We demonstrate a 1550 nm correlated photon-pair source in an integrated glass platform-a chalcogenide As2 S3 waveguide. A measured pair coincidence rate of 80 s-1 was achieved using 57 mW of continuous-wave pump. The coincidence to accidental ratio was shown to be limited by spontaneous Raman scattering effects that are expected to be mitigated by using a pulsed pump source. © 2011 American Institute of Physics.

Generation of correlated photon pairs in a chalcogenide As2 S3 waveguide / Xiong, C.; Marshall, G. D.; Peruzzo, A.; Lobino, M.; Clark, A. S.; Choi, D. -Y.; Madden, S. J.; Natarajan, C. M.; Tanner, M. G.; Hadfield, R. H.; Dorenbos, S. N.; Zijlstra, T.; Zwiller, V.; Thompson, M. G.; Rarity, J. G.; Steel, M. J.; Luther-Davies, B.; Eggleton, B. J.; O'Brien, J. L.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 98:5(2011), p. 051101. [10.1063/1.3549744]

Generation of correlated photon pairs in a chalcogenide As2 S3 waveguide

Lobino M.;
2011-01-01

Abstract

We demonstrate a 1550 nm correlated photon-pair source in an integrated glass platform-a chalcogenide As2 S3 waveguide. A measured pair coincidence rate of 80 s-1 was achieved using 57 mW of continuous-wave pump. The coincidence to accidental ratio was shown to be limited by spontaneous Raman scattering effects that are expected to be mitigated by using a pulsed pump source. © 2011 American Institute of Physics.
2011
5
Xiong, C.; Marshall, G. D.; Peruzzo, A.; Lobino, M.; Clark, A. S.; Choi, D. -Y.; Madden, S. J.; Natarajan, C. M.; Tanner, M. G.; Hadfield, R. H.; Dorenbos, S. N.; Zijlstra, T.; Zwiller, V.; Thompson, M. G.; Rarity, J. G.; Steel, M. J.; Luther-Davies, B.; Eggleton, B. J.; O'Brien, J. L.
Generation of correlated photon pairs in a chalcogenide As2 S3 waveguide / Xiong, C.; Marshall, G. D.; Peruzzo, A.; Lobino, M.; Clark, A. S.; Choi, D. -Y.; Madden, S. J.; Natarajan, C. M.; Tanner, M. G.; Hadfield, R. H.; Dorenbos, S. N.; Zijlstra, T.; Zwiller, V.; Thompson, M. G.; Rarity, J. G.; Steel, M. J.; Luther-Davies, B.; Eggleton, B. J.; O'Brien, J. L.. - In: APPLIED PHYSICS LETTERS. - ISSN 0003-6951. - 98:5(2011), p. 051101. [10.1063/1.3549744]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/334374
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