Our society largely relies on inorganic semiconductor devices which are, so far, fabricated using expensive and complex processes requiring ultra-high vacuum equipment. Here we report on the possibility of growing a p-n junction taking advantage of electrochemical processes based on the use of aqueous solutions. The growth of the junction has been carried out using the Electrochemical Atomic Layer Deposition (E-ALD) technique, which allowed to sequentially deposit two different semiconductors, CdS and Cu2S, on an Ag(111) substrate, in a single procedure. The growth process was monitored in situ by Surface X-Ray Diffraction (SXRD) and resulted in the fabrication of a thin double-layer structure with a high degree of crystallographic order and a well-defined interface. The high-performance electrical characteristics of the device were analysed ex-situ and show the characteristic feature of a diode.
On the Electrochemical Growth of a Crystalline p‐n Junction From Aqueous Solutions / Felici, Roberto; Baroni, Tommaso; Carlà, Francesco; Cioffi, Nicola; Di Benedetto, Francesco; Fontanesi, Claudio; Giaccherini, Andrea; Giurlani, Walter; Gonidec, Mathieu; Lavacchi, Alessandro; Berretti, Enrico; Marcantelli, Patrick; Montegrossi, Giordano; Bonechi, Marco; Picca, Rosaria Anna; Poggini, Lorenzo; Russo, Francesca; Sportelli, Maria Chiara; Torsi, Luisa; Innocenti, Massimo. - In: CHEMISTRY-A EUROPEAN JOURNAL. - ISSN 0947-6539. - 2024:(2024). [10.1002/chem.202401403]
On the Electrochemical Growth of a Crystalline p‐n Junction From Aqueous Solutions
Russo, Francesca;
2024-01-01
Abstract
Our society largely relies on inorganic semiconductor devices which are, so far, fabricated using expensive and complex processes requiring ultra-high vacuum equipment. Here we report on the possibility of growing a p-n junction taking advantage of electrochemical processes based on the use of aqueous solutions. The growth of the junction has been carried out using the Electrochemical Atomic Layer Deposition (E-ALD) technique, which allowed to sequentially deposit two different semiconductors, CdS and Cu2S, on an Ag(111) substrate, in a single procedure. The growth process was monitored in situ by Surface X-Ray Diffraction (SXRD) and resulted in the fabrication of a thin double-layer structure with a high degree of crystallographic order and a well-defined interface. The high-performance electrical characteristics of the device were analysed ex-situ and show the characteristic feature of a diode.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione