Microcavities offering small modal volumes V≈0.6 (λn)3 and consisting of two identical tapered Bragg mirrors etched into a monomode silicon-on-insulator ridge waveguide are studied for operation at telecommunications wavelengths. The authors have measured a Q factor of 8900, for a loaded cavity with a peak transmission at resonance in excess of 60%. The measured Q value quantitatively agrees with the calculation results and is 20 times larger than those previously reported for similar geometries without tapers. © 2006 American Institute of Physics.
Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance / Velha, Philippe; Rodier, J. C.; Lalanne, P.; Hugonin, J. P.; Peyrade, D.; Picard, E.; Charvolin, T.; Hadji, E.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 89:17(2006), p. 171121. [10.1063/1.2372581]
Ultracompact silicon-on-insulator ridge-waveguide mirrors with high reflectance
VELHA, PHILIPPEPrimo
;
2006-01-01
Abstract
Microcavities offering small modal volumes V≈0.6 (λn)3 and consisting of two identical tapered Bragg mirrors etched into a monomode silicon-on-insulator ridge waveguide are studied for operation at telecommunications wavelengths. The authors have measured a Q factor of 8900, for a loaded cavity with a peak transmission at resonance in excess of 60%. The measured Q value quantitatively agrees with the calculation results and is 20 times larger than those previously reported for similar geometries without tapers. © 2006 American Institute of Physics.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
