Current-voltage and noise characteristics of porous silicon (PS)/single crystalline silicon (SCS) samples were measured under exposure to dry air, air +0.4% CO, dry air +1.7% CO, and dry air+ethyl alcohol vapor. The samples have a sandwich structure comprising Al/PS/SCS/Al. For the dry air +CO mixtures, the noise level was sensitive not only to the presence of CO but also to its percentage, and an increase of the CO concentration led to a change in the spectral density function of the low-frequency noise. © 2007 Elsevier B.V. All rights reserved.
Current-voltage and low-frequency noise characteristics of structures with porous silicon layers exposed to different gases
Pavesi, Lorenzo;
2007-01-01
Abstract
Current-voltage and noise characteristics of porous silicon (PS)/single crystalline silicon (SCS) samples were measured under exposure to dry air, air +0.4% CO, dry air +1.7% CO, and dry air+ethyl alcohol vapor. The samples have a sandwich structure comprising Al/PS/SCS/Al. For the dry air +CO mixtures, the noise level was sensitive not only to the presence of CO but also to its percentage, and an increase of the CO concentration led to a change in the spectral density function of the low-frequency noise. © 2007 Elsevier B.V. All rights reserved.File in questo prodotto:
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