480 | |
Handle: | http://hdl.handle.net/11572/91725 | |
Appare nelle tipologie: | 03.1 Articolo su rivista (Journal article) |