Silica-supported silver nanoparticles were obtained by rf sputtering from Ar plasmas under soft synthesis conditions, with particular attention to the combined influence of rf power and total pressure on the system composition, nanostructure, morphology, and optical properties. In order to attain a thorough insight into the nucleation and growth phenomena of Ag nanoparticles on the silica substrate, several in situ and ex situ characterization techniques were used. In particular, a laser reflection interferometry system was employed for a real-time monitoring of the deposition process, providing useful and complementary information with respect to the other ex situ techniques x-ray photoelectron spectroscopy and x-ray excited Auger electron spectroscopy, glancing incidence x-ray diffraction, atomic force microscopy, optical-absorption spectroscopy, and transmission electron microscopy. The above investigations evidenced the formation of silver-based nanosystems average crystallite size ø10 nm, whose features smetal content, Ag particle size and shape, structure and optical propertiesd could be carefully tailored by moderate and controlled variations of the synthesis parameters. © 2005 American Institute of Physics.

Silica-supported silver nanoparticles: Tailoring of structure-property relationships / D., Barreca; A., Gasparotto; C., Maragno; E., Tondello; Gialanella, Stefano. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - STAMPA. - 97:(2005), pp. 054311-1-054311-8. [10.1063/1.1856213]

Silica-supported silver nanoparticles: Tailoring of structure-property relationships

Gialanella, Stefano
2005-01-01

Abstract

Silica-supported silver nanoparticles were obtained by rf sputtering from Ar plasmas under soft synthesis conditions, with particular attention to the combined influence of rf power and total pressure on the system composition, nanostructure, morphology, and optical properties. In order to attain a thorough insight into the nucleation and growth phenomena of Ag nanoparticles on the silica substrate, several in situ and ex situ characterization techniques were used. In particular, a laser reflection interferometry system was employed for a real-time monitoring of the deposition process, providing useful and complementary information with respect to the other ex situ techniques x-ray photoelectron spectroscopy and x-ray excited Auger electron spectroscopy, glancing incidence x-ray diffraction, atomic force microscopy, optical-absorption spectroscopy, and transmission electron microscopy. The above investigations evidenced the formation of silver-based nanosystems average crystallite size ø10 nm, whose features smetal content, Ag particle size and shape, structure and optical propertiesd could be carefully tailored by moderate and controlled variations of the synthesis parameters. © 2005 American Institute of Physics.
2005
D., Barreca; A., Gasparotto; C., Maragno; E., Tondello; Gialanella, Stefano
Silica-supported silver nanoparticles: Tailoring of structure-property relationships / D., Barreca; A., Gasparotto; C., Maragno; E., Tondello; Gialanella, Stefano. - In: JOURNAL OF APPLIED PHYSICS. - ISSN 0021-8979. - STAMPA. - 97:(2005), pp. 054311-1-054311-8. [10.1063/1.1856213]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/72697
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