This paper presents the results from the crosstalk and dark count rate (DCR) characterization of a 24 × 72 single photon avalanche diode (SPAD) array, fabricated in a 150 nm CMOS technology. The chip under test consists of a dual layer detection system developed in view of applications to charged particle tracking. A three step procedure, used for the crosstalk characterization, is presented. The crosstalk probability, taking place in 5 × 5 sub arrays built around noisy pixels, has been computed. Eventually, random telegraph signal (RTS) fluctuations in DCR, at different bias conditions, are briefly discussed.
This paper presents the results from the crosstalk and dark count rate (DCR) characterization of a 24 × 72 single photon avalanche diode (SPAD) array, fabricated in a 150 nm CMOS technology. The chip under test consists of a dual layer detection system developed in view of applications to charged particle tracking. A three step procedure, used for the crosstalk characterization, is presented. The crosstalk probability, taking place in 5 × 5 sub arrays built around noisy pixels, has been computed. Eventually, random telegraph signal (RTS) fluctuations in DCR, at different bias conditions, are briefly discussed.
DCR and crosstalk characterization of a bi-layered 24 × 72 CMOS SPAD array for charged particle detection / Torilla, G.; Minga, J.; Brogi, P.; Collazuol, G.; Dalla Betta, G. -F.; Marrocchesi, P. S.; Pancheri, L.; Ratti, L.; Vacchi, C.. - In: NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION A, ACCELERATORS, SPECTROMETERS, DETECTORS AND ASSOCIATED EQUIPMENT. - ISSN 0168-9002. - STAMPA. - 1046:(2023), p. 167693. [10.1016/j.nima.2022.167693]
DCR and crosstalk characterization of a bi-layered 24 × 72 CMOS SPAD array for charged particle detection
Dalla Betta G. -F.;Pancheri L.;
2023-01-01
Abstract
This paper presents the results from the crosstalk and dark count rate (DCR) characterization of a 24 × 72 single photon avalanche diode (SPAD) array, fabricated in a 150 nm CMOS technology. The chip under test consists of a dual layer detection system developed in view of applications to charged particle tracking. A three step procedure, used for the crosstalk characterization, is presented. The crosstalk probability, taking place in 5 × 5 sub arrays built around noisy pixels, has been computed. Eventually, random telegraph signal (RTS) fluctuations in DCR, at different bias conditions, are briefly discussed.| File | Dimensione | Formato | |
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