X-ray photoelectron spectroscopy (XPS) has been used in the study of sol gel-derived Er3+-activated xHfO(2)-(100 - x)SiO2 (x = 10, 20, 30, 40, 50 mol) planar waveguides. The analysis of Si 2p and O 1s core lines were related to the Hf/Si molar ratio to assess the role of hafnia in modifying the silica network. Increasing the HfO2 content brings about a change of the Si 2p and O 1s binding energy respect to those from pure silica. This trend is explained with a formation of hafnium silicate in the matrix with successive phase separation between HfO2 and SiO2 rich phases. XPS results show that hafnia is well dispersed in the silica matrix for molar concentration below 30%. Formation of pure HfO2 domains was detected at higher hafnia concentrations in agreement with previous spectroscopic analyses. (c) 2007 Elsevier B.V. All rights reserved.

X-ray photoelectron spectroscopy of erbium-activated-silica-hafnia waveguides / Minati, L; Speranza, G; Ferrari, M; Jestin, Y; Chiasera, A. - In: JOURNAL OF NON-CRYSTALLINE SOLIDS. - ISSN 0022-3093. - 353:5-7(2007), pp. 502-505. [10.1016/j.jnoncrysol.2006.10.018]

X-ray photoelectron spectroscopy of erbium-activated-silica-hafnia waveguides

Chiasera A
2007-01-01

Abstract

X-ray photoelectron spectroscopy (XPS) has been used in the study of sol gel-derived Er3+-activated xHfO(2)-(100 - x)SiO2 (x = 10, 20, 30, 40, 50 mol) planar waveguides. The analysis of Si 2p and O 1s core lines were related to the Hf/Si molar ratio to assess the role of hafnia in modifying the silica network. Increasing the HfO2 content brings about a change of the Si 2p and O 1s binding energy respect to those from pure silica. This trend is explained with a formation of hafnium silicate in the matrix with successive phase separation between HfO2 and SiO2 rich phases. XPS results show that hafnia is well dispersed in the silica matrix for molar concentration below 30%. Formation of pure HfO2 domains was detected at higher hafnia concentrations in agreement with previous spectroscopic analyses. (c) 2007 Elsevier B.V. All rights reserved.
2007
5-7
Minati, L; Speranza, G; Ferrari, M; Jestin, Y; Chiasera, A
X-ray photoelectron spectroscopy of erbium-activated-silica-hafnia waveguides / Minati, L; Speranza, G; Ferrari, M; Jestin, Y; Chiasera, A. - In: JOURNAL OF NON-CRYSTALLINE SOLIDS. - ISSN 0022-3093. - 353:5-7(2007), pp. 502-505. [10.1016/j.jnoncrysol.2006.10.018]
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/343104
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? 12
social impact