X-ray diffraction is the ideal tool for a nondestructuve size analysis at the nanoscale. The advances in the field and the new available techniques are shown and compared with traditional methods. The quantitative vs qualitative nature of some widely used tools is illustrated with some examples.
Crystallite Size Analyses
Leoni, Matteo
2012-01-01
Abstract
X-ray diffraction is the ideal tool for a nondestructuve size analysis at the nanoscale. The advances in the field and the new available techniques are shown and compared with traditional methods. The quantitative vs qualitative nature of some widely used tools is illustrated with some examples.File in questo prodotto:
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