Two AxC techniques have been successfully applied to hardware components. The first one is the functional approximation [1]that modifies the circuit structure replacing the original function F with the function G. G implementation leads to area/energy reduction at the cost of reduced accuracy, meaning that some errors can be observed at the outputs of G. The observed errors are a variation between the output values of F (precise) and G (approximate). The variation is the accuracy loss measured by means of quality metric(s) [1]. The second AxC technique is the over-scaling based approximation. Basically, the HW component is forced to work outside its specified operating conditions [1]. The classical example is the reduction of the supply voltage under the minimum value.

Special session: How approximate computing impacts verification, test and reliability / Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, F.; Di Carlo, S.. - 2018-:(2018), pp. 1-1. (Intervento presentato al convegno 36th IEEE VLSI Test Symposium, VTS 2018 tenutosi a usa nel 2018) [10.1109/VTS.2018.8368628].

Special session: How approximate computing impacts verification, test and reliability

Bosio A.;Rech P.;
2018-01-01

Abstract

Two AxC techniques have been successfully applied to hardware components. The first one is the functional approximation [1]that modifies the circuit structure replacing the original function F with the function G. G implementation leads to area/energy reduction at the cost of reduced accuracy, meaning that some errors can be observed at the outputs of G. The observed errors are a variation between the output values of F (precise) and G (approximate). The variation is the accuracy loss measured by means of quality metric(s) [1]. The second AxC technique is the over-scaling based approximation. Basically, the HW component is forced to work outside its specified operating conditions [1]. The classical example is the reduction of the supply voltage under the minimum value.
2018
Proceedings of the IEEE VLSI Test Symposium
Stati Uniti
IEEE Computer Society
978-1-5386-3774-6
Special session: How approximate computing impacts verification, test and reliability / Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, F.; Di Carlo, S.. - 2018-:(2018), pp. 1-1. (Intervento presentato al convegno 36th IEEE VLSI Test Symposium, VTS 2018 tenutosi a usa nel 2018) [10.1109/VTS.2018.8368628].
Sekanina, L.; Vasicek, Z.; Bosio, A.; Traiola, M.; Rech, P.; Oliveria, D.; Fernandes, F.; Di Carlo, S.
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/403771
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