Setup for meV-resolution inelastic X-ray scattering measurements and X-ray diffraction at the Matter in Extreme Conditions endstation at the Linac Coherent Light Source

Mcbride, E. E.; White, T. G.; Descamps, A.; Fletcher, L. B.; Appel, K.; Condamine, F. P.; Curry, C. B.; Dallari, F.; Funk, S.; Galtier, E.; Gauthier, M.; Goede, S.; Kim, J. B.; Lee, H. J.; Ofori-Okai, B. K.; Oliver, M.; Rigby, A.; Schoenwaelder, C.; Sun, P.; Tschentscher, Th.; Witte, B. B. L.; Zastrau, U.; Gregori, G.; Nagler, B.; Hastings, J.; Glenzer, S. H.; Monaco, G.

doi:10.1063/1.5039329

Setup for meV-resolution inelastic X-ray scattering measurements and X-ray diffraction at the Matter in Extreme Conditions endstation at the Linac Coherent Light Source / Mcbride, E.E., White, T.G., Descamps, A., Fletcher, L.B., Appel, K., Condamine, F.P., Curry, C.B., Dallari, F., Funk, S., Galtier, E., Gauthier, M., Goede, S., Kim, J.B., Lee, H.J., Ofori-Okai, B.K., Oliver, M., Rigby, A., Schoenwaelder, C., Sun, P., Tschentscher, Th., et al.. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 89:10(2018), pp. 10F10401-10F10404. [10.1063/1.5039329]

Setup for meV-resolution inelastic X-ray scattering measurements and X-ray diffraction at the Matter in Extreme Conditions endstation at the Linac Coherent Light Source

McBride, E. E.;White, T. G.;Descamps, A.;Fletcher, L. B.;Appel, K.;Condamine, F. P.;Curry, C. B.;Dallari, F.;Funk, S.;Galtier, E.;Gauthier, M.;Goede, S.;Kim, J. B.;Lee, H. J.;Ofori-Okai, B. K.;Oliver, M.;Rigby, A.;Schoenwaelder, C.;Sun, P.;Tschentscher, Th.;Witte, B. B. L.;Zastrau, U.;Gregori, G.;Nagler, B.;Hastings, J.;Glenzer, S. H.;Monaco, G.

2018-01-01

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Scheda completa

Scheda completa (DC)

	Anno di pubblicazione (Date of publication)
	
				2018
			
	Titolo del periodico (Journal title)
	
				REVIEW OF SCIENTIFIC INSTRUMENTS
			
	Numero e parte del fascicolo (Issue number and part)
	
				10
			
	DOI
	
				https://dx.doi.org/10.1063/1.5039329
			
	Codice PubMed (PubMed Identifier)
	
				30399942
			
	Codice Scopus (Scopus identifier)
	
				2-s2.0-85051736884
			
	Codice WOS (WOS identifier)
	
				WOS:000449144500093
			
	Tutti gli autori
	
						Mcbride, E. E.; White, T. G.; Descamps, A.; Fletcher, L. B.; Appel, K.; Condamine, F. P.; Curry, C. B.; Dallari, F.; Funk, S.; Galtier, E.; Gauthier, ...espandi
						
	Citazione
	
				Setup for meV-resolution inelastic X-ray scattering measurements and X-ray diffraction at the Matter in Extreme Conditions endstation at the Linac Coherent Light Source / Mcbride, E.E., White, T.G., Descamps, A., Fletcher, L.B., Appel, K., Condamine, F.P., Curry, C.B., Dallari, F., Funk, S., Galtier, E., Gauthier, M., Goede, S., Kim, J.B., Lee, H.J., Ofori-Okai, B.K., Oliver, M., Rigby, A., Schoenwaelder, C., Sun, P., Tschentscher, Th., et al.. - In: REVIEW OF SCIENTIFIC INSTRUMENTS. - ISSN 0034-6748. - 89:10(2018), pp. 10F10401-10F10404. [10.1063/1.5039329]
			
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				03.1 Articolo su rivista (Journal article)

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