Integral breadth methods for line profile analysis are reviewed, including modifications of the Williamson-Hall method recently proposed for the specific case of dislocation strain broadening. Two cases of study, supported by the results of a TEM investigation, are considered in detail: nanocrystalline ceria crystallized from amorphous precursors and highly deformed nickel powder produced by extensive ball milling. A further application concerns a series of Fe-Mo powder specimens that were ball milled for increasing time. Traditional and modified Williamson-Hall methods confirm their merits for a rapid overview of the line broadening effects and possible understanding of the main causes. However, quantitative results are generally not reliable. Limits in the applicability of integral breadth methods and reliability of the results are discussed in detail.

Line broadening analysis using integral breadth methods: a critical review / Scardi, Paolo; Leoni, Matteo; R., Delhez. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - STAMPA. - 37:3(2004), pp. 381-390. [10.1107/S0021889804004583]

Line broadening analysis using integral breadth methods: a critical review

Scardi, Paolo;Leoni, Matteo;
2004-01-01

Abstract

Integral breadth methods for line profile analysis are reviewed, including modifications of the Williamson-Hall method recently proposed for the specific case of dislocation strain broadening. Two cases of study, supported by the results of a TEM investigation, are considered in detail: nanocrystalline ceria crystallized from amorphous precursors and highly deformed nickel powder produced by extensive ball milling. A further application concerns a series of Fe-Mo powder specimens that were ball milled for increasing time. Traditional and modified Williamson-Hall methods confirm their merits for a rapid overview of the line broadening effects and possible understanding of the main causes. However, quantitative results are generally not reliable. Limits in the applicability of integral breadth methods and reliability of the results are discussed in detail.
2004
3
Scardi, Paolo; Leoni, Matteo; R., Delhez
Line broadening analysis using integral breadth methods: a critical review / Scardi, Paolo; Leoni, Matteo; R., Delhez. - In: JOURNAL OF APPLIED CRYSTALLOGRAPHY. - ISSN 0021-8898. - STAMPA. - 37:3(2004), pp. 381-390. [10.1107/S0021889804004583]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/73945
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