Synchrotron radiation XRD was used to study the residual stress field in two different ceramic coatings: polycrystalline diamond (-5 pm) on WC-Co and Y,O,-partially-stabilised-zirconia (-300 pm) on Al substrates. In both cases, the use of synchrotron radiation, and the possibility of changing wavelength in particular, permitted to study the residual stress trend inside the ceramic layers. For the diamond coated component, the stress analysis was extended also to the WC substrate, in the interface region with the coating.
Residual stress analysis of ceramic coatings by means of synchrotron radiation XRD
Scardi, Paolo;Leoni, Matteo;
1997-01-01
Abstract
Synchrotron radiation XRD was used to study the residual stress field in two different ceramic coatings: polycrystalline diamond (-5 pm) on WC-Co and Y,O,-partially-stabilised-zirconia (-300 pm) on Al substrates. In both cases, the use of synchrotron radiation, and the possibility of changing wavelength in particular, permitted to study the residual stress trend inside the ceramic layers. For the diamond coated component, the stress analysis was extended also to the WC substrate, in the interface region with the coating.File in questo prodotto:
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