This paper presents the measurements on first very thin Ultra-Fast Silicon Detectors (UFSDs) produced by Fondazione Bruno Kessler; the data have been collected in a beam test setup at the CERN PS, using beam with a momentum of 12 GeV/c. UFSDs with a nominal thickness of 25 and 35 mu m and an area of 1 x 1 mm(2) have been considered, together with an additional HPK 50-mu m thick sensor, taken as reference. Their timing performances have been studied as a function of the applied voltage and gain. A time resolution of about 25 ps and of 22 ps at a voltage of 120 and 240 V has been obtained for the 25 and 35 mu m thick UFSDs, respectively.

Beam test results of 25 and 35 mu m thick FBK ultra-fast silicon detectors / Carnesecchi, F; Strazzi, S; Alici, A; Arcidiacono, R; Borghi, G; Boscardin, M; Cartiglia, N; Vignali, Mc; Cavazza, D; Dalla Betta, Gf; Durando, S; Ferrero, M; Ficorella, F; Ali, Oh; Mandurrino, M; Margotti, A; Menzio, L; Nania, R; Pancheri, L; Paternoster, G; Scioli, G; Siviero, F; Sola, V; Tornago, M; Vignola, G. - In: THE EUROPEAN PHYSICAL JOURNAL PLUS. - ISSN 2190-5444. - ELETTRONICO. - 138:1(2023), p. 99. [10.1140/epjp/s13360-022-03619-1]

Beam test results of 25 and 35 mu m thick FBK ultra-fast silicon detectors

Dalla Betta, GF;Pancheri, L;
2023-01-01

Abstract

This paper presents the measurements on first very thin Ultra-Fast Silicon Detectors (UFSDs) produced by Fondazione Bruno Kessler; the data have been collected in a beam test setup at the CERN PS, using beam with a momentum of 12 GeV/c. UFSDs with a nominal thickness of 25 and 35 mu m and an area of 1 x 1 mm(2) have been considered, together with an additional HPK 50-mu m thick sensor, taken as reference. Their timing performances have been studied as a function of the applied voltage and gain. A time resolution of about 25 ps and of 22 ps at a voltage of 120 and 240 V has been obtained for the 25 and 35 mu m thick UFSDs, respectively.
2023
1
Carnesecchi, F; Strazzi, S; Alici, A; Arcidiacono, R; Borghi, G; Boscardin, M; Cartiglia, N; Vignali, Mc; Cavazza, D; Dalla Betta, Gf; Durando, S; Ferrero, M; Ficorella, F; Ali, Oh; Mandurrino, M; Margotti, A; Menzio, L; Nania, R; Pancheri, L; Paternoster, G; Scioli, G; Siviero, F; Sola, V; Tornago, M; Vignola, G
Beam test results of 25 and 35 mu m thick FBK ultra-fast silicon detectors / Carnesecchi, F; Strazzi, S; Alici, A; Arcidiacono, R; Borghi, G; Boscardin, M; Cartiglia, N; Vignali, Mc; Cavazza, D; Dalla Betta, Gf; Durando, S; Ferrero, M; Ficorella, F; Ali, Oh; Mandurrino, M; Margotti, A; Menzio, L; Nania, R; Pancheri, L; Paternoster, G; Scioli, G; Siviero, F; Sola, V; Tornago, M; Vignola, G. - In: THE EUROPEAN PHYSICAL JOURNAL PLUS. - ISSN 2190-5444. - ELETTRONICO. - 138:1(2023), p. 99. [10.1140/epjp/s13360-022-03619-1]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/387332
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