The evaluation of spectral parameters characterizing analog–to–digital converters (ADC) is addressed by applying a single or dual tone generator to the device input and by properly processing its output data stream. The coherent sampling condition, highly recommended by the IEEE standards 1057 and 1241 which list the most effective ADC testing procedures, is usually difficult to achieve, and sometimes even unfeasible. In fact, it requires a fine synchronization between the input and the sampling signals frequencies and it can not be achieved when spurious tones are present in the ADC output spectrum. Data windowing is usually employed to reduce the associated spectral leakage phenomenon. However, IEEE standards do not provide clear criteria for choosing the window to be used for testing a given b–bit converter. Therefore, a reduced measurement reproducibility can result. The European draft standard Dynad suggests the employment of one out of seven windows in accordance to the ADC resolution. However, each proposed sequence covers only a limited converter resolution range. In this paper an ADC testing procedure is described, suitable to yield highly repeatable and reproducible measurements also when non–coherent sampling applies. To this aim, the use of a class of windows is proposed, that uniquely applies to ADCs with arbitrarily high resolution. Finally, experimental results that validate its effectiveness are presented.

A Procedure for High Reproducible Measurements of ADC Spectral Parameters / Nunzi, Emilia; Carbone, Paolo; Petri, Dario. - ELETTRONICO. - (2004), pp. 1-12.

A Procedure for High Reproducible Measurements of ADC Spectral Parameters

Carbone, Paolo;Petri, Dario
2004-01-01

Abstract

The evaluation of spectral parameters characterizing analog–to–digital converters (ADC) is addressed by applying a single or dual tone generator to the device input and by properly processing its output data stream. The coherent sampling condition, highly recommended by the IEEE standards 1057 and 1241 which list the most effective ADC testing procedures, is usually difficult to achieve, and sometimes even unfeasible. In fact, it requires a fine synchronization between the input and the sampling signals frequencies and it can not be achieved when spurious tones are present in the ADC output spectrum. Data windowing is usually employed to reduce the associated spectral leakage phenomenon. However, IEEE standards do not provide clear criteria for choosing the window to be used for testing a given b–bit converter. Therefore, a reduced measurement reproducibility can result. The European draft standard Dynad suggests the employment of one out of seven windows in accordance to the ADC resolution. However, each proposed sequence covers only a limited converter resolution range. In this paper an ADC testing procedure is described, suitable to yield highly repeatable and reproducible measurements also when non–coherent sampling applies. To this aim, the use of a class of windows is proposed, that uniquely applies to ADCs with arbitrarily high resolution. Finally, experimental results that validate its effectiveness are presented.
2004
Trento, Italia
Università degli Studi di Trento. DEPARTMENT OF INFORMATION AND COMMUNICATION TECHNOLOGY
A Procedure for High Reproducible Measurements of ADC Spectral Parameters / Nunzi, Emilia; Carbone, Paolo; Petri, Dario. - ELETTRONICO. - (2004), pp. 1-12.
Nunzi, Emilia; Carbone, Paolo; Petri, Dario
File in questo prodotto:
File Dimensione Formato  
A_Procedure_for_High_Reproducible_Measurements_of_ADC_Spectral_Parameters.pdf

accesso aperto

Tipologia: Versione editoriale (Publisher’s layout)
Licenza: Tutti i diritti riservati (All rights reserved)
Dimensione 205.81 kB
Formato Adobe PDF
205.81 kB Adobe PDF Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/359047
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? ND
social impact