Starting from the measured parameters of multilayer microcavities activated by Er3+ ion, we developed a comprehensive model based on extended (3 x 3) transfer matrix formalism including sources. The cavity, fabricated by rf-sputtering technique, was constituted by an Er3+-activated SiO2 active layer inserted between two six-pair SiO2/TiO2 distributed Bragg reflectors. Near infrared transmittance spectra evidence the presence of a stop-band from 1350 to 1850 nm and a cavity resonance centered at 1537 run. Intensity enhancement and narrowing of the I-4(13/2) -> I-4(15/2) emission band of Er3+ ion were observed, owing to the cavity effect. A cavity quality factor of 171 was achieved. All observations show excellent agreement with transfer matrix simulations, leading to improvements of the devices design operating in laser regime. (C) 2008 Elsevier B.V. All rights reserved.

Extended transfer matrix modeling of an erbium-doped cavity with SiO2/TiO2 Bragg reflectors / Boucher, Yg; Chiasera, A; Ferrari, M; Righini, Gc. - In: OPTICAL MATERIALS. - ISSN 0925-3467. - 31:9(2009), pp. 1306-1309. [10.1016/j.optmat.2008.10.028]

Extended transfer matrix modeling of an erbium-doped cavity with SiO2/TiO2 Bragg reflectors

Chiasera A;
2009

Abstract

Starting from the measured parameters of multilayer microcavities activated by Er3+ ion, we developed a comprehensive model based on extended (3 x 3) transfer matrix formalism including sources. The cavity, fabricated by rf-sputtering technique, was constituted by an Er3+-activated SiO2 active layer inserted between two six-pair SiO2/TiO2 distributed Bragg reflectors. Near infrared transmittance spectra evidence the presence of a stop-band from 1350 to 1850 nm and a cavity resonance centered at 1537 run. Intensity enhancement and narrowing of the I-4(13/2) -> I-4(15/2) emission band of Er3+ ion were observed, owing to the cavity effect. A cavity quality factor of 171 was achieved. All observations show excellent agreement with transfer matrix simulations, leading to improvements of the devices design operating in laser regime. (C) 2008 Elsevier B.V. All rights reserved.
9
Boucher, Yg; Chiasera, A; Ferrari, M; Righini, Gc
Extended transfer matrix modeling of an erbium-doped cavity with SiO2/TiO2 Bragg reflectors / Boucher, Yg; Chiasera, A; Ferrari, M; Righini, Gc. - In: OPTICAL MATERIALS. - ISSN 0925-3467. - 31:9(2009), pp. 1306-1309. [10.1016/j.optmat.2008.10.028]
File in questo prodotto:
Non ci sono file associati a questo prodotto.

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/343028
 Attenzione

Attenzione! I dati visualizzati non sono stati sottoposti a validazione da parte dell'ateneo

Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus ND
  • ???jsp.display-item.citation.isi??? 12
social impact