The nano-scale dispersion of ordered/disordered phases in semi-crystalline polymers can strongly influence their performance e.g. in terms of mechanical properties and/or electronic properties. However, to reveal the latter in scanning electron microscopy (SEM) often requires invasive sample preparation (etching of amorphous phase), because SEM usually exploits topographical contrast or yield differences between different materials. However, for pure carbon materials the secondary spectra were shown to differ substantially with increased order/disorder. The aims here is to gain an understanding of the shape of secondary electron spectrum (SES) of a widely used semi-crystalline polymer regioregular poly(3-hexylthiophene-2,5-diyl), commonly known as P3HT, and its links to the underlying secondary electron emission mechanisms so SES can be exploited for the mapping the nano-morphology. The comparison of simulated and experimental SES shows an excellent agreement, revealing a peak (at about 0.8 eV) followed by a broad shoulder (between 2 eV and 4.5 eV) with respective relative intensities reflecting order/disorder.

“Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?” / Dapor, M.; Masters, R. C.; Ross, I.; Lidzey, D. G.; Pearson, A.; Abril, I.; Garcia-Molina, R.; Sharp, J.; Uncovsky, M.; Vystavel, T.; Mika, F.; Rodenburg, C.. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 222:(2018), pp. 95-105. [10.1016/j.elspec.2017.08.001]

“Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?”

Dapor M.;
2018-01-01

Abstract

The nano-scale dispersion of ordered/disordered phases in semi-crystalline polymers can strongly influence their performance e.g. in terms of mechanical properties and/or electronic properties. However, to reveal the latter in scanning electron microscopy (SEM) often requires invasive sample preparation (etching of amorphous phase), because SEM usually exploits topographical contrast or yield differences between different materials. However, for pure carbon materials the secondary spectra were shown to differ substantially with increased order/disorder. The aims here is to gain an understanding of the shape of secondary electron spectrum (SES) of a widely used semi-crystalline polymer regioregular poly(3-hexylthiophene-2,5-diyl), commonly known as P3HT, and its links to the underlying secondary electron emission mechanisms so SES can be exploited for the mapping the nano-morphology. The comparison of simulated and experimental SES shows an excellent agreement, revealing a peak (at about 0.8 eV) followed by a broad shoulder (between 2 eV and 4.5 eV) with respective relative intensities reflecting order/disorder.
2018
Dapor, M.; Masters, R. C.; Ross, I.; Lidzey, D. G.; Pearson, A.; Abril, I.; Garcia-Molina, R.; Sharp, J.; Uncovsky, M.; Vystavel, T.; Mika, F.; Rodenburg, C.
“Secondary electron spectra of semi-crystalline polymers – A novel polymer characterisation tool?” / Dapor, M.; Masters, R. C.; Ross, I.; Lidzey, D. G.; Pearson, A.; Abril, I.; Garcia-Molina, R.; Sharp, J.; Uncovsky, M.; Vystavel, T.; Mika, F.; Rodenburg, C.. - In: JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA. - ISSN 0368-2048. - 222:(2018), pp. 95-105. [10.1016/j.elspec.2017.08.001]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/325721
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