0.4 Er3+-doped 90.7 SiO2 - 4.4 P2O5 - 2.3 HfO2 - 1.7 Al2O3 - 0.7 Na2O planar waveguide was fabricated by multi-target rf-sputtering technique starting by massive Er-activated P2O5-SiO2-Al2O3-Na2O glass. The optical parameters were measured by m-line apparatus operating at 632.8, 1319 and 1542 nm. The waveguide compositions were investigated by Energy Dispersive X-ray Spectroscopy and its morphology analyzed by Atomic Force Microscopy. The waveguide exhibits a single propagation mode at 1319 and 1542 nm with an attenuation coefficient of 0.2 dB/cm in the infrared. The emission of I-4(13/2) -> I-4(15/2) transition of Er3+ ion, with a 28.5 nm bandwidth was observed upon TE0 mode excitation at 514.5 nm. The optical and spectroscopic features of the Er3-activated parent P2O5-SiO2-Al2O3-Na2O glass were also investigated. (C) 2016 Elsevier B.V. All rights reserved.

SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering / Chiasera, A; Vasilchenko, I; Dorosz, D; Cotti, M; Varas, S; Iacob, E; Speranza, G; Vaccari, A; Valligatla, S; Zur, L; Lukowiak, A; Righini, Gc; Ferrari, M. - In: OPTICAL MATERIALS. - ISSN 0925-3467. - 63:(2017), pp. 153-157. [10.1016/j.optmat.2016.06.025]

SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering

Chiasera A;
2017

Abstract

0.4 Er3+-doped 90.7 SiO2 - 4.4 P2O5 - 2.3 HfO2 - 1.7 Al2O3 - 0.7 Na2O planar waveguide was fabricated by multi-target rf-sputtering technique starting by massive Er-activated P2O5-SiO2-Al2O3-Na2O glass. The optical parameters were measured by m-line apparatus operating at 632.8, 1319 and 1542 nm. The waveguide compositions were investigated by Energy Dispersive X-ray Spectroscopy and its morphology analyzed by Atomic Force Microscopy. The waveguide exhibits a single propagation mode at 1319 and 1542 nm with an attenuation coefficient of 0.2 dB/cm in the infrared. The emission of I-4(13/2) -> I-4(15/2) transition of Er3+ ion, with a 28.5 nm bandwidth was observed upon TE0 mode excitation at 514.5 nm. The optical and spectroscopic features of the Er3-activated parent P2O5-SiO2-Al2O3-Na2O glass were also investigated. (C) 2016 Elsevier B.V. All rights reserved.
Chiasera, A; Vasilchenko, I; Dorosz, D; Cotti, M; Varas, S; Iacob, E; Speranza, G; Vaccari, A; Valligatla, S; Zur, L; Lukowiak, A; Righini, Gc; Ferrari, M
SiO2-P2O5-HfO2-Al2O3-Na2O glasses activated by Er3+ ions: From bulk sample to planar waveguide fabricated by rf-sputtering / Chiasera, A; Vasilchenko, I; Dorosz, D; Cotti, M; Varas, S; Iacob, E; Speranza, G; Vaccari, A; Valligatla, S; Zur, L; Lukowiak, A; Righini, Gc; Ferrari, M. - In: OPTICAL MATERIALS. - ISSN 0925-3467. - 63:(2017), pp. 153-157. [10.1016/j.optmat.2016.06.025]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/342828
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