Forces drive all physical interactions. High-sensitivity measurement of the effect of forces enables the quantitative investigation of physical phenomena. Laser-cooled trapped atomic ions are a well-controlled quantum system whose low mass, strong Coulomb interaction, and readily detectable fluorescence signal make them a favorable platform for precision metrology. We demonstrate a three-dimensional sub-attonewton sensitivity force sensor based on a super-resolution imaging of a single trapped ion. The force is detected by measuring the ion's displacement in three dimensions with nanometer precision. Observed sensitivities were 372 ± 9, 347 ± 18, and 808 ± 51 zN/ffiffiffiffiffiffi Hz p, corresponding to 24×, 87×, and 21× above the quantum limit. We verified this technique by measuring a 95-zN light pressure force, an important systematic effect in optically based sensors.
A single-atom 3D sub-attonewton force sensor / Blums, V.; Piotrowski, M.; Hussain, M. I.; Norton, B. G.; Connell, S. C.; Gensemer, S.; Lobino, M.; Streed, E. W.. - In: SCIENCE ADVANCES. - ISSN 2375-2548. - 4:3(2018), p. eaao4453. [10.1126/sciadv.aao4453]
A single-atom 3D sub-attonewton force sensor
Lobino M.;
2018-01-01
Abstract
Forces drive all physical interactions. High-sensitivity measurement of the effect of forces enables the quantitative investigation of physical phenomena. Laser-cooled trapped atomic ions are a well-controlled quantum system whose low mass, strong Coulomb interaction, and readily detectable fluorescence signal make them a favorable platform for precision metrology. We demonstrate a three-dimensional sub-attonewton sensitivity force sensor based on a super-resolution imaging of a single trapped ion. The force is detected by measuring the ion's displacement in three dimensions with nanometer precision. Observed sensitivities were 372 ± 9, 347 ± 18, and 808 ± 51 zN/ffiffiffiffiffiffi Hz p, corresponding to 24×, 87×, and 21× above the quantum limit. We verified this technique by measuring a 95-zN light pressure force, an important systematic effect in optically based sensors.I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione