We experimentally demonstrate an ultra high Q/V nanocavity on SOI substrate. The design is based on modal adaptation within the cavity and allows to measure a quality factor of 58.000 for a modal volume of 0.6(λ/n) 3. This record Q/V value of 105 achieved for a structure standing on a physical substrate, rather than on membrane, is in very good agreement with theoretical predictions also shown. Based on these experimental results, we show that further refinements of the cavity design could lead to Q/V ratios close to 106. © 2007 Optical Society of America.

Ultra-high Q/V fabry-perot microcavity on SOI substrate / Velha, Philippe; Picard, E.; Charvolin, T.; Hadji, E.; Rodier, J. C.; Laianne, P.; Peyrade, D.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 15:24(2007), pp. 16090-16096. [10.1364/OE.15.016090]

Ultra-high Q/V fabry-perot microcavity on SOI substrate

VELHA, PHILIPPE
Primo
;
2007-01-01

Abstract

We experimentally demonstrate an ultra high Q/V nanocavity on SOI substrate. The design is based on modal adaptation within the cavity and allows to measure a quality factor of 58.000 for a modal volume of 0.6(λ/n) 3. This record Q/V value of 105 achieved for a structure standing on a physical substrate, rather than on membrane, is in very good agreement with theoretical predictions also shown. Based on these experimental results, we show that further refinements of the cavity design could lead to Q/V ratios close to 106. © 2007 Optical Society of America.
2007
24
Velha, Philippe; Picard, E.; Charvolin, T.; Hadji, E.; Rodier, J. C.; Laianne, P.; Peyrade, D.
Ultra-high Q/V fabry-perot microcavity on SOI substrate / Velha, Philippe; Picard, E.; Charvolin, T.; Hadji, E.; Rodier, J. C.; Laianne, P.; Peyrade, D.. - In: OPTICS EXPRESS. - ISSN 1094-4087. - ELETTRONICO. - 15:24(2007), pp. 16090-16096. [10.1364/OE.15.016090]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/373113
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