Graphics Processing Units are very prone to be corrupted by neutrons. Experimental results obtained irradiating the GPU with high energy neutrons show that the input data type has a strong influence on the neutron-induced error-rate of the executed algorithms. Moreover, when operations are performed using floating-point data, the probabilities to be corrupted are very different for the mantissa, the exponent or the sign. We investigate the occurrences of errors in the different positions, evaluating the related effects on the result precision. The reported results and the architecture analysis demonstrate that under radiation, whenever possible, one should favor floating-point arithmetic, which is both more reliable and potentially easier to protect than the integer one. © 2014 Springer Science+Business Media New York.

GPUs neutron sensitivity dependence on data type / Rech, P.; Frost, C.; Carro, L.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 30:3(2014), pp. 307-316. [10.1007/s10836-014-5456-6]

GPUs neutron sensitivity dependence on data type

Rech P.;
2014-01-01

Abstract

Graphics Processing Units are very prone to be corrupted by neutrons. Experimental results obtained irradiating the GPU with high energy neutrons show that the input data type has a strong influence on the neutron-induced error-rate of the executed algorithms. Moreover, when operations are performed using floating-point data, the probabilities to be corrupted are very different for the mantissa, the exponent or the sign. We investigate the occurrences of errors in the different positions, evaluating the related effects on the result precision. The reported results and the architecture analysis demonstrate that under radiation, whenever possible, one should favor floating-point arithmetic, which is both more reliable and potentially easier to protect than the integer one. © 2014 Springer Science+Business Media New York.
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Rech, P.; Frost, C.; Carro, L.
GPUs neutron sensitivity dependence on data type / Rech, P.; Frost, C.; Carro, L.. - In: JOURNAL OF ELECTRONIC TESTING. - ISSN 0923-8174. - 30:3(2014), pp. 307-316. [10.1007/s10836-014-5456-6]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/346647
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