Considerations concerning Wilkens' theory of dislocation line-broadening

When applying Wilkens’ dislocation line broadening theory, the dependence on each individual slip system need to be considered, since the Fourier coefficients result from a convolution product over all active slip-systems. Corresponding diffraction profiles are qualitatively and quantitatively different from those obtained by considering, as in most literature approaches, average coefficients. Simulations show the impact of the different models in the case of screw and edge dislocations contained in cerium oxide.