This paper analyzes the performance of an indirect time-of-flight (ITOF) complementary metal-oxide semiconductor (CMOS) range image sensor. A number of experiments were performed to measure the actual performance of the system under test and to highlight its strength and weak points, with a focus on which limits are related to the design and which are intrinsic in the operating principle. The evaluated system allows fast and accurate measurements, but pixel-level calibration is needed to achieve high accuracy over the whole image. Simple temporal or spatial filtering allows a significant reduction in the measurement uncertainty. © 2009 IEEE.
Accuracy Performance of a Time-of-Flight CMOS Range Image Sensor System
Petri, Dario;
2009-01-01
Abstract
This paper analyzes the performance of an indirect time-of-flight (ITOF) complementary metal-oxide semiconductor (CMOS) range image sensor. A number of experiments were performed to measure the actual performance of the system under test and to highlight its strength and weak points, with a focus on which limits are related to the design and which are intrinsic in the operating principle. The evaluated system allows fast and accurate measurements, but pixel-level calibration is needed to achieve high accuracy over the whole image. Simple temporal or spatial filtering allows a significant reduction in the measurement uncertainty. © 2009 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione



