This paper presents an approach to detect SEEs in SRAM-based FPGAs by using software-based techniques combined with a nonintrusive hardware module. We implemented a MIPS-based soft-core processor in a Virtex5 FPGA and hardened it with software-and hardware-based fault tolerance techniques. First fault injection in the configuration memory bitstream was performed in order to verify the feasibility of the proposed approach, detection rates and diagnosis. Furthermore a neutron radiation experiment was performed at LANSCE. Results demonstrate the possibility of employing more flexible fault tolerant techniques to SRAM-based FPGAs with a high detection rate. Comparisons between bitstream fault injection and radiation test is also presented. © 2013 IEEE.

Evaluating Neutron Induced SEE in SRAM-Based FPGA Protected by Hardware-and Software-Based Fault Tolerant Techniques / Azambuja, J. R.; Nazar, G.; Rech, P.; Carro, L.; Kastensmidt, F. L.; Fairbanks, T.; Quinn, H.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 2013, 60:6(2013), pp. 4243-4250. [10.1109/TNS.2013.2288305]

Evaluating Neutron Induced SEE in SRAM-Based FPGA Protected by Hardware-and Software-Based Fault Tolerant Techniques

Rech P.;
2013-01-01

Abstract

This paper presents an approach to detect SEEs in SRAM-based FPGAs by using software-based techniques combined with a nonintrusive hardware module. We implemented a MIPS-based soft-core processor in a Virtex5 FPGA and hardened it with software-and hardware-based fault tolerance techniques. First fault injection in the configuration memory bitstream was performed in order to verify the feasibility of the proposed approach, detection rates and diagnosis. Furthermore a neutron radiation experiment was performed at LANSCE. Results demonstrate the possibility of employing more flexible fault tolerant techniques to SRAM-based FPGAs with a high detection rate. Comparisons between bitstream fault injection and radiation test is also presented. © 2013 IEEE.
2013
6
Azambuja, J. R.; Nazar, G.; Rech, P.; Carro, L.; Kastensmidt, F. L.; Fairbanks, T.; Quinn, H.
Evaluating Neutron Induced SEE in SRAM-Based FPGA Protected by Hardware-and Software-Based Fault Tolerant Techniques / Azambuja, J. R.; Nazar, G.; Rech, P.; Carro, L.; Kastensmidt, F. L.; Fairbanks, T.; Quinn, H.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 2013, 60:6(2013), pp. 4243-4250. [10.1109/TNS.2013.2288305]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/403755
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