This paper analyzes the performance of an indirect time-of-flight (ITOF) complementary metal-oxide semiconductor (CMOS) range image sensor. A number of experiments were performed to measure the actual performance of the system under test and to highlight its strength and weak points, with a focus on which limits are related to the design and which are intrinsic in the operating principle. The evaluated system allows fast and accurate measurements, but pixel-level calibration is needed to achieve high accuracy over the whole image. Simple temporal or spatial filtering allows a significant reduction in the measurement uncertainty. © 2009 IEEE.

Accuracy Performance of a Time-of-Flight CMOS Range Image Sensor System

Petri, Dario;
2009-01-01

Abstract

This paper analyzes the performance of an indirect time-of-flight (ITOF) complementary metal-oxide semiconductor (CMOS) range image sensor. A number of experiments were performed to measure the actual performance of the system under test and to highlight its strength and weak points, with a focus on which limits are related to the design and which are intrinsic in the operating principle. The evaluated system allows fast and accurate measurements, but pixel-level calibration is needed to achieve high accuracy over the whole image. Simple temporal or spatial filtering allows a significant reduction in the measurement uncertainty. © 2009 IEEE.
2009
5
F., Leonardi; D., Covi; Petri, Dario; D., Stoppa
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/76996
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