We present the experimental evaluation of a fine-grained hardening approach that exploits underused and abundant resources found in state-of-the-art SRAM-based FPGAs to detect radiation-induced errors on configuration memories. The technique's main goal is to provide the benefits of fine-grained redundancy, namely improved diagnosis and reduced error latency, with a reduced area overhead. Neutron experiments, validated with fault injection campaigns, demonstrate the proposed technique's efficiency when compared to the traditional dual modular redundancy. © 1963-2012 IEEE.

Radiation and fault injection testing of a fine-grained error detection technique for FPGAs / Nazar, G. L.; Rech, P.; Frost, C.; Carro, L.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 60:4(2013), pp. 2742-2749. [10.1109/TNS.2013.2261319]

Radiation and fault injection testing of a fine-grained error detection technique for FPGAs

Rech P.;
2013-01-01

Abstract

We present the experimental evaluation of a fine-grained hardening approach that exploits underused and abundant resources found in state-of-the-art SRAM-based FPGAs to detect radiation-induced errors on configuration memories. The technique's main goal is to provide the benefits of fine-grained redundancy, namely improved diagnosis and reduced error latency, with a reduced area overhead. Neutron experiments, validated with fault injection campaigns, demonstrate the proposed technique's efficiency when compared to the traditional dual modular redundancy. © 1963-2012 IEEE.
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Nazar, G. L.; Rech, P.; Frost, C.; Carro, L.
Radiation and fault injection testing of a fine-grained error detection technique for FPGAs / Nazar, G. L.; Rech, P.; Frost, C.; Carro, L.. - In: IEEE TRANSACTIONS ON NUCLEAR SCIENCE. - ISSN 0018-9499. - 60:4(2013), pp. 2742-2749. [10.1109/TNS.2013.2261319]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/346663
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