In this paper, we experimentally and analytically evaluate the reliability of two state-of-the-art neural networks for linear regression and pattern recognition (multilayer perceptron and single-layer perceptron) implemented in a system-on-chip composed of a field-programmable gate array (FPGA) and a microprocessor. We have considered, for each neural network, three different activation function complexities, to evaluate how the implementation affects FPGAs reliability. As we show in this paper, higher complexity increases the exposed area but reduces the probability of one failure to impact the network output. In addition, we propose to distinguish between critical and tolerable errors in artificial neural networks. Experiments using a controlled heavy-ions beam show that, for both networks, only about 30% of the observed output errors actually affect the outputs correctness. We identify the causes of critical errors through fault injection, and found that faults in initial layers are more likely to significantly affect the output.

On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAs / Libano, F.; Rech, P.; Tambara, L.; Tonfat, J.; Kastensmidt, F.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 65:1(2018), pp. 288-295. [10.1109/TNS.2017.2784367]

On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAs

Rech P.;
2018-01-01

Abstract

In this paper, we experimentally and analytically evaluate the reliability of two state-of-the-art neural networks for linear regression and pattern recognition (multilayer perceptron and single-layer perceptron) implemented in a system-on-chip composed of a field-programmable gate array (FPGA) and a microprocessor. We have considered, for each neural network, three different activation function complexities, to evaluate how the implementation affects FPGAs reliability. As we show in this paper, higher complexity increases the exposed area but reduces the probability of one failure to impact the network output. In addition, we propose to distinguish between critical and tolerable errors in artificial neural networks. Experiments using a controlled heavy-ions beam show that, for both networks, only about 30% of the observed output errors actually affect the outputs correctness. We identify the causes of critical errors through fault injection, and found that faults in initial layers are more likely to significantly affect the output.
1
Libano, F.; Rech, P.; Tambara, L.; Tonfat, J.; Kastensmidt, F.
On the Reliability of Linear Regression and Pattern Recognition Feedforward Artificial Neural Networks in FPGAs / Libano, F.; Rech, P.; Tambara, L.; Tonfat, J.; Kastensmidt, F.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 65:1(2018), pp. 288-295. [10.1109/TNS.2017.2784367]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/346733
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