The Correlated Debye model for the mean square relative displacement of atoms in near-neighbour coordination shells has been extended to include the effect of finite crystal size. This correctly explains the increase in Debye–Waller coefficient observed for metal nanocrystals. A good match with Molecular Dynamics simulations of Pd nanocrystals is obtained if, in addition to the phonon confinement effect of the finite domain size, proper consideration is also given to the static disorder component caused by the undercoordination of surface atoms. The new model, which addresses the analysis of the Pair Distribution Function and powder diffraction data collected at different temperatures, was preliminarily tested on recently published experimental data on nanocrystalline Pt powders.

Correlated Debye model for atomic motions in metal nanocrystals / Scardi, P.; Flor, A.. - In: PHILOSOPHICAL MAGAZINE. - ISSN 1478-6443. - ELETTRONICO. - 98:15(2018), pp. 1412-1435. [10.1080/14786435.2018.1435918]

Correlated Debye model for atomic motions in metal nanocrystals

P. Scardi;
2018-01-01

Abstract

The Correlated Debye model for the mean square relative displacement of atoms in near-neighbour coordination shells has been extended to include the effect of finite crystal size. This correctly explains the increase in Debye–Waller coefficient observed for metal nanocrystals. A good match with Molecular Dynamics simulations of Pd nanocrystals is obtained if, in addition to the phonon confinement effect of the finite domain size, proper consideration is also given to the static disorder component caused by the undercoordination of surface atoms. The new model, which addresses the analysis of the Pair Distribution Function and powder diffraction data collected at different temperatures, was preliminarily tested on recently published experimental data on nanocrystalline Pt powders.
2018
15
Scardi, P.; Flor, A.
Correlated Debye model for atomic motions in metal nanocrystals / Scardi, P.; Flor, A.. - In: PHILOSOPHICAL MAGAZINE. - ISSN 1478-6443. - ELETTRONICO. - 98:15(2018), pp. 1412-1435. [10.1080/14786435.2018.1435918]
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/11572/198554
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