We present the results of accelerated radiation testing on an AMD accelerated processing unit, three Nvidia graphic processing units, an Intel accelerator, a field-programmable gate array, and two double-data-rate memories under thermal and high-energy neutrons separately. The sensitivity depends on the device type and the code being executed and we show that thermal neutrons contribute to the error rate of modern computing devices under certain conditions.

High-Energy Versus Thermal Neutron Contribution to Processor and Memory Error Rates / Oliveira, D.; Dos Santos, F. F.; Piscoya Davila, G.; Cazzaniga, C.; Frost, C.; Baumann, R. C.; Rech, P.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 67:6(2020), pp. 1161-1168. [10.1109/TNS.2020.2970535]

High-Energy Versus Thermal Neutron Contribution to Processor and Memory Error Rates

Rech P.
2020-01-01

Abstract

We present the results of accelerated radiation testing on an AMD accelerated processing unit, three Nvidia graphic processing units, an Intel accelerator, a field-programmable gate array, and two double-data-rate memories under thermal and high-energy neutrons separately. The sensitivity depends on the device type and the code being executed and we show that thermal neutrons contribute to the error rate of modern computing devices under certain conditions.
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Oliveira, D.; Dos Santos, F. F.; Piscoya Davila, G.; Cazzaniga, C.; Frost, C.; Baumann, R. C.; Rech, P.
High-Energy Versus Thermal Neutron Contribution to Processor and Memory Error Rates / Oliveira, D.; Dos Santos, F. F.; Piscoya Davila, G.; Cazzaniga, C.; Frost, C.; Baumann, R. C.; Rech, P.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 67:6(2020), pp. 1161-1168. [10.1109/TNS.2020.2970535]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/346705
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