In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies. © 2014 IEEE.
Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs / Tarrillo, J.; Kastensmidt, F. L.; Rech, P.; Frost, C.; Valderrama, C.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 61:4(2014), pp. 1558-1566. [10.1109/TNS.2014.2343259]
Neutron cross-section of N-modular redundancy technique in SRAM-based FPGAs
Rech P.;
2014-01-01
Abstract
In this paper the fault-masking capability of N-modular redundancy systems synthesized into SRAM-based FPGAs is evaluated. In the proposed N-modular technique an original self-adaptive majority voter elects the outputs of the redundant modules. Experimentally evaluated neutron cross-section, area, and power consumption were analyzed for different numbers of redundant modules, ranging from 3 copies (standard TMR) up to 7 copies. © 2014 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
