We present the experimental evaluation of a fine-grained hardening approach that exploits underused and abundant resources found in state-of-the-art SRAM-based FPGAs to detect radiation-induced errors on configuration memories. The technique's main goal is to provide the benefits of fine-grained redundancy, namely improved diagnosis and reduced error latency, with a reduced area overhead. Neutron experiments, validated with fault injection campaigns, demonstrate the proposed technique's efficiency when compared to the traditional dual modular redundancy. © 1963-2012 IEEE.
Radiation and fault injection testing of a fine-grained error detection technique for FPGAs / Nazar, G. L.; Rech, P.; Frost, C.; Carro, L.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 60:4(2013), pp. 2742-2749. [10.1109/TNS.2013.2261319]
Radiation and fault injection testing of a fine-grained error detection technique for FPGAs
Rech P.;
2013-01-01
Abstract
We present the experimental evaluation of a fine-grained hardening approach that exploits underused and abundant resources found in state-of-the-art SRAM-based FPGAs to detect radiation-induced errors on configuration memories. The technique's main goal is to provide the benefits of fine-grained redundancy, namely improved diagnosis and reduced error latency, with a reduced area overhead. Neutron experiments, validated with fault injection campaigns, demonstrate the proposed technique's efficiency when compared to the traditional dual modular redundancy. © 1963-2012 IEEE.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione
